- Radiation Effects in Electronics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- VLSI and Analog Circuit Testing
- Low-power high-performance VLSI design
- Structural Health Monitoring Techniques
- Computational Geometry and Mesh Generation
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Algorithms and Applications
- Industrial Technology and Control Systems
- Advanced Sensor and Control Systems
- Metallurgy and Material Forming
- Manufacturing Process and Optimization
- Aeroelasticity and Vibration Control
- Advanced SAR Imaging Techniques
- Advanced Memory and Neural Computing
- Advanced Computational Techniques and Applications
- Computer Graphics and Visualization Techniques
- Advancements in PLL and VCO Technologies
- Vibration and Dynamic Analysis
- Radar Systems and Signal Processing
- Higher Education and Teaching Methods
- Metal Forming Simulation Techniques
- Microstructure and Mechanical Properties of Steels
- Topology Optimization in Engineering
National University of Defense Technology
2015-2024
Lanzhou University
2024
Northeast Petroleum University
2023
Zhejiang University
2007-2022
East China University of Science and Technology
2006-2021
Beijing Institute of Technology
2019-2021
Shanxi Coal Transportation and Sales Group (China)
2020-2021
Institute of Engineering
2021
Sun Yat-sen University
2021
Hunan University
2020
Using two mutually coupled semiconductor lasers (MC-SLs) outputs as chaotic entropy sources, a scheme for generating Tbits/s ultra-fast physical random bit (PRB) is demonstrated and analyzed experimentally. Firstly, sources originating from of MC-SLs are obtained in parallel. Secondly, by adopting multiple optimized post-processing methods, PRB streams with the generation rate 0.56 extracted their randomness verified using NIST Special Publication 800-22 statistical tests. Through merging...
In this paper, a novel layout technique for single-event transient (SET) mitigation based on dummy transistors is proposed. Numerical simulations using technology computer-aided design with 90-nm twin-well CMOS show that the proposed can efficiently reduce SET pulsewidths. This methodology thoroughly discussed case of inverter cell, and discussion then extended to other logic cells. We also compare "guard ring" (for P-hit mitigation) drain" N-hit techniques, we find not only does provide...
In this paper, a layout technique for P-hit single-event transient (SET) mitigation via source isolation is studied by way of technology-computer-aided-design numerical simulations. The source-isolation design methodology thoroughly discussed the combinational standard cell. Based on 90-nm twin-well CMOS technology, simulation results indicate that proposed “radiation hardened design” (RHBD) can significantly reduce SET pulsewidth. effects ion strike angles and locations are also studied,...
Wind power penetration has increased rapidly in recent years. In winter, the wind turbine blade imbalance fault caused by ice accretion increase maintenance costs of farms. It is necessary to detect before breakage occurs. Preliminary analysis time series simulation data shows that it difficult faults traditional mathematical methods, as there little difference between normal and conditions. A deep learning method for detection classification proposed this paper. long short-term memory...
China has longest mileage of high speed railway in the world, and been one main traffic travel choices Chinese people. This paper analyzes relationship among service quality, customer satisfaction loyalty degree by adopting structural equation model as analytical method with from Shanghai to Nanjing case study. firstly establishes on railway, develops measurement table satisfaction. The research results manifest: reliability validity survey data about have tested verified. As hypothesis,...
In this paper, a novel uniform vertical inverter chains (UniVIC) single event multiple transient (SEMT) test structure is proposed for the first time. Charge sharing between standard inverters measured time experimentally. The heavy-ion experiment results in 65 nm bulk CMOS process indicate that charge can impact three transistors at most. At same time, occurring probability of attained 3D TCAD simulations have also verified them. total, conclusions are helpful researchers to direct...
Low-energy (<;10 MeV) proton-induced single event upsets (SEUs) were investigated through proton and heavy ion experiments on a 65 nm CMOS bulk SRAM. It is unlikely that 2-10 MeV direct ionization can induce SEUs in the SRAM observed single-bit (SBUs) multiple cell (MCUs) are mainly induced by from recoil ions. The MCUs low-energy protons our be corrected error correction codes (ECC) because they usually occur along bit line. Geant4 simulations revealed SEU cross-section may show two...
Gas sensors are the key components of an electronic nose (E-nose) in violated odour analysis. Gas-sensor drift is a kind physical change on sensor surface once E-nose works. The perturbation gas-sensor responses caused by would deteriorate performance system over time. In this study, we intend to explore suitable approach deal with effect online situation. Considering that conventional calibration difficult implement online, use active learning (AL) provide reliable labels for instances....
Effective control of the thickness hot-rolled oxide scale on surface steel strip is very vital to ensure quality products. Hence, terahertz nondestructive technology was proposed measure thin scale. The finite difference time domain (FDTD) numerical simulation method employed obtain time-domain data with various (0–15 μm). Added Gaussian white noise a Signal Nosie Reduction (SNR) 10 dB used when simulating real test signals, using four wavelet denoising methods reduce and compare their...
Drift correction is an important concern in Electronic noses (E-nose) for maintaining stable performance during continuous work. A large number of reports have been presented dealing with E-nose drift through machine-learning approaches the laboratory. In this study, we aim to counter effect more challenging situations which category information (labels) drifted samples difficult or expensive obtain. Thus, only a few can be used label querying. To solve problem, propose innovative...