M. Jergel

ORCID: 0000-0002-4482-7881
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About
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Research Areas
  • Physics of Superconductivity and Magnetism
  • Superconducting Materials and Applications
  • Semiconductor materials and devices
  • Magnetic properties of thin films
  • Thin-Film Transistor Technologies
  • Silicon Nanostructures and Photoluminescence
  • Semiconductor materials and interfaces
  • Metal and Thin Film Mechanics
  • Particle accelerators and beam dynamics
  • Superconductivity in MgB2 and Alloys
  • Ion-surface interactions and analysis
  • Gold and Silver Nanoparticles Synthesis and Applications
  • Gas Sensing Nanomaterials and Sensors
  • ZnO doping and properties
  • Copper Interconnects and Reliability
  • Quantum Dots Synthesis And Properties
  • Advanced Surface Polishing Techniques
  • Silicon and Solar Cell Technologies
  • Perovskite Materials and Applications
  • Surface Roughness and Optical Measurements
  • Metallic Glasses and Amorphous Alloys
  • Surface and Thin Film Phenomena
  • X-ray Spectroscopy and Fluorescence Analysis
  • Advanced X-ray Imaging Techniques
  • 2D Materials and Applications

Slovak Academy of Sciences
2016-2025

Institute of Chemistry of the Slovak Academy of Sciences
2015-2024

Institute of Physics of the Slovak Academy of Sciences
2015-2024

Centre for Advanced Material Application of the Slovak Academy of Sciences
2020-2024

University Hospital Bratislava
2019-2020

Comenius University Bratislava
2019-2020

Institute of Materials and Machine Mechanics of the Slovak Academy of Sciences
2015-2020

Czech Academy of Sciences, Institute of Physics
2002-2017

Polymer Institute of the Slovak Academy of Sciences
2012

Centre National de la Recherche Scientifique
1996-2012

We report on a reference‐free Raman spectroscopy method for precise thickness determination of the multilayered graphene oxide flakes. The is based normalization total integral intensity D and G bands to second‐order optical phonon peak silicon substrate in spectrum. provides discrete ratio values corresponding number layers respective flakes with linearly increasing layers. This fast robust terms layer up high values. A comparison conventional spectrally resolved reflectivity mapping shows...

10.1002/jrs.4843 article EN Journal of Raman Spectroscopy 2015-11-26

Graphene oxide is a complex material whose synthesis still incompletely understood. To study the time evolution of structural and chemical properties oxidized graphite, samples at different temporal stages oxidation were selected characterized through number techniques: X-ray photoelectron spectroscopy for content bonding oxygen, diffraction level intercalation, Raman detection changes, electrical resistivity measurements probing charge localization on macroscopic scale, scanning...

10.1021/acs.jpcc.7b10912 article EN The Journal of Physical Chemistry C 2017-12-14

Lead-halide perovskites have established a firm foothold in photovoltaics and optoelectronics due to their steadily increasing power conversion efficiencies approaching conventional inorganic single-crystal semiconductors. However, further performance improvement requires reducing defect-assisted, nonradiative recombination of charge carriers the perovskite layers. A deeper understanding formation associated process control is prerequisite for effective defect reduction. In this study, we...

10.1021/acs.jpclett.1c02869 article EN The Journal of Physical Chemistry Letters 2021-10-12

We study surface kinetic roughening of TiN films grown on Si(100) substrates by dc reactive sputtering. The morphology deposited for different growth times under the same experimental conditions were analyzed atomic force microscopy. exhibit intrinsic anomalous scaling and multiscaling. film is characterized a set local exponent values ${\ensuremath{\alpha}}_{\mathrm{loc}}=1.0$ ${\ensuremath{\beta}}_{\mathrm{loc}}=0.39$, global $\ensuremath{\alpha}=1.7$ $\ensuremath{\beta}=0.67$, with...

10.1103/physrevb.73.045436 article EN Physical Review B 2006-01-31

10.1016/0017-9310(71)90030-5 article EN International Journal of Heat and Mass Transfer 1971-12-01

The surface-enhanced Raman scattering (SERS) properties of low-dimensional semiconducting MXene nanoflakes have been investigated over the last decade. Despite this fact, relationship between surface characteristics and SERSing performance a layer has yet to be comprehensively elucidated. This work shows importance morphology on overall SERS effect by studying few-layer Ti3C2Tx MXene-based substrates fabricated vacuum-assisted filtration (VAF) spray coating filter paper. VAF deposition...

10.3390/ma17061385 article EN Materials 2024-03-18

We have reviewed the convenience and possibility of utilizing thallium-based superconductors for power applications. Some basic properties Tl-based systems such as crystal structure, phase stability, weak-links, pinning problems irreversibility lines are discussed first. Two approaches to conductor preparation then described, closed open one. Special attention is focused on fabrication Tl-1223 Tl-2223 superconductors. In case more successful approach a two-step technological procedure...

10.1088/0953-2048/9/6/001 article EN Superconductor Science and Technology 1996-06-01

In the following survey a rather promising, simple, non-vacuum method of preparation high-Tc (HTc) superconducting films synthesized by means chemical deposition from an aerosol is described. Thin HTc YBCO, BSCCO and TBCCO systems were prepared this method. Some details process as well technique are given. Properties presented. The best films, suitable eventually for high-temperature, high-current high-field applications, so far polycrystalline 1223 system on YSZ substrates having Tc=104-107...

