A5029464178- Ion-surface interactions and analysis
- Molecular Junctions and Nanostructures
- Integrated Circuits and Semiconductor Failure Analysis
- Mass Spectrometry Techniques and Applications
- Spectroscopy Techniques in Biomedical and Chemical Research
- Diamond and Carbon-based Materials Research
- Air Quality and Health Impacts
- Photochemistry and Electron Transfer Studies
- Perovskite Materials and Applications
- Nanopore and Nanochannel Transport Studies
- Polymer Surface Interaction Studies
- Organic Electronics and Photovoltaics
- TiO2 Photocatalysis and Solar Cells
- Wind and Air Flow Studies
- Electrochemical Analysis and Applications
- Nanoplatforms for cancer theranostics
- Photodynamic Therapy Research Studies
- CO2 Reduction Techniques and Catalysts
- Air Quality Monitoring and Forecasting
- Luminescence and Fluorescent Materials
- Analytical Chemistry and Sensors
- Surface and Thin Film Phenomena
- Metal and Thin Film Mechanics
- Quantum and electron transport phenomena
- Advanced Memory and Neural Computing
University of Catania
2013-2017
Nanoscopic metal–molecule–metal junctions consisting of Fe-bis(terpyridine)-based ordered nanostructures are grown in layer-by-layer fashion on a solid support. Hopping is demonstrated as the main charge-transport mechanism both experimentally and theoretically. As service to our authors readers, this journal provides supporting information supplied by authors. Such materials peer reviewed may be re-organized for online delivery, but not copy-edited or typeset. Technical support issues...
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a high performance tool for molecular depth profiling of polymer films, in particular when they are structured microphases. However, major issue the degradation materials under irradiation reactions such as cross-linking, chain breaking, or reorganization processes polymers which have been demonstrated polystyrene (PS) and poly(methyl methacrylate) (PMMA). This work aims at comparing ToF-SIMS (polystyrene (PS)-b-polymethyl...
Secondary ion mass spectrometry (SIMS) with polyatomic primary ions provides a successful tool for molecular depth profiling of polymer systems, relevant in many technological applications. Widespread C60 sources, however, cause some polymers extensive damage loss information along depth. We study method, based on the use radical scavenger, inhibiting ion-beam-induced reactions causing sample damage.Layered polystyrene sulfonate and polyacrylic acid polyelectrolyte films, behaving...
A detailed depth characterization of multilayered polymeric systems is a very attractive topic. Currently, the use cluster primary ion beams in time‐of‐flight secondary mass spectrometry allows molecular profiling organic and materials. Because typical raw data may contain thousands peaks, amount information to manage grows rapidly widely, so that reduction techniques become indispensable order extract most significant from given dataset. Here, we show how wavelet‐based signal processing...
The paper reports a new "soft" surface functionalization strategy, based on highly selective ion metal chelation process. proposed stepwise methodology implies at first the construction of monolayer terpyridine-based thiol (Tpy), whose packed structuring has been followed in situ by using quartz crystal microbalance (QCM-D) measurements, showing that monolayers consist about 2.7 × 1014 Tpy/cm2. Then, tridentate sites each Tpy moiety are employed to partially chelate divalent ions, providing...
The continuum equation is used for modeling erosion rate, ion beam induced mixing, and reactions during the sputtering process involved in secondary mass spectrometry experiments. We developed a new approach that able to incorporate reactivity, so leading reasonable simulation of depth profiles polymers organic solids. model allows one include effects reactive gas dosing on yield damage accumulation profiling. Comparison with experimental data confirms quality strengthens proposed approach.
This paper deals with the investigation of a stepwise surface priming strategy based on zirconium phosphate-phosphonate chemistry (ZP priming), which was applied for first time to nanostructured, micrometer-thick titanium dioxide electrodes. Through extensive use secondary ion mass spectrometry (SIMS) depth profiling technique, it possible monitor composition titania samples after every single reaction step priming. In particular, impregnation found be determining whole treatment. SIMS data...
We studied the polluting impact of a filling station on surrounding area by means novel approach. Given fact that precise relation can be found between influence physic obstacle dispersion gaseous substances and "shadow" effect same (i.e. shielding light source), we collected data about shadowing any kind present in an urban (e.g. buildings, trees, etc.). A machine learning algorithm was trained with combination historic anemometric conditions to predict wind field under investigation...
Here we show that the blending of structurally similar oligothiophene molecules is an effective approach to improve field-effect mobility and <italic>I</italic><sub>on</sub>/<italic>I</italic><sub>off</sub> as compared single component based transistors.
Nanoscopic metal–molecule–metal junctions consisting of Fe-bis(terpyridine)-based ordered nanostructures grown in layer-by-layer fashion on a solid support are investigated by conductive atomic force microscopy, as described page 1688 P. Samorì, A. Licciardello, Troisi and co-workers. Hopping is demonstrated the main charge-transport mechanism both experimentally theoretically.