A5101949224- Advanced X-ray Imaging Techniques
- Electron and X-Ray Spectroscopy Techniques
- X-ray Spectroscopy and Fluorescence Analysis
- Surface and Thin Film Phenomena
- Particle Accelerators and Free-Electron Lasers
- Advancements in Photolithography Techniques
- Advanced Measurement and Metrology Techniques
- Laser-Plasma Interactions and Diagnostics
- Advanced Surface Polishing Techniques
- Crystallography and Radiation Phenomena
- Physics of Superconductivity and Magnetism
- Advanced Electron Microscopy Techniques and Applications
- Superconductivity in MgB2 and Alloys
- Advanced Semiconductor Detectors and Materials
- Force Microscopy Techniques and Applications
- Catalytic Processes in Materials Science
- Advanced Chemical Physics Studies
- Ion-surface interactions and analysis
- Semiconductor materials and devices
- Semiconductor Quantum Structures and Devices
- Semiconductor materials and interfaces
- Atomic and Molecular Physics
- Optical measurement and interference techniques
- Iron-based superconductors research
Elettra-Sincrotrone Trieste S.C.p.A.
1995-2023
Carl Zeiss (Germany)
2007
AREA Science Park
2002-2003
Lawrence Berkeley National Laboratory
1996
École Polytechnique Fédérale de Lausanne
1996
The current status of the TwinMic beamline at Elettra synchrotron light source, that hosts European twin X-ray microscopy station, is reported. provided by a short hybrid undulator with source size and divergence intermediate between bending magnets conventional undulators, energy-tailored using collimated plane-grating monochromator. spectromicroscopy experimental station combines scanning full-field imaging in single instrument, contrast modes such as absorption, differential phase,...
The Super-ESCA beamline has been designed for high resolution core level spectroscopy of adsorbates on single crystal surfaces using soft x-ray synchrotron radiation. It receives the light from an 81 period undulator with 5.6 cm and 4.5 m length in storage ring ELETTRA. tunability this insertion device, at a electron energy 2.0 GeV connected modified SX700 monochromator allows performance experiments photon range 100–2000 eV. This is now operational first absorption spectra are presented...
In the course of 1998, Spectromicroscopy beamline at ELETTRA completed commissioning and succeeded in performing its first test experiments. The is designed to perform photoemission experiments with high spatial resolution, which obtained by focusing radiation a small spot on sample means multilayer-coated Schwarzschild Objective. Three objectives are currently available; these operate photon energies 74, 95, 110 eV. A review presented performances achieved together an outlook future...
Even if not well defined a border exists between the soft and hard X‐ray region. The optics adopted in one region is suitable for other vice versa. Nevertheless, recently more experimentalists wish to investigate their samples by using an energy range as wide possible. Without adopting complicated very expensive mechanical solutions, it major challenge, optical designer, find solution both spectral ranges. This was our task TwinMic beamline at Elettra, Italian 3rd generation synchrotron...
The concept of variation the angle deflection in a spherical grating monochromator allows to keep defocus aberration at zero while keeping entrance and exit slit distances fixed. This report presents optimization this for different applications which one would always like work with maximum resolving power photon flux fixed position. Three designs are presented medium resolution (E/ΔE = 3000) soft x-ray microscopy studies energy range 200–1200 eV 20–300 high-resolution spectroscopy (E/ΔE≳10...
The FERMI@Elettra free electron laser (FEL) user facility is currently under construction at the Sincrotrone Trieste laboratory in (Italy). It a based on seeded scheme that will provide an almost perfect transform limited beam and fully spatial coherent. cover wavelength range from 100 to about 3 nm short future down 1 (by using higher harmonics). expected be operative late summer of 2010. In this presentation we report layout photon diagnostics section with preliminary tests, radiation...
Using photoemission microscopy at submicron lateral resolution, we measured the occupied density of states in ${\mathrm{MgB}}_{2}$ single crystalline grains from commercial powder. This experiment provided a reliable measurement integrated directly comparable to theoretical predictions. According conventional metallic nature ${\mathrm{MgB}}_{2},$ with weak electron-electron correlation effects, observe close overall agreement between our valence-band spectrum and calculated states. is...
