A5018678745- Force Microscopy Techniques and Applications
- Advanced biosensing and bioanalysis techniques
- Mechanical and Optical Resonators
- Photonic and Optical Devices
- Near-Field Optical Microscopy
- Surface and Thin Film Phenomena
- Photosynthetic Processes and Mechanisms
- Electrochemical Analysis and Applications
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Fluorescence Microscopy Techniques
- Analytical Chemistry and Sensors
- Advanced Electron Microscopy Techniques and Applications
- Microtubule and mitosis dynamics
- Supramolecular Self-Assembly in Materials
- Plasmonic and Surface Plasmon Research
- Advancements in Photolithography Techniques
- Nanoparticle-Based Drug Delivery
- Lipid Membrane Structure and Behavior
- Semiconductor Lasers and Optical Devices
- Advanced Semiconductor Detectors and Materials
- Semiconductor Quantum Structures and Devices
- Block Copolymer Self-Assembly
- Electron and X-Ray Spectroscopy Techniques
- Polymer Surface Interaction Studies
- Copper Interconnects and Reliability
École Polytechnique Fédérale de Lausanne
2018-2021
Max Planck Institute of Molecular Cell Biology and Genetics
2021
École Centrale de Lille
2015-2019
Centre National de la Recherche Scientifique
2015-2019
Institut d'électronique de microélectronique et de nanotechnologie
2015-2019
Université de Lille
2015-2019
Nanocharacterization plays a vital role in understanding the complex nanoscale organization of cells and organelles. Understanding cellular function requires high-resolution information about how structures evolve over time. A number techniques exist to resolve static structure great detail (super-resolution optical microscopy, EM, AFM). However, time-resolved imaging tend either have lower resolution, are limited small areas, or cause damage cells, thereby preventing long-term time-lapse...
Sputtered TiN bifunctional thin films have been deposited in order to act simultaneously as a current collector for the negative electrode and lithium ion diffusion barrier Li-ion microbattery fabricated on silicon wafer. parameters optimized reach dense columnar morphology with no void low surface roughness. For at 450°C, resistivity is close 105 μohm·cm. The normalized capacity of film (0.16 μAh/cm2·μm−1) one magnitude lower than lowest reported capacities (either by sputtering technique...
Imaging living cells by atomic force microscopy (AFM) promises not only high-resolution topographical data, but additionally, mechanical contrast, both of which are obtainable with other techniques. Such imaging is however challenging, as need to be measured low interaction forces prevent either deformation or detachment from the surface. Off-resonance modes periodically probe surface have been shown advantageous, they provide excellent control combined large amplitudes, help reduce lateral...
Abstract Understanding hierarchical self‐assembly of biological structures requires real‐time measurement the process over a broad range length‐ and timescales. The success high‐speed atomic force microscopy (HS‐AFM) in imaging small‐scale molecular interactions has fueled attempts to introduce this method as routine technique for studying artificial processes. Current state‐of‐the‐art HS‐AFM scanners achieve their high speed by trading achievable field view bandwidth. This limits...
Abstract Discovering mechanisms governing organelle assembly is a fundamental pursuit in biology. The centriole an evolutionarily conserved with signature 9-fold symmetrical chiral arrangement of microtubules imparted onto the cilium it templates. first structure nascent centrioles cartwheel, which comprises stacked SAS-6 ring polymers emerging orthogonal to surface surrounding each resident centriole. through polymerization ensures architecture remain elusive. We deploy...
The introduction of scanning microwave microscopy (SMM) tools have pioneered many applications, notably including mapping and quantitative measurement the electrical properties materials devices at micro nano scale. ability to measure accurately in a sensitive manner high impedance nanoscale is mainly related strategy used match AFM probe close 50 Ω vector network analyzer (VNA). Different configurations homemade interferometric matching inserted between VNA are studied. Measurement...
This paper presents the full modeling and a methodology for de-embedding interferometric scanning microwave microscopy measurements by means of dopant profile calibration. A Si calibration sample with different boron-doping level areas is used to that end. The analysis experimentally obtained S11 amplitudes based on proposed model confirms validity methodology. As specific finding, changes in tip radius between new tips have been clearly identified, leading values effective range 45 nm 85...
Discovering the physical principles directing organelle assembly is a fundamental pursuit in biology. Centrioles are evolutionarily conserved organelles with 9-fold rotational symmetry of chiral microtubules imparted onto cilia they template 1 . Centriole assemble from likewise symmetrical ring polymers SAS-6 proteins, orthogonal to toroidal surface surrounding resident centriole 2–4 How properties ensure proper and arrangement not known. Here, we deployed photothermally-actuated...
In this work, we report on the integration of an atomic force microscope (AFM) into a helium ion (HIM). The HIM is powerful instrument, capable imaging and machining nanoscale structures with sub-nanometer resolution, while AFM well-established versatile tool for multiparametric characterization. Combining two techniques opens way unprecedented in situ correlative analysis at nanoscale. Nanomachining can be performed without contamination sample environmental changes between processing...
OpenSPIM is an Open Access platform for Selective Plane Illumination Microscopy (SPIM) and allows hundreds of laboratories around the world to generate process light-sheet data in a cost-effective way due open-source hardware software. While setting up basic configuration can be achieved expeditiously, correctly assembling operating more complex configurations challenging routine standard users. Detailed instructions on how equip with two illumination sides detection axes (X-OpenSPIM) are...
Near-field scanning microwave microscopy (NSMM) is a probe (SPM) technique that measures the local interaction of evanescent microwaves with sample using sharp tip probe. The traceability in NSMM still challenging as distribution electrical fields affected by several parameters. In this effort, finite element method (FEM) based electromagnetic modeling methods are used to study effects wavelength operation and humidity on spatial resolutions respectively. From simulated data, it demonstrated...
In article number 1900031 by Georg E. Fantner and co-workers, a robust controller design in atomic force microscopy, relying on optimization experimental data, is able to identify correct the resonances that appear when imaging at high speed, even liquid environment. This technology used record real time self-assembly of blunt-end DNA tripods into large hexagonal lattices.
Nanocharacterization plays a vital role in understanding the complex nanoscale organization of cells and organelles. Understanding cellular function requires high-resolution information about how structures evolve over time. A number techniques exist to resolve static structure great detail (super-resolution optical microscopy 1 , EM 2 AFM 3 ). However, time-resolved imaging tend either have lower resolution, are limited small areas, or cause damage thereby preventing long-term time-lapse...
Imaging living cells by atomic force microscopy (AFM) promises not only high-resolution topographical data, but additionally, mechanical contrast, which are obtainable with other techniques. Such imaging is however challenging, as need to be measured low interaction forces prevent either deformation or detachment from the surface. Off-resonance modes periodically probe surface have been shown advantageous, they provide excellent control combined large amplitudes, help reduce lateral...
In this work, we report the integration of an atomic force microscope (AFM) into a helium ion (HIM). The HIM is powerful instrument, capable sub-nanometer resolution imaging and machining nanoscale structures, while AFM well-established versatile tool for multiparametric characterization. Combining two techniques opens way unprecedented, in situ, correlative analysis at nanoscale. Nanomachining can be performed without contamination sample environmental changes between processing steps....