Wijden Khelifi

ORCID: 0009-0008-5890-2193
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About
Contact & Profiles
Research Areas
  • Nanowire Synthesis and Applications
  • Semiconductor Quantum Structures and Devices
  • Advanced Semiconductor Detectors and Materials
  • Advancements in Semiconductor Devices and Circuit Design
  • Thin-Film Transistor Technologies
  • Quantum Dots Synthesis And Properties
  • Chalcogenide Semiconductor Thin Films
  • Semiconductor Lasers and Optical Devices
  • Silicon Nanostructures and Photoluminescence
  • Surface and Thin Film Phenomena
  • GaN-based semiconductor devices and materials

Institut d'électronique de microélectronique et de nanotechnologie
2022-2025

Centre National de la Recherche Scientifique
2022-2024

École Centrale de Lille
2022-2024

Université de Lille
2022-2024

Université Polytechnique Hauts-de-France
2022-2024

Research and Technology Center of Energy
2024

Abstract InSb is a material of choice for infrared as well spintronic devices but its integration on large lattice mismatched semi-insulating III–V substrates has so far altered exceptional properties. Here, we investigate the direct growth InP(111) B with molecular beam epitaxy. Despite lack thick metamorphic buffer layer accommodation, show that quasi-continuous thin films can be grown using very high Sb/In flux ratio. The quality further studied Hall measurements large-scale to assess...

10.1088/1361-6528/adaafb article EN Nanotechnology 2025-01-16

The nanoscale intrinsic electrical properties of in-plane InAs nanowires grown by selective area epitaxy are investigated using a process-free method involving multi-probe scanning tunneling microscope. resistance oxide-free on an InP(111)Bsubstrate and the InAs/GaSb core-shell InP(001) substrate measured collinear four-point probe arrangement in ultrahigh vacuum. They compared with two-dimensional electron gas reference samples same Van der Pauw geometry for validation. A significant...

10.1088/1361-6528/acc810 article EN Nanotechnology 2023-03-28

Raman spectroscopy is well-suited for the characterization of semiconductor materials. However, due weakness signal, studies thin layers in complex environments, such as ultrahigh vacuum, are rather scarce. Here, we have designed a apparatus based on use fiber optic probe, with lens collecting backscattered light directly inserted vacuum. The solution has been tested preparation III-V surfaces, which requires recovery their atomic reconstruction. surfaces were either protected As amorphous...

10.1063/5.0152031 article EN Review of Scientific Instruments 2023-12-01
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