Karel Appels

ORCID: 0000-0002-4199-6233
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About
Contact & Profiles
Research Areas
  • Radiation Effects in Electronics
  • Physical Unclonable Functions (PUFs) and Hardware Security
  • Low-power high-performance VLSI design
  • Interconnection Networks and Systems
  • Particle Detector Development and Performance
  • VLSI and Analog Circuit Testing
  • Embedded Systems Design Techniques

KU Leuven
2019-2024

This paper presents a novel scalable physical implementation method for high-speed Triple Modular Redundant (TMR) digital integrated circuits in radiation-hard designs. The uses distributed placement strategy compared to commonly used bulk 3-bank constraining method. TMR netlist information is optimally constrain the of both sequential cells and combinational cells. approach significantly reduces routing complexity, net lengths dynamic power consumption with more than 60% 20% respectively....

10.3390/electronics8040432 article EN Electronics 2019-04-14

Abstract Single-event effects and hardware security show close similarities in terms of vulnerabilities mitigation techniques. Secure processors address physical attacks from the outside, such as external laser stimulation, to compromise program extract sensitive information systems. To overcome this vulnerability, secure extensions architecture are often built into modern processor cores. Given limited design resources found space or high-energy physics experiment development teams, article...

10.1088/1748-0221/19/06/c06009 article EN Journal of Instrumentation 2024-06-01

This paper presents a novel physical implementation methodology for high-speed Triple Modular Redundant (TMR) digital integrated circuits harsh radiation environment applications. An improved distributed approach is presented to constrain redundant branches of logic cells using repetitive, interleaved micro-floorplans. To optimally the placement both sequential and combinational cells, TMR netlist used segment into unrelated groups allowing sharing without compromising reliability. The...

10.3390/electronics9111936 article EN Electronics 2020-11-17
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