A5016478434- Force Microscopy Techniques and Applications
- Mechanical and Optical Resonators
- Near-Field Optical Microscopy
- Magnetic properties of thin films
- Ferroelectric and Piezoelectric Materials
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Materials Characterization Techniques
- Magnetic Properties and Applications
- Adhesion, Friction, and Surface Interactions
- Surface and Thin Film Phenomena
- Acoustic Wave Resonator Technologies
- Electron and X-Ray Spectroscopy Techniques
- Advanced MEMS and NEMS Technologies
- Advanced Electron Microscopy Techniques and Applications
- Analytical Chemistry and Sensors
- Ferroelectric and Negative Capacitance Devices
- Perovskite Materials and Applications
- Electrochemical Analysis and Applications
- Geomagnetism and Paleomagnetism Studies
- Transition Metal Oxide Nanomaterials
- Electronic and Structural Properties of Oxides
- Multiferroics and related materials
- Characterization and Applications of Magnetic Nanoparticles
- Photoacoustic and Ultrasonic Imaging
- Machine Learning in Materials Science
Oxford Instruments (United States)
2016-2025
Oxford Instruments (Germany)
2016-2017
Oak Ridge National Laboratory
2010-2016
University of Waterloo
2016
University of Science and Technology Beijing
2016
University of Tennessee at Knoxville
2016
Hollister (United States)
2004-2014
Diagnostics for the Real World (United States)
2004-2013
Oxford Instruments (United Kingdom)
2013
Surface (Brazil)
2011
Two methods commonly used to measure the normal spring constants of atomic force microscope cantilevers are added mass method Cleveland et al. [J. P. al., Rev. Sci. Instrum. 64, 403 (1993)], and unloaded resonance technique Sader E. Sader, J. W. M. Chon, Mulvaney, 70, 3967 (1999)]. The involves measuring change in resonant frequency fundamental mode vibration upon addition known masses free end cantilever. In contrast, requires measurement quality factor vibration, as well knowledge plan...
Mapping energy transformation pathways and dissipation on the nanoscale understanding role of local structure in dissipative behavior is a key challenge for imaging areas ranging from electronics information technologies to efficient production. Here we develop family novel scanning probe microscopy (SPM) techniques which cantilever excited response recorded over band frequencies simultaneously, rather than at single frequency as conventional SPMs. This excitation (BE) SPM allows very rapid...
We present experimental support for a model of abalone nacre growth that is based on mineral bridges between successive aragonite tablets rather than heteroepitaxial nucleation. Interlamellar sheets organic polymers delineate the but allow to grow through pores in sheets. Atomic force microscope images interlamellar from flat pearls made by Haliotis rufescens (red abalone; marine gastropod mollusk) reveal fibrous core and holes 5−50 nm diameter. Scanning ion conductance microscopy shows...
A dual-excitation method for resonant-frequency tracking in scanning probe microscopy based on amplitude detection is developed. This allows the cantilever to be operated at or near resonance techniques where standard phase locked loops are not possible. includes with non-acoustic driving of force frequency and/or position dependent. An example latter piezoresponse (PFM), resonant strongly dependent contact stiffness tip–surface junction and local mechanical properties, but spatial...
Bimodal force microscopy is a dynamic force-based method with the capability of mapping simultaneously topography and nanomechanical properties soft-matter surfaces interfaces. The operating principle involves excitation detection two cantilever eigenmodes. enables simultaneous measurement several material properties. A distinctive feature bimodal to obtain quantitative information minimum amount data points. Furthermore, under some conditions facilitates separation from other mechanical...
One of the most popular methods for calibrating spring constant an atomic force microscope cantilever is thermal noise method. The usual implementation this method has been to position focused optical spot on or near end cantilever, acquire a curve hard surface characterize lever sensitivity and then measure motion cantilever. equipartition theorem allows be calculated. In work, we measured as function along length observed systematic variation in ranged from short 60 µm up 225 examined....
Atomic force microscopes typically require knowledge of the cantilever spring constant and optical lever sensitivity in order to accurately determine from deflection. In this study, we investigate a technique calibrate rectangular cantilevers that does not contact be made with surface. This noncontact approach utilizes method Sader et al. [Rev. Sci. Instrum. 70, 3967 (1999)] combination equipartition theorem [J. L. Hutter J. Bechhoefer, Rev. 64, 1868 (1993)] sensitivity. A comparison is...
An imaging method where a cantilever is driven at or near two of its flexural resonant eigenmodes described. For most cantilevers, these are nonharmonic. The and parameters chosen such that the tip-sample interactions repulsive. second eigenmode amplitude phase show strikingly different contrasts from those same fundamental signals on graphite samples imaged in air λ-digest deoxyribonucleic acid water.
