A5023360185- Thin-Film Transistor Technologies
- ZnO doping and properties
- Ferroelectric and Piezoelectric Materials
- Copper-based nanomaterials and applications
- Advanced Memory and Neural Computing
- Analytical Chemistry and Sensors
- Advanced materials and composites
- Solar-Powered Water Purification Methods
- Thermal and Kinetic Analysis
- Polymer-Based Agricultural Enhancements
- Advanced MEMS and NEMS Technologies
- Hydrogels: synthesis, properties, applications
- Photonic Crystals and Applications
- Photonic and Optical Devices
- Glass properties and applications
- Photorefractive and Nonlinear Optics
- Magnetic and transport properties of perovskites and related materials
- Optical measurement and interference techniques
- Phase-change materials and chalcogenides
- Gas Sensing Nanomaterials and Sensors
- Surface Roughness and Optical Measurements
- Advanced Condensed Matter Physics
- Semiconductor Lasers and Optical Devices
- Semiconductor materials and devices
University of Naples Federico II
2024
Institute for Microelectronics and Microsystems
2006-2010
Nello Carrara Institute of Applied Physics
2010
Institute for Chemical and Physical Processes
2010
Peter the Great St. Petersburg Polytechnic University
2010
University of Reggio Calabria
2007
Istituto Motori
2005
Eni (Italy)
1994
In this paper, the optical dispersion properties and Raman gain of sodium phosphate glasses containing niobium oxide at increasing concentrations have been systematically investigated, with aim establishing a potential enhancement its bandwidth respect to silica. A broadening higher peak (approximately 17 times) than in silica glass observed high molar content. Our findings point out that sodium–niobium–phosphate could be utilized for realization amplifiers.
In this work we investigate the possibility to use Zinc Oxide (ZnO) thin films, deposited by RF magnetron sputtering, for realization of integrated optical structures working at 1550 nm. Structural properties sputtered zinc oxide films were studied means X-ray Diffraction (XRD) measurements, while investigated spectrophotometry and Spectroscopic Ellipsometry (SE). particular, ellipsometric measurements allowed determine dispersion law ZnO complex refractive index (see manuscript) = n - jk...
New active photonic components are proposed which exploit two amorphous silicon and related alloys optoelectronic peculiarities. In particular the thermo-optic effect photoinduced absorption at infrared wavelengths employed to design respectively a spatial switch light amplitude modulator. Both devices integrated within on SiO/sub 2/ waveguide.
In this paper is reported a method for measuring the thickness of silicone nitride layers employed fabricating silicon MEMS bi-morph structures. The allows precise evaluation layer by adopting Digital Holographic Microscope. measurement based on fact that transparent to visible light. optical phase difference (OPD) between light beam traveling through and portion in air measured exploiting an interferometric technique. approach very simple can be utilized even inspection non-planar or...