Stefan Enghardt

ORCID: 0000-0003-1371-593X
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About
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Research Areas
  • Electrical and Bioimpedance Tomography
  • Non-Destructive Testing Techniques
  • X-ray Diffraction in Crystallography
  • Advanced Battery Technologies Research
  • High Temperature Alloys and Creep
  • High-Temperature Coating Behaviors
  • Advanced X-ray Imaging Techniques
  • Magnetic Field Sensors Techniques
  • Reservoir Engineering and Simulation Methods
  • MXene and MAX Phase Materials
  • Advanced NMR Techniques and Applications
  • Catalytic Processes in Materials Science
  • Concrete Corrosion and Durability
  • Advanced Surface Polishing Techniques
  • Integrated Circuits and Semiconductor Failure Analysis
  • High Entropy Alloys Studies
  • Advanced X-ray and CT Imaging
  • Semiconductor materials and devices
  • Microstructure and Mechanical Properties of Steels
  • Geophysical Methods and Applications
  • Smart Materials for Construction
  • Advanced Measurement and Metrology Techniques
  • Additive Manufacturing Materials and Processes
  • Advanced Photocatalysis Techniques
  • Nuclear Physics and Applications

Technische Universität Dresden
2015-2025

The development of new high temperature materials for coatings as well structural components is an important topic to contribute a higher efficiency and sustainability e.g. gas turbine engines. One promising class are NiAl-based alloys. Within this study, the microstructure microhardness NiAl-Ta-Cr alloys with varying Cr Ta content were investigated. Graded specimens fabricated by laser-based directed energy deposition utilizing in situ alloying approach mixing elemental pre-alloyed NiAl...

10.1016/j.matdes.2024.112667 article EN cc-by-nc-nd Materials & Design 2024-01-18

Abstract Hf x Zr 1‐x O 2 thin films have excellent complementary metal–oxide semiconductor compatibility and scalability compared to other ferroelectric materials. This makes them a promising candidate for non‐volatile memory applications. However, the polymorphism of materials presents challenge in stabilizing properties. Since wake‐up free applications require presence properties pristine state without additional electric field cycling, it is necessary understand how promote orthorhombic...

10.1002/smll.202408133 article EN Small 2025-02-03

The identification and location of critical defects inside battery cells before the performance decreases or safety issues arise remain a challenge. This study compares two nondestructive testing methods for 3D visualization at different depths pouch cell: scanning acoustic microscopy (SAM) X‐ray computed tomography (CT). A manufactured cell with eight electrode sheets is used this investigation. SAM using 15 MHz transducer in reflection mode can detect up to four lateral resolution 150 μm 2...

10.1002/ente.202300323 article EN cc-by Energy Technology 2023-08-10

We present novel multi-energy X-ray imaging methods for direct radiography and computed tomography. The goal is to determine the contribution of thickness, mass density atomic composition measured absorption in sample. Algorithms have been developed by our own calculate new images using data from an unlimited amount scans/images different tube voltages pixelwise fitting detected gray levels. resulting then show a contrast that influenced either number elements sample (photoelectric...

10.1371/journal.pone.0232403 article EN cc-by PLoS ONE 2020-05-06

Abstract The unique properties of silica, such as biocompatibility and the ability to promote cell growth, demonstrate favorable results in different applications drug delivery, biomedical applications, tissue engineering (TE). Electrospinning has emerged a method for creating substrate with high surface area structural resemblance natural extracellular matrices. A common fabricating silica nanofibers (SNFs) TE involves hybrid silica/ polymer nanofibers, which require calcination remove...

10.1002/mame.202300169 article EN cc-by Macromolecular Materials and Engineering 2023-11-13

Micro diffraction methods like the Kossel or X-ray rotation tilt techniques generate patterns consisting of conic sections. Extracting information about lattice parameters, orientation stresses from those generally requires additional information. As a consequence, it is necessary to make high precision measurements pattern center and detector-sample distance. By modeling focal curves possible determine these parameters only single exposure. The sections in detected image intersect (ideally)...

10.4236/jamp.2015.311166 article EN Journal of Applied Mathematics and Physics 2015-01-01

Abstract Nichtmetallische Bewehrungen werden bereits heute vielfältig im Betonbau eingesetzt. Bisher erfolgt deren Materialprüfung überwiegend unter zerstörenden Bedingungen. So wird die Position der Bewehrungslagen innerhalb Betonmatrix durch Sichtung und Vermessung von Sägeschnittflächen ermittelt. Bildgebende Verfahren wie Röntgen‐Computertomografie (X‐ray computed tomography, XCT) ‐laminografie laminography, XCL) ermöglichen zerstörungsfreie Bewertung Ortung Bewehrungsmaterialien aus...

10.1002/bate.201800084 article DE Bautechnik 2019-06-25

The piezoelectric materials langasite (LGS) and calcium tantalum gallium silicate (CTGS) have been investigated with the X-ray rotation tilt (XRRT) technique using a new evaluation method. XRRT is microdiffraction method where diffraction lines are registered on two-dimensional detector. These can be described conic sections analogous to Kossel lines. Their form position depend upon lattice parameters orientation of crystal. They can, therefore, used obtain these parameters. allows for an...

10.1107/s1600576718001632 article EN Journal of Applied Crystallography 2018-03-01

Abstract Results of white beam X‐ray interference measurements on almost perfect semiconductor wafers are presented. A specific measurement geometry allows for the investigation diffraction effects thin down to at least 375 µm with a simple experimental setup (standard lab CT microfocus tube). Furthermore, dynamic effect double refraction has been studied in detail thicker samples. This might lead new wafer testing method as observed very sensible crystal quality.

10.1002/crat.202100085 article EN cc-by Crystal Research and Technology 2021-08-06

Figure 1.Principle of the X-ray-Rotation-Tilt Method (top).XRRT pattern BaTiO 3 at 20°C (bottom left) and 130°C right).The white dot marks rotation center which is close to 100-pole.

10.1107/s2053273316093906 article EN Acta Crystallographica Section A Foundations and Advances 2016-08-28
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