A5003746950- Optical Coatings and Gratings
- Laser Material Processing Techniques
- Surface Roughness and Optical Measurements
- Semiconductor materials and devices
- ZnO doping and properties
- Thin-Film Transistor Technologies
- Optical and Acousto-Optic Technologies
- Plasmonic and Surface Plasmon Research
- Photonic Crystals and Applications
- Semiconductor Lasers and Optical Devices
- Optical Polarization and Ellipsometry
- Diamond and Carbon-based Materials Research
- Photonic and Optical Devices
- Metal and Thin Film Mechanics
- Advanced Surface Polishing Techniques
- Copper Interconnects and Reliability
- Glass properties and applications
- Photorefractive and Nonlinear Optics
- Silicon and Solar Cell Technologies
- Chalcogenide Semiconductor Thin Films
- Advanced Fiber Optic Sensors
- Copper-based nanomaterials and applications
- Advanced Fiber Laser Technologies
- Calibration and Measurement Techniques
- Nuclear materials and radiation effects
National Agency for New Technologies, Energy and Sustainable Economic Development
2015-2024
Optical Coating Solutions (United States)
2023
ENEA Casaccia Research Centre
2016
Abstract Uncertainty in the physicochemical and optical properties of volcanic ash particles creates errors detection modeling clouds quantification their potential impacts. In this study, we provide a data set that describes representative selection samples from nine different eruptions covering wide range silica contents (50–80 wt % SiO 2 ). We measured calculated parameters describing physical (size distribution, complex shape, dense‐rock equivalent mass density), chemical (bulk surface...
Wavelength dependencies of refractive indices thin film materials differ for various deposition conditions, and it is practically impossible to attribute a single index wavelength dependence any typical material. Besides objective reasons, differences in the optical parameters films may also be connected with nonadequate choices models algorithms used processing measurement data. The main goal this paper present reliable most widely slightly absorbing oxide materials. These can by other...
Optical materials and coatings are exposed to the flux of energetic particles when used in either space applications or nuclear energy plants. The study their behavior such an environment is important avoid failure optical components during operation. performance several thin-film ((HfO2, Ta2O5, Nb2O5, TiO2, SiO2) coatings, under irradiation with high-dose gamma rays (5.8 MGy) exposure low-energy (60 keV) protons, has been investigated. Some variations properties have detected silicon oxide...
Amorphous C-doped zirconia thin films grown by ALD technique on fused silica substrates have high transmittance and significant photoluminescence (PL) capacity suitable for application as a transparent material to convert energy into lower photons well an optical sensor of radiation. Due carbon doping, present three main PL transitions: Transition I II at λem = 450 nm (λexc 200 270 nm), related sp3 sp2 C–C bonds, III 300 nm) that can be assigned CO bonds which introduce n levels in the π- π*...
The optical components described here are variable narrow-band transmission filters, where the transmittance peak varies with position along surface of filter itself. They allow construction ultracompact and low-weight spectrometers for space applications. theoretical behavior graded filters has been already investigated by authors, imaging spectrometry Earth surface. application to miniaturized instruments planetary missions (Mercury) is considered. Experimental results on fabrication...
Abstract General rules governing the quality of aluminium‐doped zinc oxide films (Al:ZnO, AZO) grown by radio frequency sputtering were searched. A vast set experimental data on electrical, optical, structural, and morphological properties AZO prepared at different deposition conditions was analyzed. with a high Haacke's figure merit Φ TC = 10 m Ω −1 fabricated temperatures lower than 250 °C starting from target ZnO mixed 2 wt% Al O 3 . It demonstrated that similar good optical electrical...
Optimization of metal-based transparent conductors (MTCs) made silver and aluminium-doped zinc oxide (AZO) prepared by radio-frequency (r.f.) sputtering has been carried out through tuning metal film properties. The influence morphology related plasmonic features AZO/Ag/AZO MTCs on their optical electrical performance is demonstrated it shown that the nominal thickness layer itself not most crucial value determining MTC performance. optimized a search deposition conditions ensuring...
Abstract Great attention has been recently paid to transparent conductive oxides (TCOs) due their application in optoelectronic devices, flat panel displays, solar cells, and anti‐static coatings. Concerning photovoltaic applications, the reduction of material processing costs are key factors production process. Due In scarcity cost, alternative solutions indium tin oxide (ITO) needed. Al‐doped ZnO (AZO) meets requirements for thin film thanks its good optoelectrical properties, low cost...
An accurate control of the optical properties single crystal diamond during microfabrication processes such as ion implantation plays a crucial role in engineering integrated photonic devices. In this work we present systematic study variation both real and imaginary parts refractive index diamond, when damaged with 2 3 MeV protons at low-medium fluences (range: 10^15 - 10^17 cm^-2). After implanting 125x125 um^2 areas scanning microbeam, pathlength implanted regions was measured laser...
We present the results of variable-angle spectroscopic ellipsometry and transmittance measurements to determine variation complex refractive index ion-implanted single-crystal diamond. An increase is found in both real imaginary parts at increasing damage densities. The depth determined whole wavelength range between 250 1690 nm. dependence from vacancy density evaluated, highlighting a deviation linearity high-damage-density regime. A considerable (up 5%) part observed, attributed an...
Abstract The effect of pulsed laser treatment metal, and metal blacks, was studied. Gold black gold thin films were fabricated by thermal evaporation in a vacuum nitrogen atmosphere respectively. Black grown at pressures 200 Pa 300 Pa. UV radiation (λ = 266 nm, τ 4 ns), with fluence ranging from 1 mJ·cm−2 to 250 used for the film atmosphere. pressure varied up 100 kPa. Surface structure modifications analyzed optical microscopy, atomic force microscopy (AFM) scanning electron (SEM)....
In this paper, a surface plasmon resonance (SPR) spectroscopic ellipsometry, based on Otto-Bliokh configuration, is developed for the measurement of thickness and optical constants ultra-thin coatings. This technique combines sensitivity with accessibility other advantages ellipsometry. Surface plasmons (SP) are generated in sample under test total reflectance mode SP geometric distribution over influenced by coating properties one hand, air gap hand. Nanoscale control between convex was...
Abstract Properties of thin a‐Si:H and indium‐tin oxide (ITO) layers as well properties interfaces Si based heterojunction (HJ) ITO/(p)a‐Si:H/n‐Si structures were analyzed by means atomic force microscopy (AFM) scanning spreading resistance microscopy. It is shown that the morphology ITO grown on n‐type polished crystalline or (p)a‐Si:H/n‐Si substrates depends deposition temperature has peculiarities nano‐scale. Formation highly conductive nano‐dots surface in bulk found. The observed...
The sensitivity of an induced transmission filter (ITF) design to deposition errors is analyzed for the case a single metal layer ITF. Theoretical knowledge least and most sensitive layers within ITF improves reliability when using broadband optical monitoring only dielectric part such metal-dielectric filters. Linearly variable ITFs have been successfully fabricated this developed approach error compensation.
We report a systematic nanoscale investigation on the ultrathin Cr film growth process and properties. Polycrystalline metallic films were manufactured by magnetron sputtering fused silica substrates. The was observed in situ broad-band optical monitoring (BBM) plasma-emission spectroscopy (OES) methods. ex characterization of with thicknesses varying from 2.6 nm up to 57 performed both non-destructive destructive techniques. Recently, we reported novel set data for electrical properties...