About
Contact & Profiles
A5102707848
Research Areas
- Radiation Effects in Electronics
- Parallel Computing and Optimization Techniques
- Distributed systems and fault tolerance
Beijing Microelectronics Technology Institute
2021
Memory used for storing the configuration bitstream of field programmable gate array in space applications often encounters single event upset problems, which may disrupt integrity data memory and lead to unpredictable failures. For commercial memories low Earth orbit (LEO), single-bit errors double-byte account a large proportion. Meanwhile, error detection correction (EDAC) schemes, e.g., triple modular redundancy, linear block codes, scrubbing, combination these are very popular LEO...
10.3390/electronics10050533
article
EN
Electronics
2021-02-25
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