Wenbin Li

ORCID: 0009-0007-5341-4193
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About
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Research Areas
  • Metal and Thin Film Mechanics
  • X-ray Spectroscopy and Fluorescence Analysis
  • Electrocatalysts for Energy Conversion
  • Fuel Cells and Related Materials
  • Advanced X-ray Imaging Techniques
  • Advanced battery technologies research
  • Semiconductor materials and interfaces
  • Ion-surface interactions and analysis
  • Integrated Circuits and Semiconductor Failure Analysis
  • Diamond and Carbon-based Materials Research
  • Copper Interconnects and Reliability
  • Semiconductor materials and devices
  • Silicon and Solar Cell Technologies
  • Service-Oriented Architecture and Web Services
  • Advanced Surface Polishing Techniques
  • Semantic Web and Ontologies
  • Magnetic properties of thin films
  • ZnO doping and properties
  • Boron and Carbon Nanomaterials Research
  • Microstructure and mechanical properties
  • Electron and X-Ray Spectroscopy Techniques
  • Astrophysical Phenomena and Observations
  • Plasmonic and Surface Plasmon Research
  • Cultural Heritage Materials Analysis
  • Magnesium Alloys: Properties and Applications

RWTH Aachen University
2025

Tongji University
2012-2024

Westlake University
2021

Xi'an University of Technology
2021

Sichuan Normal University
2021

Wuhan Textile University
2020

Rice University
2019

Nankai University
2014

Institute of Precision Mechanics
2013

Shanghai Jiao Tong University
2013

We achieved fully-printed SnO 2 based n-type thin-film transistors with high electrical performance and robust mechanical flexibility, promising for constructing low-cost, high-performance flexible electronic devices circuits.

10.1039/d1tc01512e article EN Journal of Materials Chemistry C 2021-01-01

In this study, to explore the impact of nitrogen on chemical composition, morphology, microstructure, as well intrinsic stress titanium films, nitrogen-doped thin films prepared by direct current reactive magnetron sputtering, with different ratio doping into Argon gas, have been characterized. After check grazing incidence X-ray reflectometry (GIXR), thickness all samples were ensured be approximately 40 nm. Using photoelectron spectroscopy (XPS) combined diffraction (XRD), atoms found...

10.1016/j.rinp.2020.103416 article EN cc-by-nc-nd Results in Physics 2020-09-17

B4C/Pd multilayers with small d-spacing can easily degrade in the air, and exact degradation process is not clear. In this work, we studied chemical modification of B4C films double layers stored four different environments: a dry nitrogen environment, atmosphere, oxygen-rich wet environment. The XANES spectra placed environment showed most significant decrease σ* states B–C bonds an increase π* B–O compared other samples. X-ray photoelectron spectroscopy (XPS) measurements samples more...

10.3390/ma14051319 article EN Materials 2021-03-09

The capacity of Lithium-ion batteries degrades over the time, making accurate prediction their Remaining Useful Life (RUL) crucial for maintenance and product lifespan design. However, diverse aging mechanisms, changing working conditions cell-to-cell variation lead to inhomogeneous cell complicated life prediction. In this work, a data-driven algorithm based on stacked Long Short Term Memory (LSTM) encoder–decoders is proposed RUL encoder upstream decoder form an autoencoder framework...

10.3390/batteries11050194 article EN cc-by Batteries 2025-05-14

The geometrical factor in the grazing incident x-ray fluorescence analysis is an important angle-dependent term, which can have a great effect on measured data. In this paper, effects of florescence yield been demonstrated. A formula presented to estimate factor, includes experimental parameters beam and setup. validity proven by good agreement between calculated yields with results analysis.

10.1063/1.4722495 article EN Review of Scientific Instruments 2012-05-01

V/Sc multilayer is experimentally demonstrated for the first time as a high reflectance mirror soft X-ray water window region. It primarily works at above Sc-L edge (λ = 3.11 nm) under near normal incidence while second peak appears V-L 2.42 grazing incidence. The fabricated with d-spacing of 1.59 nm and 30 bilayers has smaller interface width (σ 0.27 0.32 than conventional used Cr/Sc 0.28 0.47 nm). For bilayers, introduction B4C barrier layers little improvement on structure. As number...

10.1038/s41598-017-13222-5 article EN cc-by Scientific Reports 2017-10-04

Ru/B4C multilayer mirrors are used for hard X-ray monochromators with moderate spectral resolution and high integral flux. To overcome the problem of large compressive stress inherent in multilayers, a reactive sputtering technique using mixture working gas argon nitrogen different partial pressures was tested, fabricated multilayers had period 3 nm. The intrinsic essentially reduced after nitridation relaxed to zero value at approximately 15% pressure gas. Interface roughness slightly...

