A5001280582- Microwave and Dielectric Measurement Techniques
- Microwave Engineering and Waveguides
- Electromagnetic Compatibility and Noise Suppression
- Electromagnetic Compatibility and Measurements
- Radio Frequency Integrated Circuit Design
- Engineering and Materials Science Studies
- Advanced Antenna and Metasurface Technologies
- Acoustic Wave Resonator Technologies
- Mechanical stress and fatigue analysis
- Integrated Circuits and Semiconductor Failure Analysis
- Electrostatic Discharge in Electronics
- Sensor Technology and Measurement Systems
- 3D IC and TSV technologies
- Metal Alloys Wear and Properties
- Civil and Structural Engineering Research
- VLSI and Analog Circuit Testing
- Photonic and Optical Devices
- Engineering Structural Analysis Methods
- Advanced Electrical Measurement Techniques
- Mechanical Failure Analysis and Simulation
- Near-Field Optical Microscopy
- Advanced MEMS and NEMS Technologies
- Metal Forming Simulation Techniques
- Physics and Engineering Research Articles
- Millimeter-Wave Propagation and Modeling
Physikalisch-Technische Bundesanstalt
2016-2025
UCLA Health
2020
The University of Adelaide
2020
Jet Propulsion Laboratory
2020
Space Information Laboratories (United States)
2020
North Carolina State University
2020
Aalto University
2020
The University of Western Australia
2020
Technical University of Darmstadt
2007-2008
Institut Wohnen und Umwelt
2007-2008
We present an iterative algorithm for calibrating vector network analyzers based on orthogonal distance regression. The features a robust, yet efficient, search algorithm, error analysis that includes both random and systematic errors, full covariance matrix relating calibration measurement 95% coverage factors, easy-to-use user interface supports wide variety of standards. also discuss evidence the outperforms MultiCal software package in presence errors accurately estimates uncertainty its results.
We study crosstalk and corrections in coplanar-waveguide vector-network-analyzer calibrations. show that while can improve measurement accuracy, the effectiveness of depends on a number factors, including length access lines, transverse dimensions, separation between standards, substrate configuration.
We examine the performance of two on-wafer multiline Thru-Reflect-Line (TRL) calibration algorithms: popular TRL algorithm implemented in MultiCal/spl reg/ software package, and a newly iterative designed to give optimal results presence measurement noise. show that outperforms MultiCal noise, verify its uncertainty estimates.
On-wafer probing with ground-signal-ground (GSG) probes contributes a variety of side effects, which are related to the measured line type, carrier material, layout neighboring structures, and probe. Thus, size shape probe together type circuits influence quality calibrated result. This paper presents corresponding results when using multiline-thru-reflect-line (mTRL) calibration, is commonly accepted as one most accurate calibration algorithms, concentrates on impact construction elements,...
The millimeter-wave (mm-wave) and terahertz (THz) regions of the electromagnetic spectrum are seeing increasing prominence, with a range established emerging applications—wireless backhaul for mobile networks 5G 6G infrastructure, automotive radar sensors, space-deployed radiometers Earth observation, climate monitoring, weather forecasting, more—exploiting these frequencies. Measurement techniques informed by latest metrological research into measurement electrical quantities underpin...
This paper presents a new method that accurately determines the characteristic impedance of planar transmission lines printed on lossy dielectrics even when contact-pad capacitance and conductance are large. We demonstrate coplanar waveguide fabricated fused silica microstrip line highly conductive silicon substrate.
This paper examines error caused by parasitic inductance in the characteristic impedance measured calibration comparison method on lossy silicon substrates.
This paper reports on initial results of a three-party on-wafer measurement comparison carried out custom-made alumina calibration substrate in the frequency range up to 110 GHz. The correction vector network analyzer is done with highly accurate multiline TRL (mTRL) calibration. focus investigation influence system, probe geometry and operator skills. calibrations are presented selected devices under tests (DUT) evaluated for different configurations.
In this paper, we present a comprehensive uncertainty budget for on-wafer S-parameter measurements of devices on custom-built fused silica wafer, including instrumentation errors, connector repeatability, and calibration standard uncertainties. All major steps toward achieving traceability with the aid multiline thru-reflect-line given measurement scenario are explained. For first time, it is now possible to compare against each other relative importance different sources in measurements....
