A5068056312- Advanced X-ray Imaging Techniques
- X-ray Spectroscopy and Fluorescence Analysis
- Advanced Electron Microscopy Techniques and Applications
- Force Microscopy Techniques and Applications
- Mechanical and Optical Resonators
- Electron and X-Ray Spectroscopy Techniques
- Quantum, superfluid, helium dynamics
- Physics of Superconductivity and Magnetism
- Atomic and Subatomic Physics Research
- Cold Atom Physics and Bose-Einstein Condensates
- Iron-based superconductors research
- Acoustic Wave Resonator Technologies
- Superconductivity in MgB2 and Alloys
- Laser-Plasma Interactions and Diagnostics
- Advanced MEMS and NEMS Technologies
- Astrophysical Phenomena and Observations
- Thermal properties of materials
- Advanced X-ray and CT Imaging
- High-pressure geophysics and materials
- Digital Holography and Microscopy
- Rare-earth and actinide compounds
- Advanced Surface Polishing Techniques
- Magnetic properties of thin films
- Advanced Semiconductor Detectors and Materials
- Particle Accelerators and Free-Electron Lasers
National Synchrotron Light Source II
2013-2024
Brookhaven National Laboratory
2015-2024
Upton Hospital
2019
Argonne National Laboratory
2011-2016
Los Alamos National Laboratory
2005-2012
University of Illinois Chicago
2011
The Ohio State University
2006
Cornell University
2002-2005
University of Bayreuth
1996-2000
Multilayer Laue lenses are volume diffraction elements for the efficient focusing of X-rays. With a new manufacturing technique that we introduced, it is possible to fabricate sufficiently high numerical aperture (NA) achieve focal spot sizes below 10 nm. The alternating layers materials form lens must span broad range thicknesses on nanometer scale necessary X-ray deflection angles required NA. This poses challenge both accuracy deposition process and control properties, which often vary...
The focusing performance of a multilayer Laue lens (MLL) with 43.4 μm aperture, 4 nm finest zone width and 4.2 mm focal length at 12 keV was characterized X-rays using ptychography method. reconstructed probe shows full-width-at-half-maximum (FWHM) peak size 11.2 nm. obtained X-ray wavefront excellent agreement the dynamical calculations, exhibiting aberrations less than 0.3 wave period, which ensures MLL capable producing diffraction-limited focus while offering sufficient working distance....
Abstract We report multimodal scanning hard x-ray imaging with spatial resolution approaching 10 nm and its application to contemporary studies in the field of material science. The high is achieved by focusing x-rays two crossed multilayer Laue lenses raster-scanning a sample respect nanofocusing optics. Various techniques are used characterize verify focus size resolution. realized utilizing simultaneously absorption-, phase-, fluorescence-contrast mechanisms. combination enables...
Abstract We report an experimental ptychography measurement performed in fly-scan mode. With a visible-light laser source, we demonstrate 5-fold reduction of data acquisition time. By including multiple mutually incoherent modes into the incident illumination, high quality images were successfully reconstructed from blurry diffraction patterns. This approach significantly increases throughput ptychography, especially for three-dimensional applications and visualization dynamic systems.
A hard X-ray scanning microscope installed at the Hard Nanoprobe beamline of National Synchrotron Light Source II has been designed, constructed and commissioned. The relies on a compact, high stiffness, low heat dissipation approach utilizes two types nanofocusing optics. It is capable imaging with ∼15 nm × 15 spatial resolution using multilayer Laue lenses 25 26 zone plates. Fluorescence, diffraction, absorption, differential phase contrast, ptychography tomography are available as...
III-As nanowires are candidates for near-infrared light emitters and detectors that can be directly integrated onto silicon. However, nanoscale to microscale variations in structure, composition, strain within a given nanowire, as well between nanowires, pose challenges correlating microstructure with device performance. In this work, we utilize coherent nanofocused X-rays characterize stacking defects single InGaAs nanowire supported on Si. By reconstructing diffraction patterns from the...
Full field transmission X-ray microscopy (TXM) is a powerful technique for non-destructive 3D imaging with nanometer-scale spatial resolution. However, to date, the typical acquisition time hard TXM at synchrotron facility >10 min nano-tomography dataset sub-50 nm This significant limit on types of dynamics that can be investigated using this technique. Here, we present demonstration one-minute achievement made possible an in-house designed and commissioned instrument Full-field...
Hard X-ray microscopy is a prominent tool suitable for nanoscale-resolution non-destructive imaging of various materials used in different areas science and technology. With an ongoing effort to push the 2D/3D resolution down 10 nm hard regime, both fabrication nano-focusing optics stability microscope using those become extremely challenging. In this work system designed constructed accommodate multilayer Laue lenses as nanofocusing presented. The developed apparatus has been thoroughly...
The highly convergent x-ray beam focused by multilayer Laue lenses with large numerical apertures is used as a three-dimensional (3D) probe to image layered structures an axial separation larger than the depth of focus. Instead collecting weakly scattered high-spatial-frequency signals, depth-resolving power provided purely intense central cone diverged from beam. Using multi-slice ptychography method combined on-the-fly scan scheme, two layers nanoparticles separated 10 μm are successfully...
Trees are used by animals, humans and machines to classify information make decisions. Natural tree structures displayed synapses of the brain involves potentiation depression capable branching is essential for survival learning. Demonstration such features in synthetic matter challenging due need host a complex energy landscape learning, memory electrical interrogation. We report experimental realization tree-like conductance states at room temperature strongly correlated perovskite...
