Yuji Zhao

ORCID: 0000-0001-9199-4159
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About
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Research Areas
  • GaN-based semiconductor devices and materials
  • Ga2O3 and related materials
  • Semiconductor Quantum Structures and Devices
  • Semiconductor materials and devices
  • ZnO doping and properties
  • Silicon Carbide Semiconductor Technologies
  • Photonic and Optical Devices
  • Nanowire Synthesis and Applications
  • Metal and Thin Film Mechanics
  • Advanced Fiber Laser Technologies
  • Graphene research and applications
  • Advanced Photocatalysis Techniques
  • Diamond and Carbon-based Materials Research
  • solar cell performance optimization
  • Radio Frequency Integrated Circuit Design
  • Advancements in Semiconductor Devices and Circuit Design
  • Photocathodes and Microchannel Plates
  • Boron and Carbon Nanomaterials Research
  • Semiconductor materials and interfaces
  • Thermal properties of materials
  • Nonlinear Optical Materials Studies
  • Advanced Memory and Neural Computing
  • Thermal Radiation and Cooling Technologies
  • Acoustic Wave Resonator Technologies
  • Advanced Fiber Optic Sensors

Rice University
2021-2025

Nanjing Normal University
2024-2025

Shenzhen Bay Laboratory
2023-2024

Arizona State University
2015-2024

Max Planck Institute for the Structure and Dynamics of Matter
2023

Center for Free-Electron Laser Science
2023

University of Virginia
2023

DEVCOM Army Research Laboratory
2022-2023

United States Army Combat Capabilities Development Command
2022-2023

Oak Ridge National Laboratory
2022-2023

We report a high-power blue light-emitting diode (LED) with high external quantum efficiency and low droop on free-standing (20) GaN substrate. At forward current of 20 mA, the LED showed peak 52% an output power 30.6 mW. In higher density regions, also outstanding performance, ratios 0.7% at 35 A/cm2, 4.3% 50 8.5% 100 14.3% 200 A/cm2. The A/cm2 were 266.5 mW 45.3%, respectively.

10.1143/apex.4.082104 article EN Applied Physics Express 2011-07-15

We report indium incorporation properties on various nonpolar and semipolar free-standing GaN substrates. Electroluminescence characterization x-ray diffraction (XRD) analysis indicate that the (202¯1¯) (112¯2) planes have highest rate among studied planes. also show both composition polarization-related electric fields impact emission wavelength of quantum wells (QWs). The different magnitudes directions for each orientation result in potential profiles QWs, leading to wavelengths at a...

10.1063/1.4719100 article EN Applied Physics Letters 2012-05-14

We demonstrate high-efficiency green and yellow-green single-quantum-well light-emitting diodes (LEDs) grown on semipolar (2021) GaN substrates by metal organic chemical vapor deposition. The output power external quantum efficiency at a driving current of 20 mA under pulsed condition with 10% duty cycle are 9.9 mW 20.4% for the LED 5.7 12.6% LED, respectively. electroluminescence linewidth narrowing, which is related to band-filling effect caused potential fluctuations, not observed.

10.1143/apex.3.122102 article EN Applied Physics Express 2010-11-26

Nonpolar and semipolar III-nitride-based blue green light-emitting diodes (LEDs) have been extensively investigated as potential replacements for current polar c-plane LEDs. High-power low-efficiency-droop LEDs demonstrated on nonpolar planes III-nitride due to the advantages of eliminated or reduced polarization-related electric field homoepitaxial growth. Semipolar (202¯1) (202¯1¯) contributed bridging "green gap" (low efficiency in spectral region) by incorporating high indium...

10.1364/aop.10.000246 article EN publisher-specific-oa Advances in Optics and Photonics 2018-02-16

We demonstrate a small-area (0.1 mm2) semipolar (2021) blue (447 nm) light-emitting diode (LED) with high light output power (LOP) and external quantum efficiency (EQE) by utilizing single 12-nm-thick InGaN well. The LED had pulsed LOPs of 140, 253, 361, 460 mW, EQEs 50.1, 45.3, 43.0, 41.2%, at current densities 100, 200, 300, 400 A/cm2, respectively. device showed little shift narrow full width half maximum (FWHM). Micro-electroluminescence (µ-EL) scanning transmission electron microscope...

