P. Marchal

ORCID: 0000-0003-2821-8119
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About
Contact & Profiles
Research Areas
  • Parallel Computing and Optimization Techniques
  • Embedded Systems Design Techniques
  • 3D IC and TSV technologies
  • Interconnection Networks and Systems
  • Additive Manufacturing and 3D Printing Technologies
  • Mediterranean and Iberian flora and fauna
  • Neuroinflammation and Neurodegeneration Mechanisms
  • Barrier Structure and Function Studies
  • Electronic Packaging and Soldering Technologies
  • Real-Time Systems Scheduling
  • Semiconductor materials and devices
  • Neuroscience and Neuropharmacology Research
  • Memory and Neural Mechanisms
  • Plant and animal studies
  • Horticultural and Viticultural Research
  • Low-power high-performance VLSI design
  • Neurological Disease Mechanisms and Treatments
  • Entomological Studies and Ecology
  • Plant Physiology and Cultivation Studies
  • Insect and Arachnid Ecology and Behavior
  • Electrostatic Discharge in Electronics
  • Botany and Plant Ecology Studies
  • Advanced Data Storage Technologies
  • Diptera species taxonomy and behavior
  • Sleep and Wakefulness Research

Université Claude Bernard Lyon 1
2018-2025

Centre de Recherche en Neurosciences de Lyon
2025

Inserm
2024-2025

University of Arizona
2023

University of California, Los Angeles
2023

Duke-NUS Medical School
2023

Experimental Medicine and Biology Institute
2023

Consejo Nacional de Investigaciones Científicas y Técnicas
2023

Centre National de la Recherche Scientifique
2019-2020

Centre de Recherches sur la Cognition Animale
2019-2020

In this paper key design issues and considerations of a low-cost 3-D Cu-TSV technology are investigated. The impact TSV on BEOL interconnect reliability is limited, no failures have been observed. stress MOS devices causes <formula formulatype="inline" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex Notation="TeX">${\rm Vth}$</tex></formula> shifts, further analysis required to understand their importance. Thermal hot spots in chip stacks cause...

10.1109/jssc.2010.2074070 article EN IEEE Journal of Solid-State Circuits 2010-10-20

An ever increasing number of dynamic interactive applications are implemented on portable consumer electronics. Designers depend largely operating systems to map these the architecture. However, today's embedded abstract away precise architectural details platform. As a consequence, they cannot exploit energy efficiency scratchpad memories. We present in this paper novel integrated hardware/software solution support memories at high abstraction level. hardware alleviate transfer cost from/to...

10.1145/996566.996634 article EN 2004-06-07

As scaling becomes increasingly difficult, 3D integration has emerged as a viable alternative to achieve the requisite bandwidth and power efficiency challenges. However mechanical stress induced by through silicon vias (TSV) is one of key constraints in flow that must be controlled order preserve integrity front end devices. For first time an extended comprehensive study given for single- arrayed TSVs its impact on both analog digital FEOL devices circuits. This work provides complete...

10.1109/iedm.2010.5703278 article EN International Electron Devices Meeting 2010-12-01

10.3406/bsef.1910.24729 article FR Bulletin de la Société entomologique de France 1910-01-01

10.5281/zenodo.24415 article FR Annales de la Société entomologique de France (N S ) 1897-12-31

This paper addresses the problem of mapping an application, which is highly dynamic in future, onto aheterogeneous multiprocessor platform energy efficient way. A two-phase scheduling method used for that purpose. By exploring Pareto curves and scenarios generated at design time, run-time scheduler can easily find a good very low overhead, satisfying system constraints minimizing consumption. real-life example from 3D quality service kernel to show effectiveness our method.

10.1145/581199.581226 article EN 2002-01-01

The power density inside high performance systems continues to rise with every process technology generation, thereby increasing the operating temperature and creating "hot spots" on die. As a result, performance, reliability consumption of system degrade. To avoid these spots", "temperature-aware" design has become must. For low-power embedded though, it is not clear whether similar thermal problems occur. These have very different characteristics from ones: they consume hundred times less...

10.1109/date.2006.243741 article EN 2006-01-01

Stacking memory with 3D chip integration technology could provide the much needed bandwidth and density for mobile applications at low power. The contribution of this paper is to review desired attributes a stackable from system aspects discuss its implementation challenges.

10.1109/iedm.2008.4796821 article EN 2008-12-01

Microglia exhibit diverse morphologies reflecting environmental conditions, maturity or functional states. Thus, morphological characterization provides important information to understand microglial roles and functions. Most recent analysis relies on classifying cells based parameters. However, this classification may lack biological relevance, as represent a continuum rather than distinct, separate groups, do not correspond mathematically defined, clusters irrelevant of function. Instead,...

