The IEEE P1687 (IJTAG) standard proposal aims at standardizing the access to embedded test and debug logic (instruments) via JTAG TAP. specifies a component called Segment Insertion Bit (SIB) which makes it possible construct multitude of alternative instrument networks for given set instruments. Finding best network with respect time number SIBs is time-consuming task in absence EDA support. This paper first describe design automation tool constructs optimizes networks. Our tool, PACT,...

The saturation of the IJTAG concept and its approval as IEEE 1687 standard in 2014 has generated a wave research activities created demand for set appropriate challenging benchmarks. This paper presents such developed by an industrial academic consortium constructed way that facilitates objective comparison experimental results across groups well represents network examples exhaustively utilizing features constructs defined standard. suite is arranged four comprehensive categories, each...

The IEEE P1687 (IJTAG) standard proposal aims at providing a standardized interface between the Standard 1149.1 test access port (TAP) and on-chip embedded test, debug monitoring logic (instruments), such as scan chains temperature sensors. A key feature in is to include Segment Insertion Bits (SIBs) path allow flexibility both designing instrument network scheduling instruments. This paper presents algorithms compute overall time (OAT) for given network. are based on analysis flat...

Due to the increasing usage of embedded instruments in many electronic devices, new solutions effectively access these appeared, including IEEE 1687 standard. The approach supported by allows a flexible through Boundary Scan interface. network includes set reconfigurable scan chains. This paper addresses issue testing circuitry implementing them, checking whether any permanent hardware fault exists, affecting either registers associated made accessible network, or configuration structures it...

IEEE 1687 enables flexible access to the embedded (on-chip) instruments that are needed for post-silicon validation, debugging, wafer sort, package test, burn-in, printed circuit board bring-up, assembly manufacturing power-on self-test, and in-field test. At any of these scenarios, accessed differently, at a given scenario differently over time. It means network needs be frequently reconfigured from accessing one set different instruments. Due need frequent reconfiguration it is important...

In contrast to IEEE 1149.1, P1687 allows, through segment insertion bits, flexible scan paths for accessing on-chip instruments, such as test, debug, monitoring, measurement and configuration features. Flexible access embedded instruments allows test time reduction, which is important at production test. However, the scheme should be carefully selected that resource constraints are not violated power met. For P1687, we detail in this paper session-based session-less scheduling, propose...

This paper discusses the reuse and retargeting of test instruments patterns using IEEE P1687 standard in an era where existing functional elements integration IP blocks is accelerating rapidly. It briefly deficiencies 1149.1 (JTAG) 1500 standards demonstrates how new standard, P1687, plugs these exposures by specifying JTAG as off-chip to on-chip interface instrument access infrastructure. provides a simple example underscore need for then builds on this show can be used more complex situations.

IEEE 1687 (IJTAG) has been developed to enable flexible and automated access the increasing number of embedded instruments in today's integrated circuits. These efficient post-silicon validation, debugging, wafer sort, package test, burn-in, bring-up manufacturing test printed circuit board assemblies, power-on self-test, in-field test. Current paper presents an overview challenges as well selected examples following topics around networks: (1) design efficiently instruments, (2)...

The IEEE P1687 (IJTAG) standard proposal aims at providing a standardized interface between on-chip embedded logic (instruments), such as scan-chains and temperature sensors, the 1149.1 which provides test data transport protocol for board test. A key feature in is to include Select Instrument Bits (SIBs) scan path allow flexibility architecture design scheduling. This paper presents algorithms compute time context. are based on analysis flat hierarchical architectures, considering two...

Efficient handling of faults during operation is highly dependent on the interval (latency) from time embedded instruments detect errors to when fault manager localizes errors. In this paper, we propose a self-reconfiguring IEEE 1687 network in which all that have detected are automatically included scan path. To enable self-reconfiguration, modified segment insertion bit (SIB) compliant 1687. We provide analyses error detection and localization for single multiple faults, suggest how should...

