Falk Niefind

ORCID: 0000-0003-3455-1161
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About
Contact & Profiles
Research Areas
  • Graphene research and applications
  • Organic Electronics and Photovoltaics
  • Conducting polymers and applications
  • 2D Materials and Applications
  • Electron and X-Ray Spectroscopy Techniques
  • Force Microscopy Techniques and Applications
  • Surface and Thin Film Phenomena
  • Ga2O3 and related materials
  • Organic Light-Emitting Diodes Research
  • Quantum and electron transport phenomena
  • Thermal properties of materials
  • Advanced Electron Microscopy Techniques and Applications
  • Advanced Photocatalysis Techniques
  • Surface Chemistry and Catalysis
  • Porphyrin and Phthalocyanine Chemistry
  • Semiconductor materials and devices
  • Machine Learning in Materials Science
  • Photochemistry and Electron Transfer Studies
  • Polymer crystallization and properties

National Institute of Standards and Technology
2021-2024

University of Maryland, College Park
2022-2024

Leibniz Institute of Surface Engineering
2017-2022

Center for Nanoscale Science and Technology
2021-2022

National Institute of Standards
2022

Philipps University of Marburg
2020

Photoemission electron microscopy in combination with polarized laser light is presented as a tool permitting direct imaging of polymer‐chain orientation and local degree order semicrystalline samples semiconducting polymers, promising class materials for future electronics. The key advantages this are its nondestructive fast measurements, straightforward data analysis, the low complexity sample preparation, possibility performing measurements on broad variety technologically relevant...

10.1002/adma.201701012 article EN Advanced Materials 2017-05-17

Abstract Intercalation forms heterostructures, and over 25 elements compounds are intercalated into graphene, but the mechanism for this process is not well understood. Here, de‐intercalation of 2D Ag Ga metals sandwiched between bilayer graphene SiC followed using photoemission electron microscopy (PEEM) atomistic‐scale reactive molecular dynamics simulations. By PEEM, “windows” (or defects) observed in both systems, processes follow distinctly different dynamics. Reversible de‐...

10.1002/smll.202306554 article EN publisher-specific-oa Small 2023-11-02

Only rigorous understanding of the relationship between nanoscale morphology organic thin films and performance devices built from them will ultimately lead to design rules that can guide a structured development on field electronics. Despite great effort, unraveling structure is still challenge in itself. Here we demonstrate photoemission electron microscopy provide valuable insights into chain orientation, domains size grain boundary characteristics P3HT spun cast different solvents at...

10.1039/c9na00419j article EN cc-by-nc Nanoscale Advances 2019-01-01

Corroles on metal surfaces show substantial reactivity and aromaticity-driven interfacial electron transfer of their transient σ/π-radicals. These effects are much more pronounced than for the closely related porphyrins, as has been demonstrated by using an octaalkylcorrole (2,3,8,12,17,18-hexaethyl-7,13-dimethylcorrole, 3H-HEDMC) its singly N–H dehydrogenated product 2H-HEDMC a Ag(111) surface through combination experimental theoretical methods. 3H-HEDMC assumes nonplanar adsorption...

10.1021/acs.jpcc.0c04451 article EN The Journal of Physical Chemistry C 2020-05-22

Analyzing and interpreting the nanoscale morphology of semiconducting polymers is one key challenges for advancing in organic electronics. The orientation persistence length (OPL) as a tool to analyze maps generated by photoemission electron microscopy (PEEM) - state art imaging/spectroscopy presented here. OPL way quantify chain within polymer film single graph. In this regard, it convincing method that will enable additional direct correlations between electrical or optical parameters....

10.1039/c9cp02944c article EN Physical Chemistry Chemical Physics 2019-01-01

A photoemission electron microscope (PEEM) was recently commissioned at the NIST. To benchmark its capabilities, epitaxial graphene on 4H-SiC (0001) imaged and analyzed in PEEM compared to other complementary imaging techniques. We determine our routine spatial resolution be about 50 nm. Using well-known electronic structure of as a reference, we outline procedure calibrate instrument energy momenta micrometer-angle-resolved spectroscopy (μ-ARPES). also 300 meV, 0.08 Å−1 (ky), 0.2 (kx),...

10.1063/5.0076145 article EN Journal of Applied Physics 2022-01-03

The nanoscale morphology of bulk heterojunctions is highly important for the charge dissociation and transport in organic solar cells ultimately defines performance cell. visualization this nano-morphology terms domain size polymer orientation a fast straightforward way therefore great interest to evaluate suitability film efficient cells. Here, we demonstrate that different blends poly(3-hexylthiophene-2,5-diyl) (P3HT) phenyl-C61-butyric acid methyl ester (PCBM) can be imaged analyzed by...

10.1016/j.polymertesting.2022.107791 article EN cc-by-nc-nd Polymer Testing 2022-09-14

Journal Article Imaging the Electronic Structure of Strained Epitaxial Monolayer Graphene Get access Falk Niefind, Niefind Nanoscale Device and Characterization Division, National Institute Standards Technology, Gaithersburg, MD, United StatesDepartment Chemistry Biochemistry, University Maryland, College Park, States Search for other works by this author on: Oxford Academic Google Scholar Henry G Bell, Bell Physics, Macalester College, Saint Paul, MN, Thuc Mai, Mai Quantum Measurement...

10.1017/s1431927622003488 article EN Microscopy and Microanalysis 2022-07-22

Photoemission (PES) has been an essential metrology in the field of materials physics for over 30 years. The electronic band structure a solid is fundamental property which defines how material will be used and integrated into device form. Topographic features defects can impact structure, therefore influence extrinsic properties when Developing that sensitive to at these length scales desired. Here, we apply lab-based photoemission electron microscopy (PEEM) gain insight key – function...

10.1149/ma2022-02341253mtgabs article EN Meeting abstracts/Meeting abstracts (Electrochemical Society. CD-ROM) 2022-10-09

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10.1017/s143192762100266x article EN Microscopy and Microanalysis 2021-07-30
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