Stavros Simoglou

ORCID: 0000-0003-0015-7510
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About
Contact & Profiles
Research Areas
  • Low-power high-performance VLSI design
  • VLSI and Analog Circuit Testing
  • Radiation Effects in Electronics
  • Semiconductor materials and devices
  • VLSI and FPGA Design Techniques
  • Embedded Systems Design Techniques
  • Advancements in Semiconductor Devices and Circuit Design
  • 3D IC and TSV technologies
  • Advancements in Photolithography Techniques
  • Advanced Photonic Communication Systems
  • Optical Network Technologies
  • Parallel Computing and Optimization Techniques
  • Formal Methods in Verification
  • Power Line Communications and Noise
  • Advancements in PLL and VCO Technologies

Synopsys (Switzerland)
2024

University of Thessaly
2018-2023

Özyeğin University
2022

Politecnico di Milano
2022

University of Bremen
2022

University of California, Santa Barbara
2022

University of Patras
2022

Bridge University
2022

Yale University
2020

The University of Texas at Austin
2020

As process geometries shrink below 45 nm, accurate and efficient gate-level timing analysis becomes even more challenging. Modern VLSI interconnects are resistive, signals no longer resemble saturated ramps, gate input pins exhibit a significant Miller effect. Over recent years, the semiconductor industry has adopted current source models (CSMs) for modeling. Industrial models, however, precharacterized assuming capacitive loads, which poses challenges to approximation of highly resistive...

10.1109/tvlsi.2021.3061484 article EN IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2021-03-22

In this work, we present an Asynchronous Static Timing Analysis (ASTA) EDA methodology for cyclic, Control Circuits. Our operates using Graph-based (GBA) principles, as conventional synchronous GBA STA, is fast, and pessimistically computes Critical Cycle(s), instead of Paths, without cycle cutting. ASTA flow supports industrial Libraries, Verilog input multiple PVT corners. Gate timing arc delay/slew computation, input/output environment constraints, path delay propagation, are implemented...

10.1109/patmos.2019.8862081 article EN 2019-07-01

Abax is a modern version of the classical Abacus, minimum displacement, greedy legaliser. supports single-tier 2D or 3D legalisation for multiple, logic-on-logic 3D-IC tiers, efficient look-ahead intermediate Global Placement (GP) iterations, Hard Macros, Blockages, row density constraints and multiple local cell displacement functions orderings. For 3D-IC, can produce multi-tier placements by performing Legalisation-based Partitioning. Look-ahead Legalisation, two new cost functions,...

10.23919/date.2018.8342243 article EN Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 2018-03-01

In this work, we present a Static Timing Analysis (STA) methodology for cyclic circuits with attached acyclic datapaths, as an alternative to SPICE level electrical simulation, based on ASTA (Asynchronous STA). Our uses Graph-based (GBA) STA principles, is fast, able compute setup or hold slacks sequential elements, and operates without cycle cutting. Industrial Libraries, Verilog input multiple PVT corners are supported. To perform the circuit portion, Event Model, live 1-bounded Signal...

10.1109/isvlsi49217.2020.00078 article EN 2020-07-01

In this paper, we demonstrate that conventional Static Timing Anaysis (STA) based, functional, gate-level simulation of asynchronous circuits with cycles is only as accurate the STA engine used. This is, firstly because cycle cuts create local slew errors at cutpoints, and secondly propagation may not be upper bounded across multiple cut points in same cycle. The use an Asynchronous (ASTA) engine, which does cycles, properly bounds slews a possible solution, can indeed serve bound over SPICE...

10.1109/dft52944.2021.9568296 article EN 2021-10-06

The manufacturing of modern Integrated Circuits (IC), resistant to faults caused by ionising radiation, has become quite challenging due the rapid advancement VLSI technology. Existing literature employs a combination simulation-based and analytical methods achieve efficient Single Event Transients (SET) analysis. In this work, we propose novel Electronic Design Automation (EDA) analysis approach for SETs, called UPSET. UPSET can handle circuits with thousands gates since it relies on...