We report on a technique that simultaneously quantifies the contact stiffness and dissipation of an AFM cantilever in with surface, which can ultimately be used for quantitative nanomechanical characterization surfaces. The method is based measuring resonance frequency using dual AC tracking (DART), where amplitude phase response are monitored at two frequencies either side resonance. By modelling tip–sample as driven damped harmonic oscillator, four measured quantities (two amplitudes...
Here we report the bias-evolution of electrical double layer structure an ionic liquid on highly ordered pyrolytic graphite measured by atomic force microscopy. We observe reconfiguration under applied bias and orientational transitions in Stern layer. The synergy between molecular dynamics simulation experiment provides a comprehensive picture structural phenomena long short-range interactions, which improves our understanding mechanism charge storage level.
We demonstrate the accurate nanoscale mapping of near-surface loss and storage moduli on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). These viscoelastic properties are extracted from spatially resolved maps frequency quality factor AFM cantilever. consider two methods data acquisition: (i) discrete stepping between points (ii) continuous scanning. For point low-speed scanning, values relative modulus in good agreement time-temperature superposition...
We present the first direct comparison of scanning ion conductance microscopy (SICM) with atomic force (AFM) for cell imaging. By imaging same fibroblast or myoblast both technologies in series, we highlight their advantages and disadvantages respect to The finite applied sample AFM results a coupling mechanical properties into measured topography. For soft samples such as cells this leads artifacts topography elastic deformation, which demonstrate by whole fixed extensions at high...
Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or AC mode, is a proven, reliable, and gentle imaging with widespread applications. Over the several decades that tapping has been in use, quantification of tip-sample mechanical properties such stiffness remained elusive. Bimodal keeps advantages single-frequency while extending technique by driving measuring an additional resonant cantilever. The simultaneously measured observables this resonance provide...
Scanning probe microscopy (SPM) techniques have opened the door to nanoscience and nanotechnology by enabling imaging manipulation of structure functionality matter at nanometer atomic scales. Here, we analyze scientific discovery process in SPM following information flow from tip-surface junction, knowledge adoption wider community. We further discuss challenges opportunities offered merging with advanced data mining, visual analytics, technologies.
An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority AFMs use optical beam deflection (OBD) method to infer cantilever. OBD easy implement, has impressive noise performance, and tends be mechanically robust. However, it represents an indirect displacement, since fundamentally angular rather than a displacement measurement. Here, we demonstrate metrological AFM that combines sensor with laser Doppler...
The ability to probe a material's electromechanical functionality on the nanoscale is critical applications from energy storage and computing biology medicine. Voltage-modulated atomic force microscopy (VM-AFM) has become mainstay characterization tool for investigating these materials due its locally electromechanically responsive with spatial resolution micrometers nanometers. However, wide popularity of VM-AFM techniques such as piezoresponse electrochemical strain there been rise in...
Abstract Recent theoretical predictions of ferroelectricity in two-dimensional (2D) van der Waals materials reveal exciting possibilities for their use scalable low-power electronic devices with polarization-dependent functionalities. These prospects have been further invigorated by the experimental evidence polarization response some transition metal chalcogenides (TMCs)—a group narrow-band semiconductors and semimetals a wealth application potential. Among TMCs, molybdenum disulfide (MoS 2...
A magnetic force microscope (MFM) was used to image topography and forces from a chain of submicron single domain particles produced by contained in isolated magnetotactic bacteria. The noncontact data were determine value for the moment an individual bacterial cell, order 10−13 emu, consistent with average bacteria same sample, obtained superconducting quantum interference device magnetometry. results represent most sensitive quantification date.
Formation of ferroelastic twin domains in vanadium dioxide (VO(2)) nanosystems can strongly affect local strain distributions, and hence couple to the strain-controlled metal-insulator transition. Here we report polarized-light optical scanning microwave microscopy studies interrelated transitions single-crystalline VO(2) quasi-two-dimensional (quasi-2D) nanoplatelets (NPls). In contrast quasi-1D nanobeams, 2D geometric frustration results emergence several possible families NPls, thus...
Novel nanocrystalline BiFeO3 ultrafine fibers have been synthesized by sol-gel based electrospinning, with fiber diameter in the range of 100–300 nm and grain size around 20 nm. Phase pure perovskite can be obtained if are fired Ar atmosphere, eliminating impurity phases often observed when air or N2 atmosphere. Excellent piezoelectricity clear ferroelectric domain structure characterized high voltage piezoresponse force microscopy. Enhanced weak ferromagnetism arising from is also observed.