- Integrated Circuits and Semiconductor Failure Analysis
- VLSI and Analog Circuit Testing
- Physical Unclonable Functions (PUFs) and Hardware Security
- Chaos-based Image/Signal Encryption
- Chaos control and synchronization
- Advancements in Semiconductor Devices and Circuit Design
- VLSI and FPGA Design Techniques
- Microwave Engineering and Waveguides
- Radiation Effects in Electronics
- Radio Frequency Integrated Circuit Design
- Low-power high-performance VLSI design
- Advanced Multi-Objective Optimization Algorithms
- Advancements in PLL and VCO Technologies
- Fractal and DNA sequence analysis
- Electrostatic Discharge in Electronics
- Cellular Automata and Applications
- Evolutionary Algorithms and Applications
- Advancements in Photolithography Techniques
- Blind Source Separation Techniques
- Optimal Experimental Design Methods
- Face and Expression Recognition
- Electromagnetic Compatibility and Noise Suppression
- IoT-based Smart Home Systems
- Cryptographic Implementations and Security
- IoT and GPS-based Vehicle Safety Systems
Georgia Institute of Technology
2012-2023
University of Mississippi
2021-2022
University of New Orleans
2009
We present a general framework for improving the chaotic properties of CMOS-based maps by cascading multiple in series. Along with two novel map topologies, we 45 <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$nm$ </tex-math></inline-formula> designs four discrete-time topologies. With help bifurcation plot and three established entropy measures, namely, Lyapunov exponent, Kolmogorov entropy, correlation...
Prior research has established that dynamically trading-off the performance of radio-frequency (RF) front-end for reduced power consumption across changing channel conditions, using a feedback control system modulates circuit and algorithmic level "tuning knobs" in real-time based on received signal quality, leads to significant savings. It is also known optimal strategy depends process conditions corresponding RF devices concerned. This an explosion search space needed find best strategy,...
The test generation problem for analog/RF circuits has been largely intractable due to the fact that repetitive circuit simulation stimulus optimization is extremely time-consuming. As a consequence, it difficult, if not impossible, generate tests practical mixed-signal/RF include effects of tester inaccuracies and measurement noise. To offset this allow scale different applications, we propose new approach in which FSM models are abstracted from hardware measurements on fabricated devices....
The proliferation of third-party silicon manufacturing has increased the vulnerability integrated circuits to malicious insertion hardware for purpose leaking secret information or even rendering useless while deployed in field. A key goal is detect presence such before they are activated subversive reasons. One way achieve this parasitic loads on internal nodes a victim circuit. However, detection becomes difficult normal process variations itself. In work, we show how high-resolution...
We present a cascaded chaotic system as hardware-efficient way of elevating the entropy in behavior CMOS-based maps. The performance proposed scheme is evaluated using bifurcation plot, Lyapunov exponent, Kolmogorov entropy, and correlation coefficient. improved region benefits many security applications demonstrated experimentally new random number generator (RNG) design based on map. Unlike conventional mathematical map-based digital pseudo-random generators (PRNG), not completely...
This brief presents four discrete-time chaotic map circuits, including three new circuits and one that has been previously reported. The designs are hardware efficient as they each contain only Metal Oxide Semiconductor (MOS) transistors. They offer robust performance with wide space uniform entropic properties. region is essential for applications where parametric perturbation can push the system out of desirable region. analyzed using a bifurcation plot, Lyapunov exponent, correlation...
Prior research has established that dynamically trading-off the performance of RF front-end for reduced power consumption across changing channel conditions, using a feedback control system modulates circuit and algorithmic level tuning knobs in real-time, leads to significant savings. It is also known optimal strategy depends on process conditions corresponding devices concerned. This complicates problem designing guarantees best minimizing all corners. Since this largely intractable due...
As RF design scales to the 28nm technology node and beyond, pre-silicon simulation verification of complex mixed-signal/RF SoCs is becoming intractable due difficulties associated with simulating diverse electrical effects bugs. a consequence, there increasing pressure develop comprehensive post-silicon test debug tools that can be used identify bugs improve modeling nonidealities observed in silicon. Often, it not known a-priori what these are how they modeled, significantly complicating...
Prior research has established that dynamically trading-off the performance of RF front-end for reduced power consumption across changing channel conditions, using a feedback control system modulates circuit and algorithmic level "tuning knobs" in real-time, leads to significant savings. It is also known optimal strategy depends on process conditions corresponding devices concerned. This complicates problem designing guarantees best minimizing all corners. Since this largely intractable due...
Alternative signature based testing of analog/RF circuits and systems has been established over the last two decades. Signature is predicated on from device under test (DUT) to statistically predict specifications an IC. Statistical correlation between are built a set initial ICs. Aliasing in space will produce aliasing specification lead incorrect prediction. Alternate aims create unique IC specific avoid aliasing. Hardware security also entails be authenticated. Theories infrastructure...