10.1109/dft59622.2023.10313533 article EN 2023-10-03

In this paper, we demonstrate that conventional STA-based, functional, gate-level simulation of asynchronous circuits with cycles is only as accurate the STA engine used. This is, firstly because cycle cuts create local slew errors at cutpoints, and secondly propagation may not be upper-bounded across multiple cut points in same cycle. The use an ASTA engine, which does cycles, properly bounds slews a possible solution, can indeed serve upper bound over SPICE, transistor level similations....

10.1109/async49171.2020.00008 article EN 2020-05-01

Process variation has proven to be one of the higher impacting factors in modern Application-Specific Integrated Circuit (ASIC) flows Quality Results (QoR). On hand, excessive MOSFET shrinking, combination with less potent metallization layers shrinking ability at cutting edge technology nodes, rendered process effects more and pronounced. other ever-increasing market competition between hi-tech semiconductor companies promoted adoption immature, emerging which are not adequately calibrated...

10.1109/vlsi-soc54400.2022.9939595 article EN 2022-10-03
Kaya Çetin Chun-Jen Tsai Yi-De Lee Alexander Fusco Sahil Hassan and 95 more Joshua Mack Ali Akoglu Halil Kükner Gökhan Kaplayan Ahmet Efe Ali Gülden Akshay Sarman Alwin Shaju Rose George Kunthara Rekha K. James John Jose Victor Grimblatt Pooria Esmaeili Timothy Martin Shawki Areibi Gary Gréwal Stian Sorensen Christian Bartsch Dominik Stoffel Wolfgang Kunz Nikolaos Chatzivangelis Dimitris Valiantzas Christos Sotiriou Iordanis Lilitsis Nikolaos Blias Stavros Simoglou Evangelos Bakas Chirag Sudarshan Taha Soliman Thomas Kämpfe Christian Weis Norbert Wehn Shubham Kumar Swetaki Chatterjee Simon Thomann Paul R. Genßler Yogesh Singh Chauhan Hussam Amrouch Mahdi Zahedi Taha Shahroodi Abhairaj Singh Geert Custers Stephan Wong Said Hamdioui Univ Kalivas Vasileios Manouras Ioannis Papananos Salvatore Levantino Panagiotis Gkoutis Γεώργιος Κονίδας Grigorios Kalivas Ashwin Bhat Adou Sangbone Assoa Arijit Raychowdhury Yogesh Kumar S Sivakumar Kyriaki Tsantikidou Nicolas Sklavos Rupali Hongekar Ankita Gupta Jayakrishna Guddeti Meghashyam Ashwathnarayan Raiyyan Malik Shubham Baunthiyal Puneet Kumar Sneh Saurabh Anastasios Michailidis T. Noulis Kostas Siozios Konstantinos Falis Andreas Tsiougkos Vasilis F. Pavlidis Kamalika Datta Saman Froehlich Narayan Prasad Yadav Saeideh Shirinzadeh Indranil Sengupta Rolf Drechsler Elif Bilge Kavun Nahla Elaraby David Frismuth Nilson Filho Axel Jantsch C. Efstathiou Laura Agalioti Yiorgos Tsiatouhas Gaurav Kumar Anjum Riaz Yamuna Prasad Satyadev Ahlawat Mohammad Aslam Khan Ruchika Gupta Vedika J. Kulkarni Nandi Digital Michael Keyser

10.1109/vlsi-soc54400.2022.9939565 article EN 2022-10-03

The manufacturing of modern Integrated Circuits (ICs), resistant against faults caused by ionising radiation, has become quite challenging due to the rapid advancement VLSI technology. Additionally, Radiation Hardening process, which involves making electronic cells and circuits damage or induced deviates from conventional design flow. Thus, it generally suffers insufficient support industrial EDA tools. RADPlace is an academic timing-driven detailed placement algorithm that ensures spacing...

10.1109/dft56152.2022.9962347 article EN 2022-10-19

The ever increasing demand for reliable microelectronic systems in the presence of radiation, combined with continuous shrinking CMOS technologies, has rendered impact radiation-induced voltage glitches, known as Single Event Transients (SETs), more and critical. In order to mitigate such errors, analysis circuit radiation immunity these effects is mandatory. This is, nowadays, performed either manufacturing irradiation experiments, which prohibitively expensive or TCAD SPICE simulations,...

10.1109/miel52794.2021.9569180 article EN 2021-09-12
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