Chen Gong

ORCID: 0009-0008-8864-8106
Publications
Citations
Views
---
Saved
---
About
Contact & Profiles
Research Areas
  • Medical Imaging Techniques and Applications
  • Advanced X-ray and CT Imaging
  • Mechanical Engineering and Vibrations Research
  • Gear and Bearing Dynamics Analysis
  • Advanced X-ray Imaging Techniques
  • Image Processing Techniques and Applications
  • Hydraulic and Pneumatic Systems
  • Digital Radiography and Breast Imaging
  • Embedded Systems and FPGA Design
  • Electric and Hybrid Vehicle Technologies
  • Optical Systems and Laser Technology
  • Robotic Mechanisms and Dynamics
  • Advancements in Photolithography Techniques
  • Advanced optical system design
  • Manufacturing Process and Optimization
  • Power Systems and Renewable Energy
  • Optical Coatings and Gratings
  • Wireless Sensor Networks and IoT
  • Induction Heating and Inverter Technology
  • Industrial Vision Systems and Defect Detection
  • Advanced DC-DC Converters
  • Advanced Sensor and Control Systems
  • Semiconductor Lasers and Optical Devices
  • Advanced Measurement and Detection Methods

China University of Geosciences
2021-2023

Institute of Electrical Engineering
2020

Southeast University
2011-2015

Jiangsu Provincial Hospital of Traditional Chinese Medicine
2009-2010

South China University of Technology
2005

Planetary gear trains (PGT) with the aim of achieving multiple speed ratios are widely used in automatic transmission (AT). A fast configuration analysis method is significance for improving efficiency AT design, and it essential to study AT. For this purpose, represented by a matrix model, which includes structural PGT shifting elements (SEs) matrix. Based on proposed representation, relation torque matrices automatically derived analyze kinematics dynamics. Five performance indexes...

10.1177/09544070231207163 article EN Proceedings of the Institution of Mechanical Engineers Part D Journal of Automobile Engineering 2023-12-04

Electrical lighting design is usually based on the illumination design. Its main task to ensure that electricity and optical system can be normal, safe, reliable, economically viable. In this paper, we propose a optimization method for outdoor systems generate relatively powerful light beams far distances. The are highly integrated LED modules instead of high intensity discharge lamps. size light-emitting surface 2.5mm×2.1mm, secondary elements composed basic plano-convex lens Fresnel lens....

10.1364/ao.401846 article EN Applied Optics 2020-08-27

This article introduces an intelligent blind rod and navigation platform based on ZigBee technology. can detect analyze the situation road warn to avoid obstacles by ultrasonic measurement. The technology help know different directions path leads to. better serve for blind's independent travel.

10.1109/icebeg.2011.5882307 article EN 2011-05-01

Computer tomography (CT) image geometric artifacts are a kind of the pseudo-image not existing in detected object, which could result serious degradation quality. Geometric imported by discrepancies between structure cone-beam CT and ideal reconstruction algorithm. Analyzing FDK algorithm, there seven parameters that describe irregular structure. These can be calculated calibration phantom's projections, using related methods. And implemented two ways: interpolation modification original...

10.1109/cisp.2010.5647243 article EN 2010 3rd International Congress on Image and Signal Processing 2010-10-01

This paper is about geometric calibration of the high resolution CT (Computed Tomography) system. Geometric refers to estimation a set parameters that describe geometry Such are so important little error them will degrade reconstruction images seriously, more accurate needed in higher-resolution systems. But conventional methods not enough for current system whose can reach sub-micrometer or even tens nanometers. In this paper, we propose new method which has higher accuracy and it based on...

10.1117/12.2081707 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2015-03-18

To minimize potential wafer yield loss due to mask defects, most fabs implement some form of reticle inspection system monitor photomask quality in high-volume manufacturing environments. Traditionally, experienced operators review defects found by an tool and then manually classify each defect as 'pass, warn, or fail' based on its size location. However, the event are suspected causing repeating a completed wafer, all associated reticles must be searched layer-by-layer basis effort identify...

10.1117/12.815545 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2009-03-13
Coming Soon ...