10.1143/apex.5.062103 article EN Applied Physics Express 2012-06-04

Vertical (-201) and (010) beta-Ga2O3 Schottky barrier diodes (SBDs) were fabricated on single-crystal substrates grown by edge-defined film-fed growth (EFG) method. High resolution X-ray diffraction (HRXRD) atomic force microscopy (AFM) confirmed good crystal quality surface morphology of the substrates. The electrical properties both devices, including current-voltage (I-V) capacitance-voltage (C-V) characteristics, comprehensively measured compared. SBDs exhibited on-resistances (Ron) 0.56...

10.1109/ted.2018.2841904 article EN IEEE Transactions on Electron Devices 2018-06-08

This letter reports the implementation of double-drift-layer (DDL) design into GaN vertical Schottky barrier diodes (SBDs) grown on free-standing substrates. balances trade-off between desirable forward turn-on characteristics and high reverse breakdown capability, providing optimal overall device performances for power switching applications. With a well-controlled metalorganic chemical vapor deposition process, doping concentration top drift layer was reduced, which served to suppress peak...

10.1063/1.4993201 article EN publisher-specific-oa Applied Physics Letters 2017-10-09

Recent years have witnessed a tremendous development of vertical gallium nitride (GaN) power devices, new class device technology that could be the key enabler for next-generation high performance electronics. In this comprehensive review, we discuss recent progress made on GaN highlighting their important design principles and fabrication processes. Part I two-part review series introduces basic devices using Schottky barrier diodes (SBDs) p-n as examples. We provide in-depth analysis...

10.1109/ted.2021.3083239 article EN IEEE Transactions on Electron Devices 2021-06-03

We study the optical spectral properties for green semipolar (20) and (201) light-emitting diode (LED) with same indium compositions. Compared to devices, fabricated micro-LED (∼0.005 mm2) showed negligible blue shift smaller full width at half maximum (FWHM) up extremely high current densities (10,000 A/cm2). Theoretical simulation indicates that InGaN quantum well (QW) has reduced polarization-related effects due combined of electric field cancelling Coulomb screening effect. In addition,...

10.7567/apex.6.062102 article EN Applied Physics Express 2013-05-31

The optical polarization ratio of spontaneous emission was investigated by electroluminescence measurements for semipolar (202¯1¯) InGaN/GaN light-emitting diodes, covering the blue to green spectral range. Devices fabricated on substrates exhibit ratios ranging from 0.46 at 418 nm 0.67 519 nm. These are significantly higher than those reported (202¯1) devices. valence band energy separation is extracted and consistent with increased theoretical predictions. Quantum well interdiffusion...

10.1063/1.3619826 article EN Applied Physics Letters 2011-08-01

This letter reports the first demonstration of 1-kV-class AlN Schottky barrier diodes on sapphire substrates by metal organic chemical vapor deposition. The device structure mimics silicon-on-insulator (SOI) technology, consisting thin <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$n$ </tex-math></inline-formula> -AlN epilayer as active region and thick resistive underlayer insulator. At room temperature,...

10.1109/led.2017.2723603 article EN IEEE Electron Device Letters 2017-07-05

To mimic selective-area doping, p-GaN was regrown on an etched GaN surface substrates by metalorganic chemical vapor deposition. Vertical GaN-on-GaN p-n diodes were fabricated to investigate the effects of etch-then-regrowth process device performance. The crystal quality sample after each epitaxial step characterized X-ray diffraction, where led a very slight increase in edge dislocations. A regrowth interfacial layer clearly shown transmission electron microscopy. Strong...

10.1063/1.5052479 article EN Applied Physics Letters 2018-12-03

This work demonstrates the construction of p-n heterojunctions between mechanically exfoliated beta-phase gallium oxide (β-Ga2O3) and p-GaN. The detailed mechanical exfoliation process was developed can be used for further device applications. atomic force microscopy study showed that β-Ga2O3 flakes had a very smooth surface with roughness 0.65 nm. Transmission electron revealed clearly defined interface heterojunction exhibited turn-on voltage 3.6 V rectification ratio ∼105. also good...

10.1063/1.5088516 article EN Applied Physics Letters 2019-04-22

This letter demonstrates novel hydrogen-plasma based guard rings (GRs) for high voltage vertical GaN p-n diodes grown on bulk substrates by metalorganic chemical vapor deposition (MOCVD). The GR structure can significantly improve breakdown voltages (BV) and critical electric fields (E <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">c</sub> ) of the devices. Not having field plates or passivation, with a 9 μm drift layer 10 GRs showed...