A diffraction plane grating with single-layer coating able to reach photon energy up 3 keV (possibly 4 keV) will be adopted at the TwinMic beamline ELETTRA. The exploit unique capabilities of novel twin X-ray microscope, which combines scanning and full-field imaging microscopes in a single multipurpose end-station. needed moderate resolving power provided by variable included angle monochromator working collimated light mode (also known as SX700). This configuration allows freely selection...
Laser-slicing at a diffraction-limited storage ring light source in the soft X-ray region is investigated with theoretical and numerical modelling. It turns out that slicing efficiency favoured by ultra-low beam emittance, can be implemented without interference to standard multi-bunch operation. Spatial spectral separation of sub-picosecond radiation pulse from hundreds picosecond-long background achieved virtue 1:1 imaging source. The enhanced when radiator transverse gradient undulator....
X ray microscopy excels on high-brightness sources, such as the Advanced Light Source and ELETTRA, where there is a good match between source optics phase spaces. In these conditions, diffraction-limited operation becomes possible with large flux. We will discuss development of second-generation x scanning spectromicroscope; an evolution MAXIMUM project at University Wisconsin. The new tool called SuperMAXIMUM be installed ELETTRA in Trieste, Italy.
Two bendable elliptical cylinder mirrors arranged in a Kirkpatrick-Baez (KB) geometry are installed at the Nanospectroscopy beamline ELETTRA for refocusing soft x-rays provided by an APPLE II type undulator. This achromatic focusing device delivers beam to micrometer-scale, high photon density spot, which is source Spectroscopic Photoemission and Low Energy Electron Microscope (SPELEEM). A similar second pair of KB will refocus monochromated light experimental station different imaging...
An important application of photoemission spectromicroscopy would be to measure heterostructures and semiconductor devices in cross section directly determine band offsets bending. We present here studies p-n GaAs homojunctions Al/GaAs Schottky junctions fabricated by molecular-beam epitaxy. Our results suggest that a minimum experimental uncertainty about 0.15 eV will effect offset determination. In general, useful quantitative information on the junction electrostatics can obtained...
High brightness, third-generation synchrotrons allow diffraction-limited performance and large flux for scanning photoemission microscopes. A new microscope, SuperMAXIMUM, is being developed at the University of Wisconsin Center X ray Lithography in collaboration with Sincrotrone Trieste. The beamline, built Trieste, uses a variable angle spherical grating monochromator (VASGM). combination rotation plane mirror keeps slit positions beam directions fixed. microscope objectives are...
The interest of the scientific community in use synchrotron radiation has become higher and with improvement instrumentation publication better results. For this reason, concept standard beamline could not be used anymore, a lot solutions must considered to satisfy requests different users. A very important part these "solutions" involves mirrors, gratings crystals adopted carry out light from source experimental chamber. In last years, for instance, we have seen an increased mechanically...
Using (secondary) photoelectron emission microscopy, we studied the fully formed 80 Å Pt/n–GaP(001) interface with a lateral resolution better than 2 μm. We probed chemically etched and sulfur passivated GaP(001) surface by ultraviolet soft x rays. The radiation source was either deuterium lamp or from ELETTRA’s U12.5 undulator. Due to their escape depth, photoemitted secondary electrons carry chemical information of buried interfaces. use tunable synchrotron enabled us obtain contrast...
Picosecond-long x-ray pulses of moderate intensity and high repetition rate are highly sought after by the light sources community, e.g. for time-resolved investigations matter in linear response regime. We investigate upgrade a diffraction-limited storage ring source to short X-ray pulse scheme. Short emitted electron bunches magnetically compressed injection chain, with no impact on simultaneous standard emission from long bunches. The ultimate performance, limits operational aspects...
A natural application of the emerging technique photoemission microscopy to study semiconductor interfaces involves measuring a device in cross section directly determine heterojunction parameters. We present here results on p–n GaAs homojunctions, which served as prototype system demonstrate applicability this buried interfaces. also describe preliminary measurements electrostatic potential profile across Al/GaAs Schottky junctions.
The Long Trace Profiler (LTP) has proved to be one of the major metrological aids for characterization synchrotron radiation optics. Currently optical components installed at beamlines face higher and demands, requiring a precise calibration control measuring conditions. One important parameter considered while scanning is temperature drifts afflicting sessions. We will review our experiences about influence this on LTP ability in very accurate surfaces. It possible discriminate least four...