Youjin Lee

ORCID: 0000-0002-9078-9337
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About
Contact & Profiles
Research Areas
  • Industrial Vision Systems and Defect Detection
  • Manufacturing Process and Optimization
  • Interconnection Networks and Systems
  • Photonic and Optical Devices
  • 3D IC and TSV technologies
  • Additive Manufacturing Materials and Processes

Samsung (South Korea)
2023-2024

Sungkyunkwan University
2023

Enormous amounts of data are generated and analyzed in the latest semiconductor industry. Established yield prediction studies have dealt with one type or a dataset from procedure. However, device fabrication comprises hundreds processes, various factors affect yields. This challenge is addressed this study by using an expandable input data-based framework to include divergent adapting explainable artificial intelligence (XAI), which utilizes model interpretation modify conditions. After...

10.3390/app13042660 article EN cc-by Applied Sciences 2023-02-18

With the development of industries, such as high-performance computing, advanced driver-assistance systems, artificial intelligence, and deep learning, demand for high-bandwidth memory, chiplets continues to increase. Most these applications generally use a source-synchronous single-ended parallel transceiver architecture consist 2.5D package (called an package) along with silicon interposer channels [1]. Applications also include lot high-speed I/O process large amounts data. In general,...

10.1109/isscc49657.2024.10454481 article EN 2022 IEEE International Solid- State Circuits Conference (ISSCC) 2024-02-18

10.1109/icde55515.2023.00378 article EN 2022 IEEE 38th International Conference on Data Engineering (ICDE) 2023-04-01
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