10.1109/led.2019.2954123 article EN IEEE Electron Device Letters 2019-11-19

This letter reports high performance GaN p-n junctions with regrown p-GaN by metalorganic chemical vapor deposition (MOCVD) on dry-etched surfaces. The breakdown voltage reaches 1.27 kV and the differential on-resistance is 0.8 m · cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> . effects of etching powers surface treatments reverse leakage characteristics have been investigated. It's found that lowering power damage very effective to...

10.1109/led.2019.2941830 article EN publisher-specific-oa IEEE Electron Device Letters 2019-09-16

Vertical GaN-on-GaN Schottky barrier diodes based on as-grown and regrown samples were fabricated to investigate the effects of etch-then-regrow process device performance. The surface roughness increased slightly after dry etching decreased regrowth. According X-ray diffraction results, caused a slight increase defect density due edge dislocations. parameters extracted from forward current-voltage curves, such as turn-on voltages 0.74 V 0.72 V, ideality factors 1.07 1.10, heights eV 1.05...

10.1109/jeds.2020.2963902 article EN cc-by IEEE Journal of the Electron Devices Society 2020-01-01

Vertical gallium nitride (GaN) power devices are enabling next-generation electronic and systems with higher energy efficiency, density, faster switching, smaller form factor. In Part I of this review, we have reviewed the basic design principles physics building blocks vertical GaN devices, i.e., Schottky barrier diodes p-n diodes. Key topics such as materials engineering, device avalanche breakdown, leakage mechanisms discussed. II several more advanced rectifiers discussed, including...

10.1109/ted.2021.3083209 article EN IEEE Transactions on Electron Devices 2021-06-03

High-surface-area α-Al2O3 nanoparticles are used in high-strength ceramics and stable catalyst supports. The production of by phase transformation from γ-Al2O3 is hampered a high activation energy barrier, which usually requires extended high-temperature annealing (~1500 K, > 10 h) suffers aggregation. Here, we report the synthesis dehydrated (phase purity ~100%, particle size ~23 nm, surface area ~65 m2 g-1) pulsed direct current Joule heating γ-Al2O3. completed at reduced bulk temperature...

10.1038/s41467-022-32622-4 article EN cc-by Nature Communications 2022-08-26

This letter reports an enhancement-mode (E-mode) GaN transistor technology which has been demonstrated to operate in a simulated Venus environment (460 °C, ~ 92 atm., containing CO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> /N /SO etc.) for 10 days. The robustness of the W/p-GaN-gate AlGaN/GaN high electron mobility (HEMT) was evaluated by two complementary approaches, (1) <italic...

10.1109/led.2023.3279813 article EN IEEE Electron Device Letters 2023-05-24

The first 30-mW-class semipolar blue light-emitting diode (LED) on a free-standing (10) GaN substrate has been demonstrated by using microscale periodic backside structures. light extraction efficiency and corresponding output power were greatly enhanced, up to 2.8-fold (bare chip) compare with conventional devices. At driving current of 20 mA, the LED showed an 31.1 mW external quantum 54.7%. Semipolar technology is now comparable commercial c-plane technology, not only in terms internal...

10.1143/apex.3.102101 article EN Applied Physics Express 2010-09-17

This letter reports the first implementation of a hydrogen-plasma-based edge termination technique (HPET) in vertical GaN p-n power diodes grown on bulk substrates using metalorganic chemical vapor deposition. The device with 9-μm-thick drift layer exhibited high breakdown voltage (V <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">bd</sub> ) 1.57 kV, low ON-resistance (R xmlns:xlink="http://www.w3.org/1999/xlink">ON</sub> 0.45 mQ · cm <sup...

10.1109/led.2018.2837625 article EN IEEE Electron Device Letters 2018-05-16

We investigate thermoelectric pumping in wide-bandgap GaN based light-emitting diodes (LEDs) to take advantage of high junction temperature rather than avoiding the problem temperature-induced efficiency droop through external cooling. experimentally demonstrate a thermally enhanced 450 nm LED, which nearly fourfold light output power is achieved at 615 K (compared 295 room operation), with no reduction wall-plug (i.e., electrical-optical energy conversion efficiency) bias V&amp;lt;ℏω/q. The...

10.1063/1.4931365 article EN Applied Physics Letters 2015-09-21
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