A5010301477- Surface Roughness and Optical Measurements
- Advanced Measurement and Metrology Techniques
- Force Microscopy Techniques and Applications
- Advanced MEMS and NEMS Technologies
- Mechanical and Optical Resonators
- Optical measurement and interference techniques
- Scientific Measurement and Uncertainty Evaluation
- Mesoporous Materials and Catalysis
- Advanced Surface Polishing Techniques
- Carbon Dioxide Capture Technologies
- Tribology and Lubrication Engineering
- Catalytic Processes in Materials Science
- Advancements in Photolithography Techniques
- Catalytic Cross-Coupling Reactions
- Membrane Separation and Gas Transport
- Nanofabrication and Lithography Techniques
- Innovative Approaches in Technology and Social Development
- Ionic liquids properties and applications
- Advanced Manufacturing and Logistics Optimization
- Thin-Film Transistor Technologies
- Luminescence and Fluorescent Materials
- Silicon and Solar Cell Technologies
- Adsorption and Cooling Systems
- Additive Manufacturing Materials and Processes
- Phase Equilibria and Thermodynamics
Georgia Institute of Technology
2004-2024
National Physical Laboratory
2008-2022
University of Virginia
2005
Amine-based solid CO2 adsorbents have been investigated intensively in recent years. However, the focus has routinely on their adsorption capacity and not regeneration. Here, a practical desorption process for supported amine adsorbents, steam-stripping, is demonstrated first time.
A variety of palladated PCP pincer complexes are covalently tethered onto polymeric and silica supports via either amide or ether linkages evaluated in the Heck reaction iodobenzene n-butyl acrylate. The decomposition under conditions all studied is established through poisoning kinetic studies. Furthermore, initial steps pathway as well SCS Pd(II) proposed validated using situ NMR, mass spectroscopy, XAS computational methods. These findings together with our previous reports strongly...
Measurements of forces less than a micronewton are critical when examining the mechanical behaviour materials and devices at characteristic length scales below micrometre. As result, specification standards for nanomechanical tests test equipment being proposed by international organizations, an infrastructure traceable small force calibration is developing. In this context, results reported from first interlaboratory comparison micronewton-level metrology. The basis was set five...
Control of surface topography has always been vital importance for manufacturing and many other engineering scientific disciplines. However, despite over one hundred years quantitative measurement, there are still open questions. At the top list questions is 'Are we getting right answer?' This begs obvious question 'How would know?' There relating to applications, appropriateness a technique given scenario, or relationship between particular analysis function surface. In this first 'open...
Advances in organic photovoltaics have created the opportunity for low-cost, high-throughput manufacture of solar cells using roll-to-roll printing technology; however, performance, reliability, and production yield these devices can be critically limited by incorporation defects during fabrication. The detection elimination all is unrealistic, so techniques are required to identify those types which most critical cell functionality. Here, we combine mapping both surface topography...
ADVERTISEMENT RETURN TO ISSUEEditorialNEXTVirtual Issue on Best Practices for Reporting the Properties of Materials and DevicesRecord Well, Repeat Often, Report CorrectlyJillian M. Buriak, Christopher W. Jones, Prashant V. Kamat, Kirk S. Schanze, George C. Schatz, Gregory D. Scholes, Paul WeissCite this: Chem. Mater. 2016, 28, 11, 3525–3526Publication Date (Web):June 14, 2016Publication History Published online14 June 2016Published inissue 14...
The National Physical Laboratory, UK, has been active in the field of engineering nanometrology for a number years. A summary progress over last five years is presented this paper and following research projects discussed detail. (1) Development an infrastructure calibration instruments measuring areal surface topography, along with development software measurement standards. This work comprises use optical transfer function technique simultaneous topography phase change on reflection,...
Dimensional surface metrology is required to enable advanced manufacturing process control for products such as large-area electronics, microfluidic structures, and light management films, where performance determined by micrometre-scale geometry or roughness formed over metre-scale substrates. While able perform 100% inspection at a low cost, commonly used 2D machine vision systems are insufficient assess all of the functionally relevant critical dimensions in 3D on their own. current...
Abstract The unique complex topography of additively-manufactured surfaces—and the recent rapid evolution instruments and techniques to measure them—limits trust in inspection data, direct conflict with requirements application areas such as aerospace, where failure a part can have serious safety consequences. Topography instrument manufacturers end-users require measurement standards controlled reproduction representative surfaces calibrate, performance-verify intercompare for tasks,...
We present a new class of interferometer system that is capable simultaneous measurement absolute position and rotation in all six degrees freedom (DOF) with nanometer precision. This novel capability due to the employment interference fringes not periodic. One key strengths offered by this approach can be determined single measurement, rather than counting during displacement from known location. The availability DOF eliminates many problems associated conventional interferometry.
As critical dimensions for advanced two dimensional (2D) DUV patterning continue to shrink, the exact process window becomes increasingly difficult determine. The defect size criteria shrink with and are well below resolution of current optical inspection tools. a result, it is more challenging traditional bright field tools accurately discover hotspots that define window. In this study, we use novel computational method identify depth-of-focus limiting features 10 nm node mask 2D metal...
Amplitude–wavelength (AW) space is a well-established technique for depicting the operational performance of surface texture measuring instruments. The introduction third parameter to AW space, in-plane scanning speed, described. We present discussion equations derived from constraints and interdependencies stylus instrument: National Physical Laboratory's Areal Instrument. Constraints derive instrument range, resolution, range measurement force, probe tip geometry synchronization data...
Abstract Silica scaffolding : By employing functionalized mesoporous SBA‐15 silica, novel fluorescent cruciform‐silica hybrid materials are generated which preserve the desirable solution properties of cruciforms in solid state for potential use sensory schemes. magnified image Preserving functional fluorophores upon incorporation into schemes remains a significant challenge. To address this concern, silica scaffold was employed to support state. Herein, we report an effort...
Abstract Silica‐supported amine absorbents, including materials produced by tethering aminosilanes or infusion of poly(ethyleneimine), represent a promising class for CO 2 capture applications, direct air and point source capture. Various silica surface treatments functionalization strategies are explored to enhance stability uptake in amine‐based solid sorbent systems. Here, the synthesis characterization novel vinyltrimethoxysilane‐treated Santa Barbara Amorphous‐15 (SBA‐15) supports...
The growth in nanotechnology has led to an increased requirement for traceable dimensional measurements of nanometre-sized objects and micrometre-sized with nanometre tolerances. To meet this challenge NPL developed both purpose built instrumentation added metrology commercially available equipment. This paper describes the development use a selection these instruments that include: atomic force microscopy, x-ray interferometry, low balance, micro coordinate measuring machine areal surface...