A5041394132- Electron and X-Ray Spectroscopy Techniques
- X-ray Spectroscopy and Fluorescence Analysis
- Semiconductor materials and devices
- Advancements in Photolithography Techniques
- Surface and Thin Film Phenomena
- Ion-surface interactions and analysis
- Integrated Circuits and Semiconductor Failure Analysis
- Electronic and Structural Properties of Oxides
- ZnO doping and properties
- Advanced Electron Microscopy Techniques and Applications
- Ga2O3 and related materials
- Corrosion Behavior and Inhibition
- Copper-based nanomaterials and applications
- Laser-induced spectroscopy and plasma
- Advanced Materials Characterization Techniques
- Advanced Chemical Physics Studies
- Metal and Thin Film Mechanics
- Machine Learning in Materials Science
- Copper Interconnects and Reliability
- Semiconductor materials and interfaces
- Surface Roughness and Optical Measurements
- nanoparticles nucleation surface interactions
- Iron oxide chemistry and applications
- Optical Coatings and Gratings
- Nuclear Physics and Applications
University of Southern Denmark
2015-2025
John Wiley & Sons (United Kingdom)
2022
Interface (United Kingdom)
2020-2022
John Wiley & Sons (United States)
2020-2022
Karlsruhe Institute of Technology
2021
University of Nevada, Las Vegas
2021
University of Potsdam
2020
Brigham Young University
2020
University of East Asia
2020
Swedish Chemicals Agency
1977-2013
The methodology presented within this work is a result of years interactions between many junior and senior X-ray Photoelectron Spectroscopy (XPS) users operating the CasaXPS spectral processing interpretation program framework. In particular, discussions arising from series workshops have been significant source for developing overall XPS data concept are motivation creating work. These organized by Institut des Matériaux Jean Rouxel (IMN), Nantes gather both experienced novice week...
The electronic and optical properties of Cu, CuO Cu2O were studied by x-ray photoelectron spectroscopy (XPS) reflection electron energy-loss (REELS). We report detailed Cu 2p, LVV, O 1s KLL spectra which are in good agreement with previous results. REELS spectra, recorded for primary energies the range from 150 to 2000 eV, corrected multiple inelastically scattered electrons determine effective inelastic scattering cross section. dielectric functions determined comparing experimental section...
Abstract Recent progress, in the quantitative analysis of distortion surface electron spectra, resulting from inelastic scattering, is reviewed. A physical model for problem formulated and based on this, basic deconvolution formulae are found. In formulae, detailed information differential scattering cross‐section K essential. Methods to determine, studied developed. One method a dielectric response calculation. Furthermore, it found that noble transition metals, sufficiently similar simple...
We have investigated theoretically the spectrum of electrons emitted from a solid in case primary excitation function corresponding to narrow line as Auger and photoelectron spectroscopy. concentrate on influence elastic inelastic electron scattering shape intensity vicinity peak. A near-peak well an off-peak region is identified; critical energy loss separating two regions shown depend relative significance angular deflection scattering. rigorous formula has been derived that allows...
Quantitative XPS and AES analysis of surfaces requires models to do fast calculations the energy loss electrons at any as they move in solids general non-uniform composition. This is possible with Universal cross-section that was introduced a decade ago. A critical review given light results research carried out since then. In particular its validity compared experimental cross-sections determined by reflected electron energy-loss spectroscopy (REELS) spectra. It shown for applications...
The possibility of extracting absolute inelastic electron scattering cross sections K(T) (differential in energy loss T and path length) for solids from experimental spectra is studied. Assuming homogeneous properties the solid, a formula found, which allows direct determination [\ensuremath{\lambda}L/(\ensuremath{\lambda}+L)]K(T) measured reflected electron-energy-loss spectrum (REELS) resulting monoenergetic beam electrons incident on surface solid. Here \ensuremath{\lambda} mean free...
Two models to reproduce experimental inelastic-electron-scattering cross sections determined from reflection-electron-energy-loss spectroscopy (REELS) are considered. The take into account the momentum transfer in inelastic processes. Inputs for dielectric function and electron mean free path, which both taken previous works. It is found that a model takes k dependence of effect field set up by incoming on outgoing gives best description. Without any adjustable parameters, reasonable...
The accuracy of XPS and AES quantification by peak shape analysis was established from a detailed range model spectra three sets experiments. It found that information on the concentration–depth profile in surface region up to depths ∽5λi (where λi is inelastic electron mean free path) primarily contained spectral energy ∽100 eV below essentially completely ∽200 peak. Analysis larger than 100 does not add much details structure outermost 5λi but gives possibility determine additional...
