A5039739602- Force Microscopy Techniques and Applications
- Mechanical and Optical Resonators
- Spectroscopy Techniques in Biomedical and Chemical Research
- Near-Field Optical Microscopy
- Integrated Circuits and Semiconductor Failure Analysis
- Analytical Chemistry and Sensors
- Spectroscopy and Chemometric Analyses
- Thermography and Photoacoustic Techniques
- thermodynamics and calorimetric analyses
- Molecular Junctions and Nanostructures
- Electrochemical Analysis and Applications
- Photoacoustic and Ultrasonic Imaging
- Advanced MEMS and NEMS Technologies
- Adhesion, Friction, and Surface Interactions
- Semiconductor Quantum Structures and Devices
- Advanced Surface Polishing Techniques
- Advanced Materials Characterization Techniques
- Ion-surface interactions and analysis
- Computational Drug Discovery Methods
- Nanofabrication and Lithography Techniques
- Photoreceptor and optogenetics research
- Metabolomics and Mass Spectrometry Studies
- Polymer Surface Interaction Studies
- Semiconductor materials and devices
- Lipid Membrane Structure and Behavior
Ansys (United States)
2009-2018
Santa Barbara City College
2018
Dow Chemical (France)
2011
Université Paris-Sud
2011
Procter & Gamble (United States)
2011
Veeco (United States)
2001-2007
University of California, Santa Barbara
1989-2005
Digital Wave (United States)
1994
California Institute of Technology
1992
University of California System
1990
The atomic force microscope (AFM) can be used to image the surface of both conductors and nonconductors even if they are covered with water or aqueous solutions. An AFM was that combines microfabricated cantilevers a previously described optical lever system monitor deflection. Images mica demonstrate resolution is possible on rigid materials, thus opening possibility atomic-scale corrosion experiments nonconductors. polyalanine, an amino acid polymer, show potential for revealing structure...
Tapping mode atomic force microscopy in liquids gives a substantial improvement imaging quality and stability over standard contact mode. In tapping the probe-sample separation is modulated as probe scans sample. This modulation causes to tap on surface only at extreme of each cycle therefore minimizes frictional forces that are present when constantly with surface. increases resolution reduces sample damage soft samples. For our initial experiments we used frequency 17 kHz image...
A scanning ion-conductance microscope (SICM) has been developed that can image the topography of nonconducting surfaces are covered with electrolytes. The probe SICM is an electrolyte-filled micropipette. flow ions through opening pipette blocked at short distances between and surface, thus limiting ion conductance. feedback mechanism be used to maintain a given conductance in turn determine distance surface. also sample local currents above surfaces. To illustrate its potential for imaging...
Using a new mode of scanning, the force modulation mode, surfaces are imaged by atomic microscope. The contrast mechanism relies on variation in surface elasticity. cross section carbon fibre and epoxy composite is imaged, showing between two materials. Surface elasticity variations across revealed. A lateral used to highlight steps gold.
Polymer and life science applications of a technique that combines atomic force microscopy (AFM) infrared (IR) spectroscopy to obtain nanoscale IR spectra images are reviewed. The AFM-IR generated from this contain the same information with respect molecular structure as conventional measurements, allowing significant leverage existing expertise in spectroscopy. can be used acquire absorption spatial resolution on 50 100 nm scale, versus scale many micrometers or more for In sciences,...
Long, nanometer-size metallic wires can be synthesized by injection of the conducting melt into nanochannel insulating plates. Large-area arrays parallel 200 nanometers in diameter and 50 micrometers long with a packing density 5 x 10(8) per square centimeter have been fabricated this way. When charged, ends generate strong, short-range electric fields. The nanowire fields imaged at high spatial resolution scanning force microscope.
ADVERTISEMENT RETURN TO ISSUEPREVArticleNEXTQuantized adhesion detected with the atomic force microscopeJan H. Hoh, Jason P. Cleveland, Craig B. Prater, Jean Paul Revel, and K. HansmaCite this: J. Am. Chem. Soc. 1992, 114, 12, 4917–4918Publication Date (Print):June 1, 1992Publication History Published online1 May 2002Published inissue 1 June 1992https://pubs.acs.org/doi/10.1021/ja00038a075https://doi.org/10.1021/ja00038a075research-articleACS PublicationsRequest reuse permissionsArticle...
