Y. Y. Wang

ORCID: 0009-0008-6829-9703
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About
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Research Areas
  • Semiconductor materials and devices
  • Electromagnetic Simulation and Numerical Methods
  • Advancements in Semiconductor Devices and Circuit Design
  • Advanced Fiber Optic Sensors
  • Nanowire Synthesis and Applications
  • Mechanical and Optical Resonators
  • Photonic and Optical Devices
  • Silicon Carbide Semiconductor Technologies
  • Advanced Antenna and Metasurface Technologies
  • ZnO doping and properties
  • Electromagnetic Scattering and Analysis
  • GaN-based semiconductor devices and materials

Southeast University
1993-2024

Zhejiang A & F University
2016

State Key Laboratory of Digital Medical Engineering
2015-2016

The wide direct bandgap and strong exciton binding energy of ZnO have inspired examinations ultraviolet lasing over the previous decades. However, regulation mode, especially realization single mode lasing, is still a challenge. In this study, comb-like structure with an array microrods was selected to design coupled whispering-gallery-mode cavities, wherein naturally varied air-gap between adjacent created flexible condition for optical field coupling without any complicated...

10.1039/c6nr04943e article EN Nanoscale 2016-01-01

By employing vapor-phase transport method, ZnO microrods are fabricated and directly assembled on p-GaN substrate to form a heterostructural microlaser array, which avoids of the relatively complicated etching process comparing previous work. Under applied forward bias, whispering gallery mode ultraviolet lasing is obtained from as-fabricated array. The device's electroluminescence originates three distinct electron-hole recombination processes in heterojunction interface, when voltage...

10.1063/1.4905925 article EN Applied Physics Letters 2015-01-12

A lossy model is presented for the electromagnetic scattering from superconducting film YBa2Cu3O7−x deposited on discretised LaAlO3 substrate. The based integral equation using dyadic Green function. characterised by an impedance matrix instead of a surface impedance, and substrate complex dielectric constant. parameters as functions operating temperature, thickness loss are given, which have hitherto not been in literature.

10.1049/el:19930399 article EN Electronics Letters 1993-01-01
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