Shogo Koshiya

ORCID: 0000-0002-8205-3389
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About
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Research Areas
  • X-ray Spectroscopy and Fluorescence Analysis
  • Electron and X-Ray Spectroscopy Techniques
  • Advanced Electron Microscopy Techniques and Applications
  • Advanced X-ray Imaging Techniques
  • Quasicrystal Structures and Properties
  • X-ray Diffraction in Crystallography
  • Ion-surface interactions and analysis
  • Force Microscopy Techniques and Applications
  • Crystallography and Radiation Phenomena
  • Advancements in Photolithography Techniques
  • Iron oxide chemistry and applications
  • Copper-based nanomaterials and applications
  • Quantum Dots Synthesis And Properties
  • Photocathodes and Microchannel Plates
  • Mineralogy and Gemology Studies
  • Optical Coatings and Gratings
  • Advanced Materials Characterization Techniques
  • Magnesium Oxide Properties and Applications
  • Advanced Fluorescence Microscopy Techniques
  • TiO2 Photocatalysis and Solar Cells
  • Aluminum Alloy Microstructure Properties
  • Archaeology and Rock Art Studies
  • Plasmonic and Surface Plasmon Research
  • High-pressure geophysics and materials
  • Photorefractive and Nonlinear Optics

JEOL (Japan)
2020-2024

National Institute for Materials Science
2015-2020

Tohoku University
2011-2014

Electron-beam-induced soft-X-ray emission spectroscopy (SXES) that uses a grating spectrometer has been introduced to conventional scanning electron microscope (SEM) for characterizing desired specimen areas of bulk materials. The was designed as grazing incidence flat-field optics by using aberration corrected (varied line spacing) gratings and multichannel plate detector combined with charge-coupled device camera, which already applied transmission microscope. best resolution confirmed...

10.1017/s1431927614000439 article EN Microscopy and Microanalysis 2014-03-14

Abstract Thin‐film photovoltaics (PV) have emerged as a technology that can meet the growing demands for efficient and low‐cost large‐scale cells. However, photoabsorbers currently in use contain expensive or toxic elements, difficulty bipolar doping, particularly device structure, requires elaborate optimization of heterostructures improving efficiency. This study shows doping with high hole electron mobilities copper nitride (Cu 3 N), composed solely earth‐abundant environmentally benign...

10.1002/adma.201801968 article EN Advanced Materials 2018-06-19

Optical properties of aqueous colloidal dispersions 2D electrolytes, if their aspect ratios are extra-large, can be determined by orientation preferences. Recently, we reported that a dispersion diamagnetic titanate(IV) nanosheets (TiIVNSs), when placed in magnetic field, is highly anisotropic because TiIVNS anomalously orients its plane orthogonal to the flux lines due large susceptibility. Herein, report serendipitous finding TiIVNSs situ photochemically reduced into paramagnetic species...

10.1021/jacs.8b09625 article EN Journal of the American Chemical Society 2018-11-16

We have investigated how accurately atomic-resolution annular dark-field (ADF) images match between experiments and simulations to conduct more reliable crystal structure analyses. Quantitative ADF imaging, in which the intensity at each pixel represents fraction of incident probe current, allows us perform direct comparisons with without use fitting parameters. Although conventional comparison suffers from experimental uncertainties such as an amorphous surface layer specimen thickness,...

10.1093/jmicro/dfv053 article EN cc-by-nc Microscopy 2015-09-07

A quantification procedure for annular dark-field (ADF) imaging, in which a quantitative contrast is given as scattering intensity normalized by an incident probe current, presented. The obtained ADF images are converted to using empirical equation, function of imaging system setting. fully implements the nonlinear response system, critical high-sensitivity observation. We applied observation graphene specimen with 1–4 layers. inner and outer angles detector, important parameters analyses,...

10.1093/jmicro/dfu115 article EN Microscopy 2015-01-30

Laminar-type spherical diffraction gratings overcoated with carbon-based materials were designed, fabricated, and evaluated for the purpose of enhancing analytical sensitivity flat-field spectrograph in a vacuum ultraviolet region 35–110 eV. As design benchmark numerical calculations, efficiency (DE) spectral flux, which are defined by product DE aperture correlate spectrograph, used. To simplify feasibility study on overcoating effects, we assumed laminar-type grating having constant 1/1000...

