Emmanuel R Ollotu

ORCID: 0000-0002-8341-596X
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About
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Research Areas
  • Chalcogenide Semiconductor Thin Films
  • ZnO doping and properties
  • Quantum Dots Synthesis And Properties
  • Copper-based nanomaterials and applications
  • Transition Metal Oxide Nanomaterials
  • Advanced Semiconductor Detectors and Materials
  • Thin-Film Transistor Technologies
  • Gas Sensing Nanomaterials and Sensors

This study investigated the impact of Ag layer thickness on properties rapid thermal annealed Ag/ITO bilayer films, aimed at addressing conductivity loss in ITO substrates used as a back contact for optoelectronic applications, such bifacial CZTS solar cells. layers varying (10 nm, 20 30 and 40 nm) were sputter-deposited onto commercially acquired ITO-coated glass substrate rapidly thermally annealed. The samples’ characterization was performed using AFM, XRD, four-point probe, Hall Effect...

10.4314/tjs.v50i4.14 article EN Tanzania Journal of Science 2024-11-30

This work investigated the potential to achieve zinc oxide (ZnO) films for Cu2ZnSnS4 (CZTS) solar cells window layer at controlled annealing conditions as a approach address elemental inter-diffusion in CZTS cells. involved rapid thermal (RTA) of room-temperature oxygenated DC sputtered thin an ambient nitrogen gas different temperatures. Structural, morphological, optical, and electrical properties these were determined by X-ray diffractometer, Scanning Electron Microscopy,...

10.4314/tjs.v47i2.19 article EN Tanzania Journal of Science 2021-05-19
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