With trends in mixed-signal systems-on-chip indicating increasingly extreme scaling of device dimensions and higher levels integration, the tasks both design validation is becoming complex. Post-silicon mixed-signal/RF systems provides assurances functionality complex that cannot be asserted by even some most advanced simulators. We introduce RAVAGE (from “random;” “validation;” “generation”), an algorithm for generating stimuli post-silicon systems. The approach new no assumption made about...
Due to the use of scaled technologies, high levels integration and speeds today's mixed-signal SoCs, problem validating correct operation SoC under electrical bugs that debugging yield loss due unmodeled multi-dimensional variability effects is extremely challenging. Precise simulation all aspects design including interfaces between digital analog circuitry, coupling across power ground planes, crosstalk, etc., process corners very hard achieve in a practical sense. The expected get worse as...
Insertion of malicious Trojans into outsourced chip manufacturing generally results in increased capacitances internal circuit nodes that have been tapped for node controllability and observability by circuitry. Current path delay measurement side channel Trojan detection techniques are unable to detect present low loading such nodes, especially the presence large process variations. In this paper, a high-resolution method digital logic based on pulse propagation is developed. The exhibits...
Post-silicon validation of RF/mixed-signal circuits is challenging due to the need excite all possible operational modes DUT in order establish equivalence between its specified and observed behaviors ensure that does not produce any unexpected can lead system failure. In this research, we first develop a methodology for determining if contains are explicitly included behavioral model. A complex (optimized) test waveform applied response signature captured. It seen presence behaviors,...
In production testing of analog/RF ICs, application standard specification-based tests for IC classification is not always an attractive option due to the high costs and test times involved. this paper, a new generation algorithm first developed that has property corresponding DUT response signatures devices from diverse process corners are maximally separable. other words, space can be partitioned into large number partitions each tested uniquely diagnosed lie in one such partition its...
In the recent past, Physically Unclonable Functions (PUFs) have been proposed as a way of implementing security in modern ICs. PUFs are hardware designs that exploit randomness silicon manufacturing processes to create IC-specific signatures for authentication. While prior PUF largely digital, this work we propose novel design based on transfer function variability an analog push-pull amplifier under process variations. A differential architecture is with digital interfaces allow be used...
Future 5G wireless systems will deploy massive MIMO with large numbers of transmit and receive antennas novel RF transceiver architectures that admit beamforming. Such need to be designed built-in test post-manufacture self-tuning capability for yield enhancement in-field tuning. A key issue is the lack observability into internal circuit nodes due convergence multiple beamforming chains a combined baseband signal decouple individual chain behaviors from signals. second problem testing...
We present a general method called "self-parameterization" for designing one-dimensional (1-D) chaotic maps that provide wider regions than existing 1-D maps. A wide range is desirable property as it strengthens the security feature by enlarging design space in many hardware-security applications, including reconfigurable logic and encryption. The proposed self-parameterized scheme reduces hardware cost involving only one map modulates its own control parameter at every iteration passing...
High levels of integration in SoCs and SoPs is making pre as well post-silicon validation mixed-signal systems increasingly difficult due to: (a) lack automated postsilicon design checking algorithms (b) controllability observability internal circuit nodes post-silicon. While digital scan chains provide states, analog suffer from signal integrity, bandwidth loading issues. In this paper, we propose a novel technique based on built-in state consistency that allows both mixed-signal/RF without...
Outsourcing of chip manufacturing to untrusted foundries and using third party IPs in design, have opened the possibility inserting malicious hardware Trojans into circuit. As excitation Trojan is extremely rare, it almost impossible detect with functional logic testing. We need without actually activating (side channel analysis). Hardware circuit get inputs from low transition probability nodes original Tapping these for creating increase capacitive load at those nodes. developed a very...
High operating speeds and use of aggressive fabrication technologies necessitate validation mixed-signal electronic systems at every stage top-down design: behavioral to netlist physical design silicon. At each step, establishes the equivalence lower level descriptions against their higher specifications. Prior research has leveraged state reachability analysis, nonconvex optimization, or performance specifications in order generate tests. In contrast, we reformulate under as a Markov...
We present a methodology for algorithmic generation of test signals the detection and diagnosis variety short open-circuit defects in analog circuits. Prior algorithms have focused on known or open defect values. This places burden failure coverage accurate analysis observed failed parts at high cost. In this work, we optimize stimulus to detect <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">weakest</i> shorts opens circuits using concurrent...
In the modern mixed-signal SoC design cycle, designers are frequently tasked with detecting and diagnosing behavioral discrepancies between descriptions given at different levels of hierarchy, e.g. vs. transistor level or behavioral/transistor fabricated silicon. One problem is detection, to determine if differences exist. If such (anomalies) detected, then diagnosis concerned identifying module in a hierarchical description system that most likely root cause anomaly (typically under...