The saturation of the IJTAG concept and its approval as IEEE 1687 standard in 2014 has generated a wave research activities created demand for set appropriate challenging benchmarks. This paper presents such developed by an industrial academic consortium constructed way that facilitates objective comparison experimental results across groups well represents network examples exhaustively utilizing features constructs defined standard. suite is arranged four comprehensive categories, each...

This article describes a novel approach to fault diagnosis suitable for at-speed testing of board-level interconnect faults.This is based on new parallel test pattern generator and specifically detecting sequence. The sequence has tree major advantages.At first, it detects both static dynamic faults upon interconnects. Secondly, allows precise on-chp faults.Third, the hardware implementation response analyzer very efficient in terms silicon area.

The infrastructure of IJTAG can be utilized during operation to detect errors and make appropriate fault handling. This article describes an architecture where error latency automation are important requirements.

In this paper, a new very fast fault simulation method to handle the X-fault model is proposed. The based on two-phase procedure. first phase, parallel exact critical path tracing used determine all detected stuck-at faults in circuit, and second phase postprocess launched which will detectability of X-faults.

In this paper, a new very fast fault simulation method to handle the X-fault model is proposed. The based on two-phase procedure. first phase, parallel exact critical path tracing used determine all detected stuck-at faults in circuit, and second phase postprocess launched which will detectability of X-faults.

IEEE 1687 (IJTAG) has been developed to enable flexible and automated access the increasing number of embedded instruments in today's integrated circuits. These efficient post-silicon validation, debugging, wafer sort, package test, burn-in, bring-up manufacturing test printed circuit board assemblies, power-on self-test, in-field test. Current paper presents an overview challenges as well selected examples following topics around networks: (1) design efficiently instruments, (2)...

This paper studies a new approach for board-level test based on synthesizable embedded instruments implemented FPGA. very recent methodology utilizes programmable logic devices (FPGA) that are usually available modern PCBs to large extent. The purpose of an instrument is carry out vast portion application related procedures, perform measurement and configuration system components thus minimizing the usage external equipment. By replacing traditional equipment with synthetic it possible not...

The paper describes asynchronous fault detection in silicon chips with network of embedded instruments based on IEEE P1687 IJTAG. This technique allows faster and localization by using signal propagation from to instrumentation controller. additional hardware is described, scenarios operation including multiple simultaneous are analysed.

Semiconductor products manufactured with latest and emerging processes are increasingly prone to wear out aging. While the fault occurrence rate in such systems increases, tolerance techniques becoming even more expensive one cannot rely on them alone. In addition mitigating/correcting faults, system may systematically monitor, detect, localize, diagnose classify (manage faults). As a result of management approach, continue operating degrade gracefully case if some system's resources become...

The emergence of heterogeneous FPGA-based SoCs and their growing complexity fueled by the introduction various accelerators bring reliability aspect these systems to front. concern is particularly important for critical applications, such as safety-critical autonomous vehicles, real-time systems, space missions, health, security cyber–physical systems. This paper presents an analysis most common types errors caused faults in different components identifies vulnerable based on literature...

Semiconductor products manufactured with latest and emerging processes are increasingly prone to wear out aging. While the fault occurrence rate in such systems increases, tolerance techniques becoming even more expensive one cannot rely on them alone. Rapid emergence of embedded instrumentation as an industrial paradigm adoption respective IEEE 1687 standard by key players semiconductor industry opens up new horizons developing efficient on-line health monitoring frameworks for prognostics...

This paper describes a new test access protocol for system-level testing of printed circuit boards manufacturing defects. We show that the can be based on standard boundary scan (BS) instructions and mechanism (TAM). It means methodology does not require any changes/redesign hardware immediately implemented in electronic manufacturing. Our solution needs however proper software support availability programmable devices (FPGAs, CPLDs, etc.) board under test. The technique dramatically extends...

The paper presents a new structural fault-independent fault collapsing method based on the topology analysis of circuit, which has linear complexity. minimal necessary set faults as target objective for test generation is found. main idea to produce concurrently with construction structurally synthesized binary decision diagrams (SSBDD) used generation, side effect. To improve collapsing, class BDDs in form SSBDDs multiple inputs (SSMIBDD) proposed, allows significant reduction model...

This paper describes a unique remote laboratory for studying CMOS physical defects that is meant to be used in advanced courses the scope of microelectronic design and test. Both measurement equipment access mechanism were custom developed frame European Union project REASON. The core an educational chip contains different manufacturing physically implemented into standard digital cells small logic circuits on layout level. supplied with dedicated plug-and-play box, which provides interface...

In this paper, a new very fast fault simulation method for extended class of faults is proposed. The based on two-phase procedure. the first phase, novel parallel exact critical path tracing used to determine all "active" nodes with detectable stuck-at faults. second phase procedure, reasoning carried out physical defects information about and current (or previous) logic state network.

Motivated by the need to tolerate faults, this paper presents a complete fault management solution that includes detection and categorization, maintaining map of modified scheduling application algorithms for using healthy resources only. As system maintains fairly sophisticated models itself regarding faulty resources, it constitutes good example specialized self-awareness. <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">—Axel Jantsch, TU Wien</i>

Fault tolerance and fault management mechanisms are necessary means to reduce the impact of soft errors wear out in electronic devices. The semiconductor products manufactured with latest emerging processes increasingly affected by these effects. paper describes a new general scalable architecture based on upcoming DFT standard IEEE P1687 IJTAG. allows create an efficient regular network for handling detection information as well manage test system resources system-wide background process...

Data produced by on-chip sensors in modern SoCs contains a large amount of information such as occurring faults, aging status, accumulated radiation dose, performance characteristics, environmental and other operational parameters. Such provides insight into the overall health system's hardware well operability individual modules. This gives chance to mitigate faults avoid using faulty units, thus enabling management. Raw data from embedded cannot be immediately used perform management...

A new improved method for calculation of fault coverage with parallel backtracing in combinational circuits is proposed. The based on structurally synthesized BDDs (SSBDD) which represent gate-level at higher, macro level where macros subnetworks gates. topological analysis carried out to generate an efficient optimized model faults minimize the repeated calculations because reconvergent fanouts. algorithm equivalent exact critical path tracing, however, processing backtrace a group test...

An efficient method of parallel fault simulation for combinational circuits is proposed. The based on structurally synthesized BDDs (SSBDD) which represent gate-level at higher, macro level where macros subnetworks gates. Converting to the macro-level accompanied with collapsing. A analysis algorithm SSBDDs was developed. For faults fanout stems a new full Boolean differential equivalent exact critical path tracing. Because parallelism and higher abstraction modeling speed considerably...

A new improved method for calculation of fault coverage with parallel backtracing in combinational circuits is proposed. The based on structurally synthesized BDDs (SSBDD) which represent gate-level at higher, macro level where macros subnetworks gates. topological analysis carried out to generate an efficient optimized model faults minimize the repeated calculations because reconvergent fanouts. algorithm equivalent exact critical path tracing, however, processing backtrace a group test...

The increasing number of embedded instruments used to perform test, monitoring, calibration and debug within a semiconductor device has called for brand new standard-the IEEE 1687. Such standard resorts reconfigurable scan network provide efficient flexible access handle complex structures. As it deliver reliable service, many approaches, both formal simulation-based, have been proposed in the literature diagnosis verification such networks. This paper focuses on problem post-silicon...