Takeshi Murakami

ORCID: 0000-0002-3189-3265
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Research Areas
  • Microstructure and Mechanical Properties of Steels
  • Electron and X-Ray Spectroscopy Techniques
  • Advancements in Photolithography Techniques
  • Magnetic Properties and Applications
  • Neural Networks and Applications
  • Iron-based superconductors research
  • Chaos-based Image/Signal Encryption
  • Rare-earth and actinide compounds
  • Polymer Nanocomposite Synthesis and Irradiation
  • Polymer Nanocomposites and Properties
  • Fusion materials and technologies
  • Ion-surface interactions and analysis
  • Microstructure and mechanical properties
  • Hydrogen embrittlement and corrosion behaviors in metals
  • Advanced oxidation water treatment
  • Physics of Superconductivity and Magnetism
  • Non-Destructive Testing Techniques
  • Aluminum Alloy Microstructure Properties
  • Metallurgy and Material Forming
  • Magnetic properties of thin films
  • Image Processing and 3D Reconstruction
  • Solid-state spectroscopy and crystallography
  • Radioactive element chemistry and processing
  • Corporate Taxation and Avoidance
  • Nuclear Materials and Properties

Iwate University
2015-2025

Hokkaido University of Education
2024

Ishinomaki Senshu University
2024

Joetsu University of Education
2024

Doshisha Women's College of Liberal Arts
2024

Mitsubishi Electric (Germany)
2024

National Institutes for Quantum Science and Technology
1999-2019

Mitsubishi Heavy Industries (Japan)
2018

Osaka University
1999-2015

Ebara (Japan)
2004-2014

We report the effect of 3 MeV proton irradiation on suppression critical temperature ${T}_{c}$ in $\text{Ba}{({\text{Fe}}_{1\ensuremath{-}x}{\text{Co}}_{x})}_{2}{\text{As}}_{2}$ single crystals at underdoping, optimal-doping, and overdoping levels. find that decreases residual resistivity increases monotonically with increasing dose. also no upturn low-temperature contrast $\ensuremath{\alpha}$-particle-irradiated NdFeAs(O,F), which suggests defects induced by behave as nonmagnetic...

10.1103/physrevb.82.220504 article EN Physical Review B 2010-12-14

Various kinds of energetic particles are irradiated into iron-based superconductors, and their effects on the critical current density (Jc) vortex dynamics have been systematically studied. It is found that Jc enhanced strongly suppressed by having a sufficient energy deposition rate, similar to case high temperature cuprate superconductors. The enhancement Jc, in general, persists up much higher irradiation doses than cuprates. However, details effect depend kind ion species energies. Even...

10.1088/0953-2048/25/8/084008 article EN Superconductor Science and Technology 2012-07-17

To estimate muscle metabolism and oxygen delivery to skeletal in patients with chronic heart failure.13 failure 15 controls performed calf plantar flexion for six minutes at a constant workload of 50% one repetition maximum. During recovery from exercise, content oxygenated haemoglobin (oxy-Hb) the level phosphocreatine (PCr) were measured by near-infrared spectroscopy (31)P-magnetic resonance spectroscopy, respectively.The mean (SD) time constants PCr oxy-Hb during exercise significantly...

10.1136/heart.83.2.161 article EN Heart 2000-02-01

In this study, we demonstrate for the first time hydrothermal synthesis of yttria-stabilized zirconia (YSZ) nanocrystals with controlled yttria content (x = 3-12 mol %; xYSZ) negligible aggregation from aqueous solution. The were grown via treatment basic Zr(IV) and Y(III) carbonate complex solutions in presence a cationic ligand, N(CH3)4(+). characterized detail by dynamic light scattering, ζ-potential measurement, X-ray diffraction, specific surface area measurement based on...