10.1063/5.0176783 article EN Review of Scientific Instruments 2023-12-01

The lateral distribution and coverage of Ru-based dye molecules, which are used for dye-sensitized solar cells (DSCs), were directly examined on a titania surface using high-resolution scanning transmission electron microscopy (STEM). clean free-standing nanosheet was first confirmed with atomic resolution, then, the as substrate. A single molecule visualized time. quantitative STEM images revealed an inhomogeneous dye-molecule at early stage its absorption, i.e., aggregation molecules....

10.1038/srep24616 article EN cc-by Scientific Reports 2016-04-18

In this study, electron irradiation effects on lithium peroxide (Li2O2), which is an important discharge product of Li–air (or Li–O2) batteries, were investigated using selected-area diffraction (SAED) and high-energy resolution energy-loss spectroscopy (EELS). The results obtained show that Li2O2 to Li2O transformation occurs with 80 300 keV incident electrons under high dose rates at 20 −183 °C. rate for was 1/5 the taking place We also present a series EELS spectra can be used as...

10.7567/jjap.57.035802 article EN Japanese Journal of Applied Physics 2018-02-13

Chemical bonding state of sodium borosilicide Na8B74.5Si17.5, which is a new member B12-cluster materials, investigated by soft X-ray emission spectroscopy. The material composed B12 cluster network and characteristic silicon chains [–Si–(Si–Si)3–Si–] connected sp3 bonding, in distances angles are close to those cubic Si crystal. B K-emission spectrum the showed similar but broader intensity distribution with materials α-r-B, B4C β-r-B. can be due variation B–B bond length cluster. density...

10.1093/jmicro/dfx132 article EN Microscopy 2018-01-23

Abstract The method deriving the L self-absorption spectrum from Lα,β emission spectra obtained at different accelerating voltages has been optimized for analyzing chemical state of Fe in solid materials. are fitted using Pseudo-Voigt functions and normalized by integrated intensity each Ll line, which is not affected L2,3 absorption edge. calculated dividing profile collected low voltage that a higher voltage. referred to as soft X-ray structure (SX-SAS). This applied six Fe-based materials...

10.1093/jmicro/dfac009 article EN cc-by-nc Microscopy 2022-02-17

Abstract Chemical shifts of all constituent atoms for amorphous (Am), quasicrystalline (QC) and crystalline (Cryst) alloys Al53Si27Mn20 were investigated the first time by high energy-resolution electron energy-loss spectroscopy (EELS) soft-X-ray emission (SXES). Among Al L-shell excitation EELS spectra Am, QC Cryst alloys, only alloy showed an apparent chemical shift to larger binding energy side 0.4 eV. In Al-Kα Si-Kα SXES these a 4 eV 6 Si-Kα. These values are comparable those...

10.1080/14786435.2011.552450 article EN The Philosophical Magazine A Journal of Theoretical Experimental and Applied Physics 2011-02-18

Chemical shifts of the constituent atoms primitive icosahedral quasicrystal (P-QC), face-centred (F-QC) and 1/1-approximant (1/1-AP) F-QC Zn–Mg–Zr alloys were investigated for first time using high energy-resolution electron energy-loss spectroscopy (EELS) soft-X-ray emission (SXES). Among Zn M-shell Mg L-shell excitation EELS spectra P-QC, 1/1-AP alloys, only quasicrystalline showed a chemical shift towards larger binding energy side. In Zn-L Zr-L SXES spectra, P-QC The magnitudes in almost...

10.1080/14786435.2013.765994 article EN The Philosophical Magazine A Journal of Theoretical Experimental and Applied Physics 2013-01-31

Ti L-emission lines of metal-Ti and its oxides are measured by using a soft-X-ray emission spectrometer attached to scanning electron microscope. Lα,β emissions due transitions from valence 3d states core 2p levels show variety intensity distributions for with different crystal structures reflecting bonding states. Lℓ,η-emissions 3s level simple distribution. The energy shift Lℓ,η-emission peak should reflect relaxation in the final state hole 3 s level. information spectrum is discussed...

