A5108492647- Electron and X-Ray Spectroscopy Techniques
- X-ray Spectroscopy and Fluorescence Analysis
- Semiconductor materials and devices
- Surface and Thin Film Phenomena
- Atomic and Molecular Physics
- Advanced Chemical Physics Studies
- Nuclear Physics and Applications
- Corrosion Behavior and Inhibition
- Laser-Matter Interactions and Applications
- X-ray Diffraction in Crystallography
- Ion-surface interactions and analysis
- Particle physics theoretical and experimental studies
- Radioactive Decay and Measurement Techniques
- Laser-induced spectroscopy and plasma
- Radiation Detection and Scintillator Technologies
- Crystallography and Radiation Phenomena
- Integrated Circuits and Semiconductor Failure Analysis
- Quantum Chromodynamics and Particle Interactions
- Advancements in Photolithography Techniques
- Copper Interconnects and Reliability
- Nuclear physics research studies
- Scientific Measurement and Uncertainty Evaluation
- Image Processing Techniques and Applications
- Iron oxide chemistry and applications
- Advanced Image Processing Techniques
HUN-REN Institute for Nuclear Research
2000-2022
Hungarian Academy of Sciences
2000-2014
The angular distribution of the Xe $5s$ photoelectrons was measured in 90--225 eV photon energy range using linearly polarized synchrotron radiation. experimentally determined parameters were compared with theoretical values obtained from calculations based on random-phase approximation and time-dependent density-functional theory. Experiment shows that dipole (\ensuremath{\beta}) nondipole (\ensuremath{\gamma}) vary strongly as a function energy, accordance account for interchannel...
Abstract The surface excitation produced by impinging or escaping electrons is a competitive process to elastic backscattering. It affects the intensity of Auger and XPS peaks characterized parameter P se . This appears in loss peak I ( E pls ), possibly plasmon. In our work defined as ratio probability create plasmon/elastic scattering deduced from integrated peak, respectively. Our procedure based on reflection electron energy spectroscopy spectra K λ i inelastic cross‐section mean free...
Abstract A brief overview is given on several aspects of applications the Monte Carlo (MC) simulation method to surface‐related electron spectroscopy and microscopy. For MC modeling interaction with solids, inelastic scattering cross section calculated by use bulk dielectric function optical constants in a functional approach. This has enabled systematic reproductions experimental energy distributions backscattered electrons for number elemental materials. An improved calculation...
Abstract Reference samples are needed for experimental determination of the inelastic mean free path (IMFP) electrons by elastic peak electron spectroscopy (EPES). High‐quality (microcrystalline mirror) Ni reference were used IMFP measurements. For surface excitation parameter experiments, new types needed. They should exhibit pronounced surface‐loss spectra, such as amorphous Ge (aGe), Sn and Ag. A procedure is presented their preparation. Microcrystalline Ag deposited on highly polished...
Abstract The inelastic mean free path (IMFP) of electrons was determined using elastic peak electron spectroscopy (EPES) with Cu, Si, Ag, Ni and Au reference samples. Systematic differences occurred between the experimental calculated (TPP‐2M) (Tanuma, Powell, Penn) IMFPs, which can be ascribed partly to surface losses. IMFP deduced from integrated ratio sample reference. Experiments were made ESA 31 (ATOMKI) DESA 100 (Staib) spectrometers, covered E = 0.2–2 keV energy range. results...
The double differential cross-sections of outer s-shells photoelectrons have been measured for noble gases He, Ne, Ar, Kr, Xe and the H2 molecule by linearly polarized photons. A nonzero left–right asymmetry has observed relative to mirroring plane that is perpendicular polarization direction photon beam.
Abstract The consistency and accuracy of inelastic electron mean free paths (IMFPs) determined from comparison the intensity elastically reflected electrons with theoretical calculations were studied. variation experimental geometry, spectrometer energy resolution procedure for background subtraction was Four different types spectrometers— double pass cylindrical mirror analyser (CMA) pre‐retarded CMA, hemispherical (HSA) retarding field (RFA)— widely geometries resolutions, placed in four...
The angular distribution of the Kr $4p$ photoelectrons was investigated in photon energy range $(3d){}^{\ensuremath{-}1}\ensuremath{\rightarrow}\mathit{np}$ resonant excitations. experimental dipole ($\ensuremath{\beta}$) and nondipole ($\ensuremath{\gamma}$ $\ensuremath{\delta}$) anisotropy parameters were determined for spin-orbit components shell. A simple theoretical model developed description photoionization excitation processes. An interference effect observed between direct...
Considerable chemical effects have been found on the satellite structures of F KLL Auger spectra in fluorides recently, which could be important for surface identification and provide information origin atomic or molecular character particular lines. In case alkali unassigned satellites were interpreted basis a new concept, resonant orbital rearrangement. present work we study structure induced from rutile-type fluorides. excited by Al Kα Cu Lα x-rays polycrystalline powder samples MgF2,...
Abstract In elastic peak electron spectroscopy (EPES), the nearest vicinity of in low kinetic energy region reflects inelastic and quasielastic processes. Incident electrons produce surface excitations, inducing plasmons, with corresponding loss peaks separated by 1–20 eV from peak. this work, X‐ray photoelectron (XPS) helium pycnometry are applied for determining atomic composition bulk density, whereas force microscopy (AFM) is morphology roughness. The component due to recoil on hydrogen...
The energy distribution of the electrons backscattered in direction surface normal polycrystalline silver samples was studied using reflected electron loss spectroscopy (REELS) at 200 eV and 2 keV primary beam energies. For modeling scattering processes, Monte Carlo simulation technique used REELS spectra were calculated various (25°, 50° 75°, with respect to normal) angles incidence. effects process are evaluated from comparison experimental simulated spectra.
The angular distribution of Kr 4p photoelectrons was measured with linearly polarized synchrotron radiation in the function photon energy. shape distributions indicates presence octupol interaction.
Application of x-ray photoelectron spectroscopy, Auger electron spectroscopy and energy loss for quantitative characterisation surfaces requires knowledge the inelastic mean free path its dependence. Inelastic values have been determined a wide variety solids using theoretical experimental methods. However, number published polymers is limited. In principle, these can be estimated predictive formulae such as TPP-2M G1 formula Gries. An alternative method determination in elastic peak...