The IEEE 1687 standard describes reconfigurable structures allowing to flexibly access the instruments existing within devices (e.g., support test, debug, calibration, etc.), by use of configurable modules acting as controllable switches. increasing adoption this requires availability algorithms and tools automate its usage. Since resulting networks could inevitably be affected defects which may prevent their correct usage, solutions not only test against these defects, but also diagnose...

Modern devices often include several embedded instruments, such as BIST interfaces, sensors, calibration facilities. New standards, IEEE Std 1687, provide vehicles to access these instruments. In approaches based on reconfigurable scan networks (RSNs), instruments are coupled with registers, connected into chains and interleaved modules. Such modules embed multiplexers that permit a selective different parts of the chain. A similar scenario is also supported by 1149.1-2013. The test...

As fault handling in multi-processor system-on-chips (MPSoCs) is a major challenge, we have developed an MPSoC demonstrator that enables experimentation on injection and handling. Our consists of (1) model with set components (devices) each equipped detection features, so called instruments, (2) Instrument Access Infrastructure (IAI) based IEEE P1687 connects the (3) Fault Indication Propagation (FIPI) propagates indications to system-level, (4) Resource Manager (RM) schedule jobs statuses,...

While the advancement in semiconductor technologies enables manufacturing of highly advanced and complex integrated circuits, there is an increasing need embedded (on-chip) instruments for test, debug, diagnosis, configuration, monitoring, etc. A key challenge how to access these from chip terminals a low-cost, non-intrusive, standardized, flexible scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers non-intrusive standardized but lacks flexibility...

Efficient handling of faults during operation is highly dependent on the interval (latency) from time embedded monitoring instruments detect to when fault manager localizes faults. In this article, we propose a self-reconfiguring IEEE 1687 network in which all that have detected are automatically included scan path, and detection localization module hardware detects configuration after self-reconfiguration extracts error codes reported by instruments. To enable self-reconfiguration, modified...

IEEE 1687 enables flexible access to on-chip instruments via dynamically reconfigurable networks. Reconfiguration allows reducing instrument time by keeping only those on the scan-path which are required for each access. To perform reconfiguration and execute commands described in procedures, scan vectors generated a process called retargeting. These then applied through number of capture-shift-update (CSU) operations. Generating optimal set w.r.t. application is modeled as an Integer Linear...

It is common to embed instruments when developing integrated circuits (ICs). These are accessed at post-silicon validation, debugging, wafer sort, package test, burn-in, printed circuit board bring-up, assembly manufacturing power-on self-test, and operator-driven in-field test. At any of these scenarios, it interest access some but not all the instruments. IEEE 1149.1-2013 1687 propose Test Access Port based (TAP-based) mechanisms design flexible scan networks such that combination can be...

The IEEE 1687 standard describes reconfigurable structures allowing to flexibly access the instruments existing within devices (e.g., support test, diagnosis, calibration, etc.), by using configuration modules which act as controllable switches. increasing adoption of this requires availability algorithms and tools automate its usage. resulting networks might be affected defects preventing their correct operation. This necessitates solutions allow not only test against defects, but also...

The electronic systems we find in almost every product today are implemented using integrated circuits (ICs) mounted on printed circuit boards (PCBs). Developing is a challenging task due to complexity and miniaturization. A single IC can contain billions of transistors, which smaller than ever. As result more Design-for-Test (DfT) features, so called instruments, embedded on-chip modern ICs handle monitor various activities. Many defects handled at manufacturing; however, there many...

Efficient handling of faults during operation is highly dependent on the interval (latency) from time embedded instruments detect errors to when fault manager localizes errors. Detection and localization latencies are network connecting fault-monitoring manager. The can be dedicated data, or used for functional as well-posing a trade-off between cost performance (or predictability). As middle-ground solution, networks based existing IEEE 1687 have been proposed. In this paper, we provide an...

Accessing embedded test and monitoring circuitry (the so-called instruments) in in-field products can reduce maintenance diagnostics costs. Performing such access be facilitated when done over an internal system bus, due to that it might faster less cumbersome reach a processor (on product) network interface, compared with the effort speed of gaining interface on same product. Enabling require that, at component level, instruments system-on-chip (SoC) become accessible both from chip on-chip...