10.1088/0953-2048/8/2/001 article EN Superconductor Science and Technology 1995-02-01

X-ray reflectometry (XRR) is a well established technique to evaluate quantitatively electron density, thickness and roughness of thin layers. In this paper, results the first world-wide XRR round-robin experiment, involving 20 laboratories, are presented discussed. The experiment was performed within framework VAMAS Project `X-ray reflectivity measurements for evaluation films multilayers', aim which produce `good practice' manual XRR. reproducibility obtained using different equipment has...

10.1107/s0021889807051904 article EN Journal of Applied Crystallography 2008-01-16

We report on an in-situ observation of the colloidal silver nanoparticle self-assembly into a close-packed monolayer at air/water interface followed by 2D to 3D transition. Using fast tracking GISAXS technique, we were able observe immediate response compression self-assembled layer and identify all relevant intermediate stages including those far from equilibrium. In particular, new nonequilibrium phase before collapse via transition was found that is inaccessible competing direct space...

10.1021/la301764t article EN Langmuir 2012-06-23

An in situ small-angle x-ray scattering study of the nanoparticle displacement a self-assembled monolayer as function supporting membrane strain is presented. The average spacing 6.7 nm unstrained state and increases applied force direction, following linearly which reaches maximum value 11%. experimental results suggest continuous mutual shift nanoparticles their gradual separation with growing stress rather than islands formation. No measurable was observed direction perpendicular to stress.

10.1088/0957-4484/21/38/385702 article EN Nanotechnology 2010-08-26

The ordered nanoparticle monolayers and multilayers over macroscopic areas were prepared by the modified Langmuir-Blodgett method. Using this approach, monolayer is formed on water surface compression subsequently it transferred onto substrate a controlled removal of subphase. ordering homogeneity mono- was studied scanning electron microscope (SEM), grazing-incidence small-angle X-ray scattering (GISAXS) reflectivity (XRR) techniques. From results follows that an large area. For multilayer,...

10.2478/v10048-010-0028-0 article EN cc-by-nc-nd Measurement Science Review 2010-01-01

At present, the power conversion efficiency of single-junction perovskite-based solar cells reaches over 26%. The further increase optoelectronic devices is limited mainly by defects, causing nonradiative recombination charge carriers. To improve and ensure reproducible fabrication high-quality layers, it crucial to understand perovskite nucleation growth mechanism along with associated process control reduce defect density. In this study, we investigate kinetics a promising narrow bandgap...

10.1021/acsami.4c04095 article EN ACS Applied Materials & Interfaces 2024-06-27

<title>Abstract</title> Emergence of novel catalytic, electrochemical and biomedical applications nanomaterials necessitates an understanding the structural basis their stimuli-responsive performance. Chemistry polyoxometallic with variety interesting properties is still poorly explored. In this study, microwave-assisted non-aqueous sol-gel synthesis was used for first time to prepare nanoparticles based on polyoxomolybdates. Their optoelectronic focus laser-triggered photothermal response...

10.21203/rs.3.rs-6675081/v1 preprint EN Research Square (Research Square) 2025-06-02

Cobalt thin films of 50 nm nominal thickness were e-beam evaporated on silicon substrates covered with thermal oxide. Two series independent and cumulative vacuum annealings up to 600 ◦ C 650 C, respectively, performed. The x-ray diffraction, specular non-specular reflectivity longitudinal magneto-optical Kerr effect measurements applied probe the annealing behaviour film structure magnetic properties. A gradual transition from hexagonal close-packed (hcp) face-centred cubic (fcc) was...

10.1088/0022-3727/42/13/135406 article EN Journal of Physics D Applied Physics 2009-06-16

We report on a study of thickness effect the formation structural defect-related density states (DOS) in band gap poly(3-hexylthiophene-2,5-diyl) (P3HT) thin films spincoated ITO substrates. The energy-resolved electrochemical impedance spectroscopy and grazing-incidence wide-angle X-ray scattering were used to correlate DOS with degree crystallinity P3HT films. found an exponential increase defect increasing fraction amorphous phase when decreasing film thickness. exponent increases...

10.1021/acs.jpcc.7b11651 article EN The Journal of Physical Chemistry C 2018-03-02

Few-layer MoS2 films stay at the forefront of current research two-dimensional materials. At present, continuous are prepared by chemical vapor deposition (CVD) techniques. Herein, we present a cost-effective fabrication large-area spatially uniform few-layer flakes using modified Langmuir-Schaefer technique. The compression liquid-phase exfoliated on water subphase was used to form layer, which subsequently transferred onto submerged substrate removing subphase. After vacuum annealing,...

10.1021/acs.langmuir.9b01000 article EN Langmuir 2019-07-08

Abstract 2D hybrid organic–inorganic perovskites are valued in optoelectronic applications for their tunable bandgap and excellent moisture irradiation stability. These properties stem from both the chemical composition crystallinity of layer formed. Defects lattice, impurities, crystal grain boundaries generally introduce trap states surface energy pinning, limiting ultimate performance perovskite; hence, an in‐depth understanding crystallization process is indispensable. Here, a kinetic...

10.1002/adfm.202009007 article EN Advanced Functional Materials 2021-01-20

A perovskite solar cell (PSC) featuring a mesoporous architecture can facilitate layer formation over large area via increasing the number of heterogeneous nucleation sites. The morphology electron transport (ETL) and its interface with is one key factors to boost performance PSC. Tin dioxide (SnO2) considered as promising ETL in PSCs owing high carrier mobility, good transmittance, deep conduction band level, efficient photoelectron extraction. Generally, SnO2 (m-SnO2) has higher...

10.1021/acsanm.2c00840 article EN ACS Applied Nano Materials 2022-05-24
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