Inelastic-scattering cross sections of 300--10 000-eV electrons in Si, Ti, Fe, and Pd 300--2000-eV Cu, Ag, Au have been investigated theoretically experimentally. The product the inelastic mean free path section were determined experimentally through an analysis, based on a recent formula, reflection electron-energy-loss spectra. To study energies above 2000 eV special experimental setup was developed. Theoretical dielectric-response description solid-electron interaction using...
Factors that contribute to the uncertainty in quantitative analyses of surfaces by x-ray photoemission spectroscopy and Auger electron are considered. Quantification is usually based on convenient but quite arbitrary assumption sample homogeneous within outermost few nanometers. This can lead uncertainties several hundred percent analysis and, as a consequence, meaningful quantification measured peak intensities alone not possible. In contrast, contribution from other factors much smaller....
This guide is intended for both the novice in x-ray photoelectron spectroscopy (XPS) as well users with some experience. XPS one of most widely used methods to characterize surface nanostructured samples, and now also commonly accessible material scientists through facility centers. It is, therefore, increasingly a routine analysis technique complement other techniques. has led an increase number who may not have full understanding details consequently must rely on report provided by center....
A model to reproduce inelastic electron scattering cross sections as determined from reflection-electron-energy-loss experiments is proposed. This an extension of B Yubero and Tougaard [Phys. Rev. 46, 2486 (1992)]. Here, a more general geometry considered where the incidence exit angles can be varied. Then, for given energy primary electrons, dielectric function sample only input calculations. systematic study behavior presented case Si Fe. \textcopyright{} 1996 The American Physical Society.
The shape of all major x-ray-excited peaks, including Auger transitions, from Cu, Ag, and Au are studied. intensity contribution inelastic (extrinsic) processes removed. In cases the primary excitation spectra thus determined found to consist a peak tail (intrinsic) electrons which extends \ensuremath{\sim}50 eV below energy. Beyond this energy essentially measured is accounted for without use adjustable parameters. ratio intrinsic extrinsic same order as previously simple metals.
A model for the inelastic-scattering cross section of electrons in XPS experiments is presented. The calculation analogous to a previous reflection-electron energy-loss spectroscopy by Yubero et al. [Phys. Rev. B 53, 9719 (1996)]. treats general case photoelectron creation at arbitrary depth and with exit angle electron energy. effect core hole as well surface effects are included model. We study systematically behavior when energy, angle, origin varied. Furthermore, on energy loss...
Abstract In the present work, we have tested consistency and validity of Tougaard, Shirley straight‐line methods for determination peak intensities in XPS. Intensities were determined from essentially all photoelectron peaks (with Mg Kα Al radiation) seven polycrystalline elemental solids (Co, Ni, Cu, Zn, Ag, Pt Au) three sets alloys (Cu 0.75 Au 0.25 , Cu 0.5 Co Ni 0.45 0.55 0.44 Mn 0.01 ). For methods, intensity ratios under a variation analyser settings was studied. The studied by...
A new, simple formalism for quantitative surface analysis by electron spectroscopy is found. The takes into account the in-depth concentration profile and consists in three algorithms. simplest of algorithms reasonably accurate spectra from most profiles. For narrow depth profiles centered at depths ≳1–2 λ a substrate with an overlayer width ≳λ, one other two should be used. decides, criterion, which to applied given spectrum. total amount material within region solid as well approximate...
The overlayer method for determining the attenuation length was simulated by Monte Carlo method. theoretical model based on elastic scattering cross sections resulting from partial wave expansion Multiple electron collisions in solid were considered. Calculations made MgKα excited silver 3d photoelectrons ejected overlayer. ‘‘deposited’’ a number of substrates having wide range atomic numbers. It found that values cover interval (9.14–13.44 Å). inelastic mean free path Ag assumed...
Abstract A theory is presented that allows detailed quantitative information on in‐depth concentration profiles to be extracted through analysis of surface electron spectra. The depth profile determined from a single spectrum and the method therefore fast non‐destructive. validity tested anlaysis model spectra wide variety inhomogeneous systems. It demonstrated can clearly distinguish between different classes profiles. Moreover, formalism used overlayer growth mechanisms. resolution in...
Elastic electron backscattering from solid surfaces has been studied experimentally and theoretically. It shown that the recently published ${P}_{1}$ approximation gives an inadequate description. Much more realistic results are obtained Monte Carlo algorithm based on differential cross sections calculated within partial-wave expansion method. Excellent agreement found between experimental data in present work or taken literature. The calculations seem to be valid for energies exceeding 200...