This paper will present the results of extracting electrical characteristics planar lines using calibration comparison method for standards realized in IBM's advanced 0.13 mum CMOS process. For first time, this is applied to characterizing customized on silicon up 110 GHz. Additionally, considers influences reference benchmark standards, included with GaAs material RM8130, characterization accuracy wafer-embedded at mm-wave frequencies.
This paper presents a new method that accurately determines the characteristic impedance of planar transmission lines printed on lossy dielectrics even when contact-pad capacitance and conductance are large. We demonstrate coplanar waveguide fabricated fused silica microstrip line highly conductive silicon substrate.
On-wafer measurements of a Device Under Test (DUT) can yield accurate results only if the properties measurement environment are well defined and unwanted effects be removed from data. This is commonly achieved through calibration process using set different elements. However, various may degrade accuracy this calibration, particularly at higher frequencies. paper deals with case coplanar waveguide (CPW) lines multiline Thru Reflect Line (mTRL) method discusses two such issues, influence CPW...
When using multiline TRL calibrations for correcting on-wafer measurements, the accuracy of result depends crucially on consistency calibration set. For example, each line standard used in process must allow unambiguous i.e., only difference between various transmission-line elements should be length. To this end, pad structure probes, probe mechanical contact properties and environment including other structures, wafer or chip boundary backside structures (metallization, chuck material)...
Accurate planar transmission-line models are indispensable not only for the design of monolithic microwave integrated circuits (MMICs) but also their characterization, e.g., when establishing traceability on-wafer measurements. This paper presents an extended formulation a conventional, analytical CPW model, which yields improved description radiation losses. The new model is validated by 3D electromagnetic (em) full-wave simulations and compared to
We compute power-voltage, power-current, and causal definitions of the characteristic impedance microstrip coplanar-waveguide transmission lines on insulating conducting silicon substrates, compare to measurement.
We individually characterize and provide uncertainties for a pair of WR-8 rectangular waveguide-to-coplanar waveguide (CPW) probes over frequency range 90 to 140 GHz utilizing two methods implemented within the NIST Microwave Uncertainty Framework. The first method consists two-tier approach, where vector network analyzer (VNA) calibration is performed in waveguide, then second-tier on-wafer. second determines scattering parameters from one-tier calibrations. show that yield nearly...
In this paper we report on progress towards establishing traceability for fully calibrated on-wafer measurements of planar devices built in membrane technology. For the first time, present a comprehensive uncertainty budget S-parameter measurements, including instrumentation errors, connector repeatability and calibration standard uncertainties. Preliminary results are shown three typical devices.
On-wafer measurements at microwave and mmwave frequencies require reliable calibration processes to deduct unwanted effects such as the impact of probe, wafer environment, instrumentation equipment itself. However, with increasing calibrated results become more sensitive parasitic radiation, multimode propagation, substrate modes. This paper investigates their influence when using a typical coplanar waveguide (CPW) G band. The goal this is clarify role modes quantify how they affect...
This article presents a method for determining complex residual errors of calibrated two-port vector network analyzers. It utilizes the time-domain technique. Calibration are extracted from distance-frequency system model using special estimation algorithm based on quasioptimal unscented Kalman filter. Because requires only three measurement conditions, it is in particular beneficial on-wafer applications, as test conditions can be obtained one transmission line. Moreover, length line...
We examine a broadband method to extract the dielectric constant and loss tangent of low-loss substrate materials from on-wafer scattering-parameter measurements coplanar waveguides different lengths. compare against multiple-frequency performed with commercially available split-cylinder resonator show good agreement over broad frequency range for AF45 alumina substrates.
Abstract. An existing analytical transmission line model to describe propagation properties of coplanar waveguides including dispersion and radiation effects was extended take into account surface roughness conductor traces. The influence parasitics is successively included in the simulation compared measurements. device under test (DUT) fabricated on an Al2O3 wafer. A metal ceramic chuck utilized during measurements up 120 GHz. then capable precisely predicting a wide frequency range can...
We describe the in-phase/quadrature covariance-matrix representation of uncertainty in complex vectors, and transformations between this magnitude/phase real/imaginary representations.
Although on-wafer high-frequency measurements are nowadays commonly used, uncertainties for scattering-parameter in planar transmission lines still not yet established - a problem which has been long solved coaxial and waveguides. We describe GUM-compliant approach that is capable of providing traceability path up to 50 GHz using the TRL calibration algorithm.