D. Díaz‐Fernández

ORCID: 0000-0003-4024-9356
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Research Areas
  • ZnO doping and properties
  • Electronic and Structural Properties of Oxides
  • Transition Metal Oxide Nanomaterials
  • Copper-based nanomaterials and applications
  • Semiconductor materials and devices
  • Ga2O3 and related materials
  • Graphene research and applications
  • Catalytic Processes in Materials Science
  • Diamond and Carbon-based Materials Research
  • Chemical and Physical Properties of Materials
  • Advancements in Battery Materials
  • Laser-Ablation Synthesis of Nanoparticles
  • Carbon Nanotubes in Composites
  • Magnetic and transport properties of perovskites and related materials
  • Iron oxide chemistry and applications
  • Surface and Thin Film Phenomena
  • Semiconductor materials and interfaces
  • Nanoparticles: synthesis and applications
  • Magnetic Properties and Synthesis of Ferrites
  • Electron and X-Ray Spectroscopy Techniques

Universidad Autónoma de Madrid
2013-2020

Jožef Stefan Institute
2017-2020

We have studied the electronic structure of nanocrystalline NiO thin films, grown by radio-frequency magnetron sputtering under different experimental conditions, using x-ray absorption spectroscopy. The O 1s and Ni 2p spectra showed distinct changes as a function O2 content in plasma, which were reproduced with cluster model calculations. These are attributed to incrementing surface contribution due decrease crystallite size plasma increases, presence induced nickel vacancies. Thus, can be...

10.1088/0953-8984/25/49/495506 article EN Journal of Physics Condensed Matter 2013-11-08

This work reports an X-ray absorption near-edge structure (XANES) spectroscopy study at the Ni K-edge in early stages of growth NiO on non-ordered SiO2, Al2O3 and MgO thin films substrates. Two different coverages substrates have been studied. The analysis XANES region shows that for high (80 Eq-ML) spectra are similar to bulk NiO, being identical all In contrast, low (1 differ from large indicating local order around is limited first two coordination shells. addition, results also suggest...

10.1107/s0909049513012417 article EN Journal of Synchrotron Radiation 2013-05-22

The growth of Cobalt oxides by reactive thermal evaporation metallic in an oxygen atmosphere on a series oxide substrates, namely SiO 2 , Al O 3 and MgO, has been chemically morphologically studied means XPS atomic force microscopy (AFM). results reveal that cobalt grows as CoO (Co 2+ ) for coverages up to some tens equivalent monolayers all substrates. For larger coverages, the formation spinel Co 4 observed. AFM quantification allowed us determine way being Volmer–Weber (i.e. islands) mode...

10.1002/sia.5366 article EN Surface and Interface Analysis 2014-01-15

Basic steps followed for the SrTiO<sub>3</sub> deposition. The coverages before oxidation and crystallization stages have been optimized in this work.

10.1039/c7ra02820b article EN cc-by-nc RSC Advances 2017-01-01

To benefit from the diverse functionalities of perovskite oxides in silicon-based complementary metal oxide semiconductor (CMOS) technology, integrating into a silicon platform has become one major tasks for research. Using deposition LaMnO3/SrTiO3 (STO) superlattices (SLs) as case study, we demonstrate that (001) single oriented SLs can be integrated on Si using various template techniques, including single-layer buffer STO prepared by molecular beam epitaxy (MBE) and pulsed laser...

10.1021/acsami.0c10579 article EN cc-by-nc-nd ACS Applied Materials & Interfaces 2020-08-26

The effects of thermal annealing on the concentration cationic vacancies in p-type semiconducting NiO thin films have been studied by x-ray absorption spectroscopy at O 1s threshold. This technique proves to be very sensitive amount Ni through intensity a prepeak observed below threshold, associated with ions high oxidation state. Samples different vacancy concentrations were obtained radio frequency magnetron sputtering O2/Ar ratios plasma. Thermal both during film growth and after...

10.1116/6.0000080 article EN Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 2020-04-09
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