Innovations in engineering, miniaturization, and control-system design have the potential to allow faster imaging by atomic force microscopes.
The atomic force microscope (AFM) can now bridge the gap from imaging objects that be seen with an optical to atoms: a range in magnification of 104. High images germanium show single atoms separated by 0.4 nm while low entire cells and portions integrated circuit chip provide lateral vertical information over 25 μm.
Infrared spectroscopic imaging is widely used for the visualization of biomolecule structures, and techniques such as optical photothermal infrared (OPTIR) microspectroscopy can achieve <500 nm spatial resolution. However, these approaches lack specificity particular cell types components thus cannot be a stand-alone technique to assess their properties. Here, we have developed novel tool, fluorescently guided microspectroscopy, that simultaneously exploits epifluorescence OPTIR perform IR...
Atomic force microscopy (AFM) and infrared (IR) spectroscopy have been combined in a single instrument (AFM-IR) capable of producing sub-micrometer spatial resolution IR spectra absorption images. This new capability enables the spectroscopic characterization microdomain-forming polymers at levels not previously possible. Films poly(3-hydroxybutyrate-co-3-hydroxyhexanoate) were solution cast on ZnSe prisms, followed by melting annealing to generate crystalline microdomains different sizes. A...
We describe here the theoretical basis of innovative tapping AFM-IR mode that can address novel challenges in imaging and chemical mapping polymeric nanoparticles.
There is a significant need for chemical identification and imaging of nanofabricated structures devices, especially multiple materials integrated at the nanometer scale. Here we present nanofabrication, identification, nanometer-scale polymer nanostructures with better than 100 nm spatial resolution. Polymer polyethylene, polystyrene, poly(3-dodecylthiophene-2,5-diyl) were fabricated by tip-based nanofabrication. Nanometer-scale infrared measurements using atomic force microscopy...
An atomic force microscope coupled with a tunable infrared laser source (AFM-IR) was used to measure the size and map distribution of oil inclusions inside microorganism without staining or other special sample preparation. The under study is Streptomyces, soil bacterium that possesses capability, some specific nutritional conditions, store its carbon into TriAcylGlycerols, potential direct biodiesel.
Abstract
Abstract We have imaged DNA from the calf thymus nucleosome using a scanning tunneling microscope (STM) operated in water. The fragments are deposited onto interface between buffer solution and an epitaxially grown gold surface electrochemical technique. Most of fairly straight, when individual polymers can be identified, their length is consistent with expected 146 basepairs (∼ 500 Å). resolution often adequate to show signs 36 Å helical pitch. Some images structure which appears abrupt...
The scanning ion-conductance microscope (SICM) is a member of the growing family probe microscopes, which includes tunneling and atomic force microscope. SICM scans small aperture over sample immersed in electrolyte measures ionic current flowing through aperture. This serves as feedback signal for standard electronics, can then provide images topography surface, or distribution flow pores porous sample. resolution this essentially set by size We have developed silicon microfabricated probes...
Infrared (IR) spectroscopy is one of the most widely used techniques for identifying and characterizing materials, but diffraction limited to a spatial resolution no smaller than several micrometers. This paper reports IR with 100 nm resolution, using tunable laser whose absorption in an organic layer measured via atomic force microscopy. Wavelength-dependent sample results local thermomechanical deformation, which sensed sharp tip resonant microscope cantilever. We introduce cantilever...
We report Lorentz force-induced actuation of a silicon microcantilever having an integrated resistive heater. Oscillating current through the cantilever interacts with magnetic field around NdFeB permanent magnet and induces force that deflects cantilever. The same heating. With AC currents as low 0.2 mA, can be oscillated much 80 nm at resonance DC temperature rise less than 5 °C. By comparison, variation leads to thermomechanical oscillation is about 1000 times smaller deflection...
This tutorial reviews the rapidly growing field of optical photothermal infrared (O-PTIR) spectroscopy and chemical imaging. O-PTIR is an super-resolution measurement technique where a shorter wavelength visible probe used to measure map (IR) absorption with spatial resolution up 30× better than conventional techniques such as Fourier transform direct IR laser imaging systems. article key limitations instruments, technology breakthroughs, their origins that have overcome prior limitations....