Andrii Sofiienko

ORCID: 0000-0003-2781-1623
Publications
Citations
Views
---
Saved
---
About
Contact & Profiles
Research Areas
  • Advanced X-ray and CT Imaging
  • Advanced Semiconductor Detectors and Materials
  • Medical Imaging Techniques and Applications
  • Ion-surface interactions and analysis
  • Particle Detector Development and Performance
  • Advanced X-ray Imaging Techniques
  • Integrated Circuits and Semiconductor Failure Analysis
  • Nuclear Physics and Applications
  • Radiomics and Machine Learning in Medical Imaging
  • Radiation Detection and Scintillator Technologies
  • Radiation Dose and Imaging
  • X-ray Diffraction in Crystallography
  • Radiation Shielding Materials Analysis
  • Surface and Thin Film Phenomena
  • Silicon and Solar Cell Technologies
  • Terahertz technology and applications
  • Semiconductor Quantum Structures and Devices
  • Electron and X-Ray Spectroscopy Techniques
  • Advanced Sensor Technologies Research
  • Advanced Materials Characterization Techniques

Excillum (Sweden)
2017-2022

University of Bergen
2013-2016

An abstract is not available for this content so a preview has been provided. As you have access to content, full PDF via the ‘Save PDF’ action button.

10.1017/s1431927618013521 article EN Microscopy and Microanalysis 2018-08-01

This article presents the results of an experimental investigation energy spectra charge carrier traps in undoped high-resistivity ZnSe single crystals.Fourteen peaks were found thermostimulated luminescence samples at temperatures between 8 K and 450 K, thermal activation energies estimated for most intense peaks.It was that exhibit oscillatory regularity, a vibrational quantum to be ω = 206 cm -1 , which is good agreement with mode Raman spectrum.Additionally, linear relationship observed...

10.12693/aphyspola.129.304 article EN Acta Physica Polonica A 2016-03-01

Experimental investigations of temperature dependences X-ray luminescence, and dark conductivity undoped crystals ZnSe has been investigated. It shown that the samples with temperatures T > 400 K is conditioned by thermal delocalization carriers from deep levels ET = 0.83 eV, magnitude decreases heating until 350 K, but increases — higher temperatures. Due to this behavior it can be possible use them as X- or gamma ray detectors for hightemperature environment (high-temperature detectors).

10.18524/1815-7459.2011.4.118607 article EN cc-by-nc Sensor Electronics and Microsystem Technologies 2011-12-15

Abstract The size and shape of the focal spot, i.e. area where x-rays are generated in an x-ray tube, is a key figure merit radiographic imaging system, because it governs achievable resolution and, if irregular, can introduce anisotropic blur radiographs. Size mainly determined by diameter accelerated electron-beam electron interactions with target material. Since spot parameters change over time, due to wear drift optics, traceable methods monitor required. Here, we present method map 2D...

10.1088/1361-6501/ac6225 article EN cc-by Measurement Science and Technology 2022-03-29

Monte Carlo simulations were used to study photon production in a panoramic X-ray tube with conical tungsten target determine the optimal characteristics of shape and electron beam configuration. Several performed for accelerating potentials equal 250 kV, 300 500 kV beams various radii anode sizes. The angular distribution intensity was analysed by numerical calculations an assembly composed external collimator cylindrical hole simulate scanning system pencil beam.

10.1155/2014/847651 article EN cc-by Physics Research International 2014-08-21

Measurements of intrinsic conductivity and X-ray induced were performed on specially undopped ZnSe samples. The measurements demonstrated that sensors made have minor when heating up to the temperature 180 °C, significant conductivity. Dose dependence "dose rate - current" is described with simple power function which considerably simplifies calibration sensors. This results can be used during designing high-temperature gamma-radiation detectors for radiation hot rolling thickness gauges are...

10.48550/arxiv.1106.2232 preprint EN cc-by-nc-sa arXiv (Cornell University) 2011-01-01

High-end x-ray diffraction, scattering and imaging techniques such as high-resolution XRD, protein crystallography, phase contrast SAXS rely heavily on the source brightness for resolution exposure time. Traditional solid or rotating anode tubes are typically limited in by when e-beam power density melts anode. The liquid-metal-jet technology has overcome this limitation using an that is already molten state.

10.1364/euvxray.2018.et2b.3 article EN 2018-01-01
Coming Soon ...