A5072557394- Advanced X-ray Imaging Techniques
- Crystallography and Radiation Phenomena
- X-ray Diffraction in Crystallography
- Particle Accelerators and Free-Electron Lasers
- Nuclear Physics and Applications
- Advanced Optical Imaging Technologies
- Numerical methods in inverse problems
- Advanced Surface Polishing Techniques
- Optical measurement and interference techniques
- High-pressure geophysics and materials
- Medical Imaging Techniques and Applications
- Digital Holography and Microscopy
- X-ray Spectroscopy and Fluorescence Analysis
- Laser-Plasma Interactions and Diagnostics
- Optical Coatings and Gratings
- Advanced Mathematical Modeling in Engineering
- Nuclear materials and radiation effects
- Atomic and Subatomic Physics Research
- Integrated Circuits and Semiconductor Failure Analysis
- Seismic Imaging and Inversion Techniques
- Ion-surface interactions and analysis
- Photorefractive and Nonlinear Optics
- Glass properties and applications
- Metallurgy and Cultural Artifacts
- Enzyme Structure and Function
Institute for Informatics and Automation Problems
2011-2024
National Academy of Sciences of Armenia
2021
Yerevan State University
2011
Institute of Microelectronics Technology and High Purity Materials
2011
Abstract In this work the dependence of anomalous absorption X-rays on crystal thickness and temperature gradient value was studied. The refracted reflected beams intensities, as well their sum intensities were measured for thicknesses in range 0.3–4.5 mm. Significant increase intensity is observed presence gradient. It shown that decreased effect stronger expressed thick crystals.
Circular and linear zone plates have been fabricated on the surface of silicon crystals for energy 8 keV by electron beam lithography deep ion plasma etching methods. Various variants compound with first, second, third diffraction orders made. The relief height is about 10 mkm, outermost width plate 0.4 mkm. experimental testing has conducted SPring-8 ESRF synchrotron radiation sources. A focused spot size efficiency measured knife-edge scanning are accordingly 0.5 mkm 39% first order circular plate.
Abstract In this paper, we consider the problem of formation a wave field during dynamic X-ray diffraction under conditions weak deformation crystal lattice induced by temperature gradient directed along vector. Within framework Takagi equations, which describe propagation amplitudes transmitted and reflected waves in grating, analytical solutions dependence on parameters these are given. The angular width radiation, as well its thickness single crystal, has been studied. It is shown that...
Abstract The purpose of the work is to consider basics formation a diffraction wave field thermal neutrons in case Laue transmission geometry limited beam crystal, taking into account peculiarities interaction with continuously and slowly changing deformation crystal net. conditions both blurring contraction (focusing) up practical restoration original shape packet will be studied. An integral form for determining quasi-amplitudes diffracted waves within framework spatially inhomogeneous...
Two-wave dynamical diffraction of an X-ray spherical wave in a crystal, when the passes through object with periodic amplitude transmission function, is considered. The behavior diffracted (spherical-wave Talbot effect) crystal investigated. effect inside accompanied by focusing and pendulum effect. Peculiarities before focus point, plane region after point are revealed. An expression found for depth spherical-wave these three regions compared classical also effects without object.
Stacking technique of the Fresnel zone plate fabrication with effective multilevel structure was considered by means numerical simulation. It shown that such approach allows increasing focusing efficiency without essential additional difficulties since proposed device is a simple combination bi-level structures. The conditions, at which layers are acting as single plate, well criteria layer alignment aren't significantly changed compared those case. angular sensitivity estimation shows it...
The influence of dilatation and defocusing on interference lines obtained with LLL interferometers having different-thickness mirror blocks is studied both theoretically experimentally. These are known to be V-shaped. It shown that the vertices V-shaped bands displaced along direction diffraction vector normal scattering plane. [Russian Text Ignored].
The development of nanotechnology gives new possibilities for fabrication high efficiency X-ray optical elements. stacked multilevel crystal Zone Plate (ZP) is fabricated by means resolution negative tone inorganic HSQ (Hydrogen Silsesquioxane or XR-1541) electron-beam resist. About 80% the resist became SiO<sub>2</sub> after electron beam lithography. This a simple method to fabricate ZPs with masks. Stacked silicon consisting bi-level zone profiles have been investigated. composed ZP...
A novel hard x‐ray interferometer employing three optical Fresnel zone plates has been proposed. This amplitude‐division type does not impose strong requirements on the coherence of incident x‐rays. Employing a magnifying system can lead to increased spatial resolution for phase retrieval applications.
The dynamical diffraction Talbot effect takes place inside a crystal, when periodic object is illuminated by plane or spherical X-ray wave which then falls on the crystal at an angle close to Bragg for some reflection. Both theoretical consideration and numerical calculations show that also behind crystal. accompanied pendulum focusing. Expressions are found distance areas before after spatial Fourier spectrum of obtained focusing plane. Detailed analysis has shown new features this effect....
Structural distortions of the surface layer Si single crystals implanted by monoenergetic Au ions (ion energy 120 keV and 180 keV, doses 1013 ions/cm2 2 × 1014 ions/cm2, respectively) are studied X-ray diffraction. Traverse-type topographs obtained Lang's method. A method to determine thickness distorted using interference pattern contrast measurements is suggested. [Russian Text Ignored].
The new type of multilevel Fresnel zone plate, consisting stacked layers with bi-level profile has been investigated. conditions acting as single plate have discussed by numerical simulation. criteria for alignment presented. Considered approach fabrication allows achieving high level focusing efficiency from one side and decreasing etching deep the other.
The images of the silicon test object has been carried out. An image for in-line hard X-ray hologram is presented. transmission a radiation using Fresnel phase zone plate investigated.