A5052548142- X-ray Spectroscopy and Fluorescence Analysis
- Electron and X-Ray Spectroscopy Techniques
- Advanced Electron Microscopy Techniques and Applications
- Advanced Materials Characterization Techniques
- Advanced X-ray Imaging Techniques
- Ion-surface interactions and analysis
- Crystallography and Radiation Phenomena
- Optical Coatings and Gratings
- Photocathodes and Microchannel Plates
- Anodic Oxide Films and Nanostructures
- Nuclear Physics and Applications
- Diamond and Carbon-based Materials Research
- Metal and Thin Film Mechanics
- Atomic and Molecular Physics
- Rare-earth and actinide compounds
- High-pressure geophysics and materials
- Advancements in Photolithography Techniques
- Particle Accelerators and Free-Electron Lasers
- Semiconductor materials and interfaces
- Diatoms and Algae Research
- Photorefractive and Nonlinear Optics
- Green IT and Sustainability
- thermodynamics and calorimetric analyses
- Geophysical and Geoelectrical Methods
- Magnesium Alloys: Properties and Applications
Osaka Metropolitan University
2024
JEOL (Japan)
2014-2024
National Institute of Technology, Nara College
2003
A new grating (JS50XL) for ultrasoft-X-ray spectroscopy in an energy range 50–200 eV was designed, manufactured and tested. spectrometer composed of the a multi-channel plate detector constructed. At low-energy end this spectrometer, sharp Fermi edge Mg-L emission observed at 49.5 with resolution 0.15 eV. Li-K spectra were obtained from metal-Li, surface-oxidized metal-Li 5% Li–Al. Relative shifts Al-L Al, AlN MgAl2O4 explained by core binding energies (chemical shift) bandgap those...
Electron-beam-induced soft-X-ray emission spectroscopy (SXES) that uses a grating spectrometer has been introduced to conventional scanning electron microscope (SEM) for characterizing desired specimen areas of bulk materials. The was designed as grazing incidence flat-field optics by using aberration corrected (varied line spacing) gratings and multichannel plate detector combined with charge-coupled device camera, which already applied transmission microscope. best resolution confirmed...
A newly developed wavelength-dispersive soft X-ray emission spectrometer (WD-SXES) with two kinds of gratings, JS50XL and JS200N, were installed on electron probe microanalysers (EPMA) scanning microscopes (SEM). The new detector covers the energy range from 50 to 210 eV an resolution better than 0.2 at Al-L Al metal. With this low high resolution, various lines K, L, M, N spectra lithium uranium could be observed chemical state analysis carried out. This WD-SXES has also a potential for...
A novel wavelength dispersive soft X-ray emission spectrometer (WD-SXES) has been developed. It covers nominally the energy range between 50 and 210 eV [1, 2]. One of characteristic features WD-SXES is parallel detection signal so that it can be used like a conventional spectrometer. other feature high resolution, which about 0.2 eV. This resolution comparable to one acquired with photoelectron spectroscopy or electron loss spectroscopy. enables us obtain various information chemical bonding...
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Laminar and blazed type holographic varied-line-spacing spherical gratings for use in a versatile soft x-ray flat-field spectrograph attached to an electron microscope are designed, fabricated, evaluated. The absolute diffraction efficiencies of laminar (or blazed) master replica at 86.00° incidence evaluated by synchrotron radiation show over 5% 8%) the 50-200 eV range with maxima 22% 26%-27%). Also resolving power laser produced plasma source is excess 700 energy near K emission spectrum...
A new multilayer-coated varied line-spaced grating, JS4000, was fabricated and tested for extending the upper limit of a grating X-ray spectrometer electron microscopy. This designed 2–3.8 keV at grazing incidence angle 1.35°. It revealed that this multilayer structure enables us to take soft-X-ray emission spectra continuously from 1.5 4.3 same optical setting. The full-width half maximum Te-Lα1,2 (3.8 keV) peak 27 eV. applied indium tin oxide particles clearly resolved Sn-Lα (3444 eV)...
