A5048451865- Force Microscopy Techniques and Applications
- Mechanical and Optical Resonators
- Near-Field Optical Microscopy
- Advanced MEMS and NEMS Technologies
- Molecular Junctions and Nanostructures
- Solar and Space Plasma Dynamics
- Retinal Imaging and Analysis
- Surface and Thin Film Phenomena
- Advanced Battery Technologies Research
- Earthquake Detection and Analysis
- Analytical Chemistry and Sensors
- Electronic and Structural Properties of Oxides
- Glaucoma and retinal disorders
- Electrochemical Analysis and Applications
- Advancements in Battery Materials
- Retinal Diseases and Treatments
- Perovskite Materials and Applications
- Advanced Battery Materials and Technologies
- Astro and Planetary Science
- Geophysics and Gravity Measurements
- Ferroelectric and Piezoelectric Materials
McGill University
2017-2020
Universidade Presbiteriana Mackenzie
1968
One of the main challenges in improving fast charging lithium-ion batteries is development suitable active materials for cathodes and anodes. Many suffer from unacceptable structural changes under high currents and/or low intrinsic conductivities. Experimental measurements are required to optimize these properties, but few techniques able spatially resolve ionic transport properties at small length scales. Here we demonstrate an atomic force microscope (AFM)-based technique measure local on...
Perovskites are widely utilized either as a primary component or substrate in which the dynamics of charged oxygen vacancy defects play an important role. Current knowledge regarding mobility perovskites is solely based upon volume- and/or time-averaged measurements. This impedes our understanding basic physical principles governing defect migration inorganic materials. Here, we measure ergodic and nonergodic at relevant spatial temporal scales using time-resolved atomic force microscopy...
Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample’s topography with high spatial resolution while simultaneously probing tip-sample interactions. Local measurement of chemical properties high-resolution has gained much popularity in recent years advances dynamic AFM methodologies. A calibration factor required to convert the electrical readout mechanical oscillation amplitude order extract quantitative information about surface. We propose...
With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying local tip-sample interaction potentials. Such quantitative experiments using noncontact frequency modulation force based on accurate measurement resonance shift due interaction. Here, we experimentally show that oscillating probes used for SPM change systematically as a function oscillation amplitude under typical operating conditions. This...
A common use for atomic force microscopy is to quantify local forces through tip-sample interactions between the probe tip and a sample surface. The accuracy of these measurements depends on which cantilever spring constant known. Recent work has demonstrated that measured can vary up factor two, even exact same by different users microscopes. Here we demonstrate standard method calibrating (using oscillations due thermal energy) susceptible ambient noise, alter result significantly. We new...
In this study we aim to create a scanning probe measurement device capable of studying the charging characteristics battery materials. While Scanning Ion Conductance Microscopy (SICM) allows for local probing conductance materials, poor spatial resolution technique limits its use flat samples. By combining SICM with Atomic Force may overcome these issues and produce spatially resolved ionic measurements in real time. This can be used coordinate lithium iron phosphate materials conformational...
Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sample interactions. Local measurement of chemical properties high-resolution has gained much popularity in recent years advances dynamic AFM methodologies. A calibration factor required to convert the electrical readout mechanical oscillation amplitude order extract quantitative information about surface. We propose...
With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying local tip-sample interaction potentials. Such quantitative experiments are based on accurate measurement resonance frequency shift due interaction. Here, we experimentally show that oscillating probes used for SPM change systematically as a function oscillation amplitude under typical operating conditions. This not interactions, but rather...