10.7554/elife.101630.2 preprint EN 2025-03-17

Interactions among brain areas are essential to most cognitive functions. Neuronal interactions between these depend on the modulation of synaptic strength. However, this remains poorly understood. We recorded evoked responses at four hippocampal pathways in freely moving male rats across 24 hours. show that strength oscillates with a very slow periodicity and correlates durations vigilance states. A model based hypnogram data one pathway was able predict evolution pathways, except one....

10.1038/s41467-025-57976-3 article EN cc-by-nc-nd Nature Communications 2025-03-26

Convergence of communication, consumer applications and computing within mobile systems pushes memory requirements both in terms size, bandwidth power consumption. The existing solution for the bottle-neck is to increase amount on-chip memory. However, this becoming prohibitively expensive, allowing 3D stacked DRAM become an interesting alternative applications. In paper, we examine power/performance benefits three different scenarios. Our high-level Through Silicon Via (TSV) models have...

10.5555/1874620.1874847 article EN 2009-04-20

3D-TSV technologies promise increased system integration at lower cost and reduced footprint. One of the most likely applications 3D technology is DRAM-on-logic. Thermal management issues are considered one potentially showstoppers for 3D-integration. In this paper, we present a thermal experimental modeling characterization packaged DRAM on logic stack. The die stacked to thinned (25μm) using CuSn microbumps. For dedicated chip with integrated heaters sensors used. impact hot spot...

10.1109/ectc.2012.6248970 article EN 2012-05-01

10.3406/bsef.1897.22076 article FR Bulletin de la Société entomologique de France 1897-01-01

The power density in high performance systems continues to rise with every process technology generation, thereby increasing the operating temperature and creating 'hot spots' on die. As a result, performance, reliability consumption of system degrade. To avoid these spots', 'temperature-aware' design has become must. For low-power embedded though, it is not clear whether similar thermal problems occur. These have very different characteristics from ones: e.g., they consume 100 times less...

10.1504/ijes.2007.016032 article EN International Journal of Embedded Systems 2007-01-01

This paper presents a high-frequency modeling method of direct current motor armatures dedicated to low-voltage automotive applications. The proposed model is based on behavioral approach, which permits reproduce impedance measurements. It takes into account some physical features and phenomena related the armature. influence skin effect in windings, magnetic field penetration core, armature manufacturing systematic error evolution considered with this model. was first developed from that...

10.1109/temc.2010.2057430 article EN IEEE Transactions on Electromagnetic Compatibility 2010-11-01

3D stacking of dies is a promising technique to allow miniaturization and performance enhancement electronic systems. The complexity the interconnection structures, combined with reduced thermal spreading in thinned poorly thermally conductive adhesives complicate behavior stacked die structure. same dissipation will lead higher temperatures more pronounced temperature peak package compared single package. Therefore, 3D-IC needs be studied thoroughly. In this paper, steady state transient...

10.1109/stherm.2011.5767190 article EN 2011-03-01

Silicon substrates can be strategically isolated or unified among tiers in a through-silicon-via (TSV)-based 3-D integrated circuit (IC) structure, for the suppression of intertier substrate noise coupling reduction grounding impedance silicon as whole, respectively. A two-tier IC demonstrator 130-nm CMOS technology was successfully tested and analyzed with respect to intra coupling. Each tier stack includes digital source circuits (NSs) monitors, embodies in-place measurements An equivalent...

10.1109/tcpmt.2014.2316150 article EN IEEE Transactions on Components Packaging and Manufacturing Technology 2014-04-29

Abstract The superiority of spaced over massed learning is an established fact in the formation long-term memories (LTM). Here we addressed cellular processes and temporal demands this phenomenon using a weak spatial object recognition (wSOR) training, which induces short-term (STM) but not LTM. We observed SOR-LTM promotion when two identical wSOR training sessions were by inter-trial interval (ITI) ranging from 15 min to 7 h, consistently with training. promoting effect was dependent on...

10.1038/s41598-019-57007-4 article EN cc-by Scientific Reports 2020-01-09

10.3406/bsef.1898.28606 article FR Bulletin de la Société entomologique de France 1898-01-01

Besides the stress around Cu TSV's, also induced by microbumps is a main contributor to transistor level stress. For complete and successful deployment of 3D IC all effects generating have be addressed. Therefore, this work quantifies its associated with their interaction underfill material in stacks using combined experimental theoretical approach. We report on generated backside affecting FETs through thinned silicon die thin caused stacking. find that FET current shifts reach over 40% due...

10.1109/3dic.2012.6262972 article EN 2012-01-01

10.3406/bsef.1904.23598 article FR Bulletin de la Société entomologique de France 1904-01-01
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