Laminar-type spherical diffraction gratings overcoated with carbon-based materials were designed, fabricated, and evaluated for the purpose of enhancing analytical sensitivity flat-field spectrograph in a vacuum ultraviolet region 35–110 eV. As design benchmark numerical calculations, efficiency (DE) spectral flux, which are defined by product DE aperture correlate spectrograph, used. To simplify feasibility study on overcoating effects, we assumed laminar-type grating having constant 1/1000...
We have developed an objective soft x-ray flat-field spectrograph installed in electron microscopes (EMs). The has two attractive features. One is that it designed to cover a wide energy range of 50-4000 eV by using four varied-line-spacing holographic gratings (VLSHGs) optimized for 50–200 eV, 155–350 300–2200 and 2000–4000 eV. dedicated the respective ranges can be accommodated single spectrograph. This advantage comes from positions source points image planes are assumed as common...
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – 8, 2013.
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – 5, 2010.
Views Icon Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Twitter Facebook Reddit LinkedIn Tools Reprints and Permissions Cite Search Site Citation T. Imazono, M. Koike, Koeda, Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto, Terauchi, Takahashi, N. Handa, Murano; A multilayer grating with a novel layer structure for flat-field spectrograph attached to transmission electron microscopes in energy region of 2-4 keV. AIP Conf. Proc. 17 May 2012; 1437 (1):...
Abstract The method deriving the L self-absorption spectrum from Lα,β emission spectra obtained at different accelerating voltages has been optimized for analyzing chemical state of Fe in solid materials. are fitted using Pseudo-Voigt functions and normalized by integrated intensity each Ll line, which is not affected L2,3 absorption edge. calculated dividing profile collected low voltage that a higher voltage. referred to as soft X-ray structure (SX-SAS). This applied six Fe-based materials...
Views Icon Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Twitter Facebook Reddit LinkedIn Tools Reprints and Permissions Cite Search Site Citation Takashi Imazono, Masato Koike, Tetsuya Kawachi, Noboru Hasegawa, Masaru Koeda, Nagano, Hiroyuki Sasai, Yuki Oue, Zeno Yonezawa, Satoshi Kuramoto, Masami Terauchi, Hideyuki Takahashi, Nobuo Handa, Takanori Murano; Development of a soft x-ray diffractometer for wideband multilayer grating with novel layer...
Abstract This paper discusses the path to commercialization of a soft-X-ray emission spectrometer system for EPMA/SEM, its application, how it can be used investigate new materials, and offers an update on improvements being investigated further optimise performance. The ultimate energy resolution 0.08 eV at Al L- Fermi edge is shown with current optics using fine pixel detector. spectral mapping technique show chemical shift images by appropriate region-of-interest window. L-emissions 3d...
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
An abstract is not available for this content so a preview has been provided. As you have access to content, full PDF via the ‘Save PDF’ action button.
This study proposes a simple evaluation method for deriving L-absorption information from two L-emission spectra of 3d transition metal (TM) elements obtained at different accelerating voltages. realizes spatial identity X-ray emission and absorption spectroscopies. was evaluated the Fe its oxides applied to TM MnO, Co, CoO NiO. The derived peak positions were consistent with those previously synchrotron orbital radiation facilities, which considered core-hole effect. derivation could be...
A flat-field spectrograph equipped with a wide-band multilayer grating and prefocusing mirror covering 2–4 keV without any mechanical movement has been developed. To realize this, new structure consisting of W B4C layers invented, which enhances the diffraction efficiency over whole energy range at fixed angle incidence as well reflectivity mirror. The deposited on laminar-type varied-line-spacing holographic replica spherical substrate. varies between 1.2% 3.3% 88.65° in 2.1–4.0 range. Also...
Multilayer diffraction gratings are designed to improve the detection limit and sensitivity of soft x-ray flat-field spectrographs in region 300–1000 eV, placing emphasis on Fe-L (705 eV), Cu-L (930 Zn-L (1012 eV) emissions. For this purpose, spectral flux was used as performance index, which is proportional amount optical incident into a detector correlated with sensitivity. A super-mirror-type W/B4C multilayer coating [Koike et al., Rev.Sci. Instrum. 94, 045109 (2023)] employed efficiency...