10.1088/1757-899x/304/1/012018 article EN IOP Conference Series Materials Science and Engineering 2018-01-01

AbstractChemical shifts of approximant crystals 1/0-Al12Re (1/0-metallic), 1/1-Al73Re15Si12 (1/1-metallic) and 1/1-Al73Re17Si10 (1/1-non-metallic) were examined by using electron energy-loss spectroscopy (EELS) soft-X-ray emission (SXES). Al L-shell excitation EELS spectra these alloys showed an apparent chemical shift only for the 1/1-non-metallic alloy to larger binding energy side 0.2 eV. Al-Kα, Re-Mα Si-Kα SXES also a alloy. 1/0-metallic 1/1-metallic did not show any in experiments....

10.1080/14786435.2014.894648 article EN The Philosophical Magazine A Journal of Theoretical Experimental and Applied Physics 2014-04-14

Multilayer diffraction gratings are designed to improve the detection limit and sensitivity of soft x-ray flat-field spectrographs in region 300–1000 eV, placing emphasis on Fe-L (705 eV), Cu-L (930 Zn-L (1012 eV) emissions. For this purpose, spectral flux was used as performance index, which is proportional amount optical incident into a detector correlated with sensitivity. A super-mirror-type W/B4C multilayer coating [Koike et al., Rev.Sci. Instrum. 94, 045109 (2023)] employed efficiency...

10.1063/5.0210722 article EN Review of Scientific Instruments 2024-07-01

An objective soft x-ray flat-field spectrograph employing a laminar-type bilayer coated, varied-line-spacing, spherical grating was designed to improve the detection limit and sensitivity of spectrographs in region 250–550 eV. As design criterion, spectral flux, SF, [Hatano et al., Appl. Opt. 60, 4993–4999 (2021)], which is proportional amount optical flux incident onto detector correlated with sensitivity, used be maximized. To enhance reflectivity coating design, Au/Ni investigated...

10.1063/5.0232922 article EN Review of Scientific Instruments 2024-12-01

The amounts of decreased charge at Al sites Al-based (Al–Pd–Cr–Fe, Al–Si–Mn, and Al–Re–Si) Zn Zn-based (Zn–Mg–Zr) quasicrystals approximant crystals were estimated. evaluation was done by comparisons between chemical shifts experimentally observed soft-X-ray emission spectroscopy the amount valence obtained Bader analysis for first principle calculations reference materials (Al, α-Al2O3, Zn, ZnO). Decreased charges evaluated to be 1.0–2.5 e–/atom 1.1–1.2 e–/atom, respectively. A covalent...

10.1080/14786435.2015.1033486 article EN The Philosophical Magazine A Journal of Theoretical Experimental and Applied Physics 2015-04-20

A quantification procedure for annular dark-field (ADF) imaging, in which a quantitative contrast is given as scattering intensity normalized by an incident probe current, presented. The obtained ADF images are converted to using empirical equation, function of imaging system setting. fully implements the nonlinear response system, critical high-sensitivity observation. We applied observation graphene specimen with 1-4 layers. inner and outer angles detector, important parameters analyses,...

10.1017/s1431927615006856 article EN Microscopy and Microanalysis 2015-08-01

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – 8, 2013.

10.1017/s1431927613008386 article EN Microscopy and Microanalysis 2013-08-01

Journal Article Experimental Study of SXES: Determination Iron Oxidation State in Silicate Minerals Get access Takaomi Yokoyama, Yokoyama JEOL Ltd., Akishima, Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar Shogo Koshiya, Koshiya Kenichi Tsutsumi, Tsutsumi Terumi Ejima, Ejima Shinshu University, Matsumoto, Nagano, Yoshiaki Kon National Institute Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Microscopy Microanalysis, Volume 26,...

10.1017/s1431927620016682 article EN Microscopy and Microanalysis 2020-07-30
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