Sung Bo Lee

ORCID: 0000-0002-3482-8610
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About
Contact & Profiles
Research Areas
  • Microstructure and mechanical properties
  • Semiconductor materials and devices
  • Electronic and Structural Properties of Oxides
  • Electron and X-Ray Spectroscopy Techniques
  • Ion-surface interactions and analysis
  • Fatigue and fracture mechanics
  • GaN-based semiconductor devices and materials
  • Ferroelectric and Piezoelectric Materials
  • ZnO doping and properties
  • Thin-Film Transistor Technologies
  • Silicon Nanostructures and Photoluminescence
  • Microstructure and Mechanical Properties of Steels
  • nanoparticles nucleation surface interactions
  • Theoretical and Computational Physics
  • Metal and Thin Film Mechanics
  • Advanced Materials Characterization Techniques
  • Advanced ceramic materials synthesis
  • Silicon and Solar Cell Technologies
  • High Temperature Alloys and Creep
  • Advanced Electron Microscopy Techniques and Applications
  • Material Dynamics and Properties
  • Advancements in Solid Oxide Fuel Cells
  • Metallurgy and Material Forming
  • Force Microscopy Techniques and Applications
  • Physics of Superconductivity and Magnetism

Seoul National University
2015-2024

Knowles (United States)
2004-2024

Materials Science & Engineering
2023

Seoul Institute
2019

Korea Maritime and Ocean University
2019

Government of the Republic of Korea
2019

Korea University of Technology and Education
2015

New Generation University College
2014

Korea Advanced Institute of Science and Technology
1991-2012

ILJIN Group (South Korea)
2011-2012

Whereas prototypical Al(2)O(3) is not a glass former, amorphous can be formed as thin films through vapor deposition and serve structural model for the glass. The first two-dimensional solid-state NMR experiments film reveal that four- five-coordinated species are predominant (95%), while six-coordinated minor. Such distribution remarkably similar to what has been predicted theoretically melts. Upon annealing 800 degrees C becomes negligible, indicating onset of crystallization Al(2)O(3).

10.1103/physrevlett.103.095501 article EN Physical Review Letters 2009-08-24

We report scanning tunneling microscopy of semiconductor-semiconductor carbon nanotube junctions with different band gaps. Characteristic features the wave functions at energy levels, such as a localized defect state, are clearly exhibited in atomically resolved spectroscopy. The peaks Van Hove singularity on each side penetrate and decay into opposite across junction over distance $\ensuremath{\sim}2\text{ }\text{ }\mathrm{n}\mathrm{m}$. These experimental accounted for, help tight-binding...

10.1103/physrevlett.90.216107 article EN Physical Review Letters 2003-05-29

To identify hematoma progression in patients with warfarin-associated intracerebral hemorrhage (ICH) despite international normalized ratio (INR) normalization fresh-frozen plasma (FFP), we reviewed 45 ICH given FFP. The median time for door to INR was 30 hours (14 49.5), 4 patients' hematomas enlarging after normalization. FFP is associated substantial delay actual administration and pulmonary edema may not prevent of

10.1212/01.wnl.0000238104.75563.2f article EN Neurology 2006-10-09

The synthesis and densification of fairly dense nanocrystalline SrTiO 3 its characterization are described in this paper detail. Significant grain growth was avoided by the application a two‐stage sintering process using hot pressing. High‐resolution transmission electron microscopy energy loss spectroscopy characterizations indicate pure material with no detectable chemical inhomogeneities. electrical measurements disappearance bulk contribution to conduction due overlap depleted space...

10.1111/j.1551-2916.2006.01133.x article EN Journal of the American Ceramic Society 2006-06-12

In this study, electron-beam irradiation of a MgAl

10.1039/d4na00011k article EN cc-by-nc Nanoscale Advances 2024-01-01

This study examined the effect of adding SrO on grain-boundary conduction (gadolinia-doped ceria) containing . The apparent resistivity at decreased drastically from upon doping with SrO, while grain-interior increased gradually as concentration was up to Therefore, resulted in minimum total resistivity. electron probe X-ray microanalysis and analysis lattice parameters suggest that 140–500-fold enhancement is attributed scavenging highly resistive siliceous phase by SrO-containing phase.

10.1149/1.3046153 article EN Journal of The Electrochemical Society 2009-01-01

This study examined the effect of addition on grain-boundary conductivity in -doped containing as an impurity. The increased times without affecting grain-interior significantly. was incorporated into lattice completely, which means that a scavenging reaction between large -related second phase and siliceous impurity not reason for conductivity. After adding , grain boundary structure changed from random to faceted. Configuration change segregation relation boundary-structure variation is...

10.1149/1.2214235 article EN Electrochemical and Solid-State Letters 2006-01-01

A correlation between a grain-boundary structural transition and change in electrical properties is demonstrated, using SrTiO3 bicrystalline grain boundary as model system. faceting–defaceting seen 1500 1600 °C (the of the bicrystal annealed at for one day shown figure) accompanied by an abrupt impedance.

10.1002/adma.200602153 article EN Advanced Materials 2007-01-11

The microstructure of an undoped GaN grown on a hemisphere-patterned sapphire substrate is characterized by transmission electron microscopy. Interestingly, basal-plane stacking faults are formed in at the height hemispheres, leading to substantial reduction threading-dislocation density. It believed that formation characteristic lateral growth mode. This study looks unexplored feature behavior both so-called epitaxial overgrowth mechanism and function reduce dislocation density for substrates.

10.1063/1.3658451 article EN Applied Physics Letters 2011-11-21

The effect of growth temperature on the atomic layer deposition zirconium oxide (ZrO2) dielectric thin films that were fabricated using a CpZr[N(CH3)2]3/C7H8 cocktail precursor with ozone was investigated. chemical, structural, and electrical properties ZrO2 grown at temperatures from 250 to 350 °C characterized. Stoichiometric formed 250–350 an ratio O Zr 1.8–1.9 low content carbon impurities. film 300 predominantly tetragonal crystalline phase, whereas mixture monoclinic phases. Electrical...

10.3390/ma11030386 article EN Materials 2018-03-05
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