We developed a scanning hard x-ray microscope using new class of nano-focusing optic called multilayer Laue lens and imaged chromosome with nanoscale spatial resolution. The combination the x-ray's superior penetration power, high sensitivity to elemental composition, spatial-resolution quantitative analysis creates unique tool capabilities that other microscopy techniques cannot provide. Using this microscope, we simultaneously obtained absorption-, phase-, fluorescence-contrast images...
Synchrotron based x-ray microscopy established itself as a prominent tool for noninvasive investigations in many areas of science and technology. Many facilities around the world routinely achieve sub-micrometer resolution with few instruments capable imaging spatial better than 100 nm. With an ongoing effort to push 2D/3D down 10 nm hard regime both fabrication nano-focusing optics stability microscope become extremely challenging. In this work we present our approach overcome technical...
For scanning x-ray microscopy, many attempts have been made to image the phase contrast based on a concept of beam being deflected by specimen, so-called differential imaging (DPC). Despite successful demonstration in number representative cases at moderate spatial resolutions, these methods suffer from various limitations that preclude applications DPC for ultra-high resolution imaging, where emerging wave field focusing optic tends be significantly more complicated. In this work, we...
We discuss misalignment-induced aberrations in a pair of crossed multilayer Laue lenses used for achieving nanometer-scale x-ray point focus. thoroughly investigate the impacts two most important contributions, orthogonality and separation distance between lenses. find that misalignment results astigmatism at 45° other inclination angles when coupled with error. Theoretical explanation experimental verification are provided. show to achieve diffraction-limited focus, accurate alignment...
Here, a recently commissioned five-analyzer Johann spectrometer at the Inner Shell Spectroscopy beamline (8-ID) National Synchrotron Light Source II (NSLS-II) is presented. Designed for hard X-ray photon-in/photon-out spectroscopy, achieves resolution in 0.5–2 eV range, depending on element and/or emission line, providing detailed insights into local electronic and geometric structure of materials. It serves diverse user community, including fields such as physical, chemical, biological,...
We report our experiences with conducting ptychography simultaneously the X-ray fluorescence measurement using on-the-fly mode for efficient multi-modality imaging. demonstrate that periodic artifact inherent to raster scan pattern can be mitigated a sufficiently fine step size provide an overlap ratio of >70%. This allows us obtain transmitted phase contrast images enhanced spatial resolution from while maintaining imaging continuous-motion scans on pixelated grids. capability will...
X-rays are intrinsically capable of being used for the study non-periodic objects with atomic resolution, high penetration, in applied electromagnetic fields, and fluids gases. For direct imaging via nanofocused X-ray beams, reflective [1 K. Yamauchi, Journal Physics: Condensed Matter 23(39), 394206 (2011).[Crossref], [PubMed], [Web Science ®] , [Google Scholar]], refractive [2 C.G. Schroer, Applied Physics Letters 87(12), 124103–3 (2005).[Crossref], diffractive [3 Burkhard, 23(8), 083002...
We report on the fabrication and characterization of a wedged multilayer Laue lens for x-ray nanofocusing. The was fabricated using sputtering deposition technique, in which specially designed mask employed to introduce thickness gradient lateral direction multilayer. X-ray shows an efficiency 27% focus size 26 nm at 14.6 keV, good agreement with theoretical calculations. These results indicate that desired wedging is achieved structure. anticipate continuous development MLLs will advance...
A transmission X-ray microscope has been designed and commissioned at the 18-ID Full-field Imaging beamline National Synchrotron Light Source II. This instrument operates in 5-11 keV range, and, with current set of optics, is capable 30 nm spatial resolution imaging, a field view about 40 μm. For absorption contrast, minimum exposure time for single projection image 20 ms an entire 3D tomography data can be acquired under 1 min. The system enables tomographic reconstructions sub-50 without...
We have developed an experimental approach to bond two independent linear Multilayer Laue Lenses (MLLs) together. A monolithic MLL structure was characterized using ptychography at 12 keV photon energy, and we demonstrated nm 24 focusing in horizontal vertical directions, respectively. Fabrication of 2D optics allows installation these elements more conventional microscopes suitable for x-ray imaging zone plates, opens easier access with high spatial resolution the hard regime.
Solid-state interfacial dealloying creates bi-continuous nanostructured thin films with 3D interconnected morphology, revealed by multimodal characterization, offering potential applications in catalysis, biomedical sensing and energy storage.
Fresnel zone plates are widely used for x-ray nanofocusing, due to their ease of alignment and energy tunability. Their spatial resolution is limited in part by outermost width
We report nanoscale scanned probe ferromagnetic resonance force microscopy (FMRFM) imaging of individual microstructures. This reveals the mechanism for high spatial resolution in FMRFM imaging: strongly inhomogeneous local magnetic field cantilever mounted micromagnetic magnet used enables selective, excitation (FMR). approach, demonstrated here permalloy disks, is straightforwardly extended to localized FMR modes, and hence films.
We have constructed a compact prototype apparatus for active correction of circle confusion during rotational motion. Our system combines fiber optic interferometry as sensing element, the reference cylinder along with nanopositioning system, and robust algorithm. demonstrate dynamic run-out errors down to 40 nm; resolution is limited by ambient environment accuracy correcting nanopositioners. approach provides solution in-vacuum scanning nanotomography x-ray experiments potential reach...