A5027210044- Force Microscopy Techniques and Applications
- Surface Roughness and Optical Measurements
- Adhesion, Friction, and Surface Interactions
- Optical measurement and interference techniques
- Advanced Measurement and Metrology Techniques
- Additive Manufacturing and 3D Printing Technologies
- Silicon and Solar Cell Technologies
- Near-Field Optical Microscopy
- Mechanical and Optical Resonators
- Advanced Surface Polishing Techniques
- Industrial Vision Systems and Defect Detection
- Thin-Film Transistor Technologies
- Surface and Thin Film Phenomena
- Electron and X-Ray Spectroscopy Techniques
- Dental materials and restorations
- Nanowire Synthesis and Applications
- Air Quality Monitoring and Forecasting
- Nuclear Physics and Applications
- X-ray Diffraction in Crystallography
- Vehicle emissions and performance
- Engine and Fuel Emissions
- Microstructure and mechanical properties
- X-ray Spectroscopy and Fluorescence Analysis
- Electronic Packaging and Soldering Technologies
- Manufacturing Process and Optimization
Istituto Nazionale di Ricerca Metrologica
2018-2024
Polytechnic University of Turin
2020-2022
Abstract Unambiguous identification of the measurement methodologies is fundamental to reduce uncertainty and support traceability particle shape size at nanoscale. In this work, critical aspects in atomic force microscopy measurements, that is, drawbacks on sample preparation, instrumental parameters, image pre-processing, reconstruction, tip enlargement, are discussed reference quantitative dimensional measurements different kinds nanoparticles (inorganic biological) with shapes...
Abstract Optical topography measurements are of high interest in a lot industrial
and academic fields. One the most common associated measurement methods
is coherence scanning interferometry, but even though it provides sub-nanometer
axial resolution, its lateral resolution is diffraction limited. Not only feature
size limiting factor for optical measurements, also steep surface slopes
may lead to problems, since acceptance angle objective lens limits...
Accurate measurements of line-width standards, sidewalls and non-spherical nanoparticles performed at the nanoscale by means atomic force microscopy (AFM) suffer from errors due to tip shape size. To reduce uncertainty, study here presented aims investigate a bio-plant nanostructure, namely tobacco mosaic virus (TMV), as candidate reference characterizer.
Abstract Silicon nanowires (NWs) with a cylindrical form are fabricated by means of nanosphere lithography and metal-assisted chemical etching to obtain high aspect ratio nanostructures (diameter about 100 nm length more than 15 µm) on an approximately 1 cm 2 area. The nanodimensional characterization individual NWs is performed using several techniques, because dimensions at the nanoscale strictly relate functional performance. In this study, we report results interlaboratory comparison...
The improvement of the mucosal sealing around implant represents a challenge, one that prompted research into novel materials. To this purpose, printable poly(ε-caprolactone) (PCL)-based composite loaded with alumina-toughened zirconia (ATZ) at increasing rates 10, 20, and 40 wt.% was prepared, using solvent casting method chloroform. Disks were produced by 3D printing; surface roughness, free energy optical contact angle measured. Oral fibroblasts (PF) epithelial cell (SG) tests utilized to...
Surface metrology deals with inspecting surfaces and profiles by using contact or non-contact profilometers. In this field, the characterization of dimensional, morphological, texture parameters samples as well assessment metrological characteristics measuring instruments are key issues. Manufacturers provide commercial software tools to analyze topography data. There also freely available tools, including open-source options, that a variety algorithms methods. The rapid growth...
Nowadays the development in photovoltaic (PV) cells manufacturing requires increasingly sophisticated technologies, and order to avoid efficiency losses PV cell, printing techniques of front contacts have be well controlled. To this purpose, printed linear conductors (PLCs) on a standard cell are characterized by morphology- resistance-based measurements, creating well-calibrated test structure towards an application-oriented material measure. It can noticed that morphology texture...
Traceable parameters for determining the relationship between texture, form, sizes and resistance behaviour of functional surfaces' features, such as screen-printed electrodes with grids different design either on c-Si photovoltaic cells a ceramic substrate, are studied in this work.Test samples various sizes, suitable to study surface features wide measurement range, have been characterized by optical-confocal profilometry measurements dense data sampling.Quantitative these printed lines...