10.1021/acs.inorgchem.5b01112 article EN Inorganic Chemistry 2015-07-31

The radiation-induced reactions of a water-soluble coumarin derivative, coumarin-3-carboxyl acid (C3CA), have been investigated in aqueous solutions by pulse radiolysis with 35 MeV electron beam, final product analysis following (60)Co γ-irradiations and deterministic model simulations. Pulse revealed that C3CA reacted both hydroxyl radicals ((•)OH) hydrated electrons (e(-) (aq)) near diffusion-controlled rate constants 6.8 × 10(9) 2.1 10(10) M(-1) s(-1), respectively. reactivity towards...

10.3109/10715762.2012.684879 article EN Free Radical Research 2012-04-16

According to the ITRS Roadmap, EUV mask requirement for 2X nm technology node is detection of defect size 20 nm. The history optical inspection tools involves continuous efforts realize higher resolution and throughput. In terms productivity, considering resolution, throughput cost, we studied capability light Electron Beam (EB) inspection, using Scanning Microscope (SEM), including prolongation conventional inspection. As a result our study, solution propose EB Projection (PEM) technique an...

10.1117/12.898790 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2011-10-06

The concept and the current status of a newly developed PEM pattern inspection system are presented. An image-processing technique with learning functions to enhance system's detection capability is investigated. Highly accelerated electrons employed here in electron-optics function as an enabler improve image resolution transmittance system, acquire contrast 0.5 half pitch (hp) 64 nm lines space pattern. This process also results formation electron more than 3000 per pixel on sensor. was...

10.1117/12.2027566 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2013-09-09

High-sensitivity extreme ultraviolet (EUV) mask pattern defect detection is one of the major issues remaining to be addressed in device fabrication using lithography. In order achieve inspection sensitivity and suitability for 1× nm node, a projection electron microscope (PEM) system employed that enables high-speed/high-resolution inspection, which not possible conventional deep or beam systems. By employing higher energy optics (EO) exposure by improving PEM design, we have minimized...

10.1117/1.jmm.13.1.013009 article EN Journal of Micro/Nanolithography MEMS and MOEMS 2014-02-21

10.1016/j.nimb.2007.08.072 article EN Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms 2007-09-08

10.1016/j.nima.2007.04.121 article EN Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment 2007-04-15

In order to realize EUV mask pattern defect inspection in 16nm node, we have developed new optics on a novel projection electron microscopy (PEM) and system with the handling imaging units, e.g., high precision stage, an detector, processing system, so. on. This enables us make resolution speed as compared conventional DUV EB systems. The PEM comprises exposure beam (EOs). is based design concept meet required progress for 1Xnm current 2Xnm node; employs techniques achieve features:...

10.1117/12.2027733 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2013-09-09

The production of methyl viologen radical cation (MV•+) in the radiolysis aqueous solutions 0.5 mM (MV2+) containing formate and tertiary butanol (t-BuOH) was studied using fast electron (integral yields) 21 MeV 4He ion beam pulses (track segment yields). concentration varied range 10-3−2 M. It confirmed that MV•+ is formed within microseconds it stable measured time regions if solution contains neither t-BuOH nor oxygen. Tertiary through scavenging OH or H atom by reacts with MV•+, this...

10.1021/jp9842401 article EN The Journal of Physical Chemistry A 1999-05-29

The framework and the current status of a newly developed PEM pattern inspection system are presented. A die-to-die defect detection sensitivity developing is investigated. programmed mask was used for demonstrating performance system. Defect images were obtained as difference by comparing "with-defects" to "without-defects". image-processing also dieto- die inspection. targeted inspection-throughput 19-hour per with 16 nm pixel size image capture attained. Captured extrusion intrusion...

10.1117/12.2069723 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2014-07-28

The framework and the current status of a newly developed PEM pattern inspection system are presented. A die-to-die defect detection sensitivity developing is investigated. programmed mask was used for demonstrating performance system. Defect images were obtained as difference by comparing with-defects to without-defects. image-processing also inspection. targeted throughput 19-hour per with 16nm pixel size image capture attained. Captured 28 nm intrusion in hp 64 L/S detection. clearly...

10.1117/12.2045412 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2014-04-17
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