10.1364/oe.26.021803 article EN cc-by Optics Express 2018-08-08

An on‐chip spectral surface plasmon resonance (SPR) optical sensor with a silver nanoparticle (Ag NP) array has been designed. Dextran (Dex)‐capped Ag NP (Dex‐Ag arrays were initially self‐assembled on the gold (Au) sensing film. The large perturbations and increased penetration depth of evanescent field, which is caused by use Dex‐Ag Au film, can effectively enhance SPR shift response. Compared bare film configuration, configuration improves sensitivity from 5492 to 6613 nm/RIU.

10.1049/mnl.2014.0203 article EN Micro & Nano Letters 2014-09-01

Abstract The microstructure evolution of magnetron-sputtered Ni/C multilayers was investigated by varying the Ni and C layer thickness in region a few nanometers. For samples having 2.6-nm-thick layers, interface width increases from 0.37 to 0.81 nm as decreases 4.3 1.3 nm. Especially for with layers less than 2.0 nm, changes significantly due discontinuously distributed crystallites. 2.8-nm-thick 0.59 when 0.7 microstructures varied is explained based on proposed simple growth model layers.

10.1038/srep31522 article EN cc-by Scientific Reports 2016-08-12

Short-period (~3.5 nm) Co/C multilayer mirrors are fabricated by the direct current magnetron sputtering technique through addition of a small proportion nitrogen (4-15% partial pressure) to working gas (Ar). The has been demonstrated significantly suppress interdiffusion neighboring materials due nitridation carbon layers as compared with use pure Ar. optimal pressure was found be 6%. At this pressure, provides abrupt interfaces and maximal peak value (19%) s-polarized radiation...

10.1364/oe.24.027166 article EN cc-by Optics Express 2016-11-14

X-ray standing waves generated by periodic multilayers have been used to characterize the interface microstructures of Ti/Ni/Ti trilayers based on reflectivity (XRR) and grazing incidence fluorescence (GIXRF) methods. For Ni layer having thickness 1.7 nm, it is observed that roughness Ti-on-Ni 0.64 nm Ni-on-Ti 0.40 which can be explained an additional induced nucleation crystallites when at amorphous-to-crystalline transition region. 3.3 beyond this region, 0.42 0.46 consistent with...

10.1021/am3024614 article EN ACS Applied Materials & Interfaces 2012-12-17

Optical design of nested conical Wolter I X-ray telescope covering energy band from 1 to 30 keV is investigated systematically.Recurrence relation the structure deduced, and impact initial parameters on performance analyzed.Due need for hard astronomical observations in China, presented, which six groups W/B4C aperiodic multilayer coatings between innermost outermost shell mirror are designed.The effective area, resolution, field view calculated simulation.The results show that area can...

10.3788/col201210.103401 article EN Chinese Optics Letters 2012-01-01

Two kinds of Al/Zr (Al(1%wtSi)/Zr and Al(Pure)/Zr) multilayers in the region 17-19nm were deposited on fluorine doped tin oxide coated glass by using direct-current magnetron sputtering technology. Based fitting data grazing incident X-ray reflection near-normal (EUV) reflectance, interfacial roughness Al(1%wtSi)/Zr is lower than that Al(Pure)/Zr because presence silicon Al. For further characterization multilayers, six samples Si substrates annealed from 100 °C to 500 temperature a vacuum...

10.1088/1742-6596/425/15/152010 article EN Journal of Physics Conference Series 2013-03-22

Abstract Metasurface absorber (MA) has been a research hotspot in the field of artificial electromagnetic structural material due to its dual advantages high performance and compact design. Usually, design MA depends on designer's professional knowledge, experience physical inspiration. The desired optical response can be obtained by using simulation software carry out hundreds or thousands numerical calculations. Thus, it is still challenge quickly retrieve optimal structure according...

10.1002/adts.202100338 article EN Advanced Theory and Simulations 2021-12-07

X‐ray absorption spectroscopy at the Co K edge was applied to investigate chemical environment of atoms inside Co/Mo 2 C periodic multilayers. The results show a mixing between and Mo layers prior any annealing process, whereas following from 300 °C pure are observed. in agreement with previous nuclear magnetic resonance results. They indicate that content increases upon annealing, while it is absent as‐deposited samples. comparison results, based on analysis data obtained multilayer samples...

10.1002/sia.6116 article EN Surface and Interface Analysis 2016-11-09
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