A5099978594- Optical measurement and interference techniques
- Advanced Measurement and Metrology Techniques
- Thin-Film Transistor Technologies
- Surface Roughness and Optical Measurements
- Force Microscopy Techniques and Applications
- Nanowire Synthesis and Applications
- Bone Tissue Engineering Materials
- Advanced Surface Polishing Techniques
- Dental materials and restorations
- Additive Manufacturing and 3D Printing Technologies
Istituto Nazionale di Ricerca Metrologica
2024
Abstract Optical topography measurements are of high interest in a lot industrial
and academic fields. One the most common associated measurement methods
is coherence scanning interferometry, but even though it provides sub-nanometer
axial resolution, its lateral resolution is diffraction limited. Not only feature
size limiting factor for optical measurements, also steep surface slopes
may lead to problems, since acceptance angle objective lens limits...
Abstract Silicon nanowires (NWs) with a cylindrical form are fabricated by means of nanosphere lithography and metal-assisted chemical etching to obtain high aspect ratio nanostructures (diameter about 100 nm length more than 15 µm) on an approximately 1 cm 2 area. The nanodimensional characterization individual NWs is performed using several techniques, because dimensions at the nanoscale strictly relate functional performance. In this study, we report results interlaboratory comparison...
The improvement of the mucosal sealing around implant represents a challenge, one that prompted research into novel materials. To this purpose, printable poly(ε-caprolactone) (PCL)-based composite loaded with alumina-toughened zirconia (ATZ) at increasing rates 10, 20, and 40 wt.% was prepared, using solvent casting method chloroform. Disks were produced by 3D printing; surface roughness, free energy optical contact angle measured. Oral fibroblasts (PF) epithelial cell (SG) tests utilized to...
Surface metrology deals with inspecting surfaces and profiles by using contact or non-contact profilometers. In this field, the characterization of dimensional, morphological, texture parameters samples as well assessment metrological characteristics measuring instruments are key issues. Manufacturers provide commercial software tools to analyze topography data. There also freely available tools, including open-source options, that a variety algorithms methods. The rapid growth...