A5113736676- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Structural Behavior of Reinforced Concrete
- Semiconductor materials and devices
- Electron and X-Ray Spectroscopy Techniques
- Advanced Statistical Process Monitoring
- Advanced Surface Polishing Techniques
- Structural Load-Bearing Analysis
- Structural Analysis of Composite Materials
- Reliability and Maintenance Optimization
- Electrostatic Discharge in Electronics
- Mechanical Behavior of Composites
- Nanomaterials for catalytic reactions
- Innovative concrete reinforcement materials
- Membrane Separation Technologies
- Fire effects on concrete materials
- Probabilistic and Robust Engineering Design
- Material Properties and Applications
- Fault Detection and Control Systems
- Scientific Measurement and Uncertainty Evaluation
- Industrial Vision Systems and Defect Detection
- Metallic Glasses and Amorphous Alloys
- Optimal Experimental Design Methods
- Nanoparticles: synthesis and applications
- Intracerebral and Subarachnoid Hemorrhage Research
Hubei University of Technology
2024-2025
Soochow University
2024
First Affiliated Hospital of Soochow University
2024
Shandong University of Science and Technology
2024
Qilu Hospital of Shandong University
2024
Shandong Jiaotong University
2023
Chongqing Normal University
2021
Guangxi University of Chinese Medicine
2021
South China Agricultural University
2018-2020
Semiconductor Manufacturing International (China)
2008-2015
The present work indicated the green synthesis, characterization, cytotoxicity, antioxidant, and anti-human ovarian cancer activities of gold nanoparticles containing Curcumae Kwangsiensis Folium (Leaf) aqueous extract. Characterization was done by Field Emission Scanning Electron Microscopy (FE‐SEM), Transmission (TEM), Fourier Transformed Infrared Spectroscopy (FT‐IR), UV–Visible (UV–Vis). MTT assay used on common cell lines i.e., SW-626, PA-1, SK-OV-3 to survey cytotoxicity anti-ovarian...
Developing efficient Si-based anode materials for new-generation lithium-ion batteries (LIBs) has drawn extensive attention.
The improvement of agricultural production efficiency and the transformation mode are core promoting modernization. Taking Chongqing as a sample case, this paper uses DEA-CCR Model, Malmquist Index Tobit Model to calculate analyze its influencing factors, accurately identifies problems existing in development. It has an important policy reference value for improving innovation competitiveness, steady development rural revitalization, realizing modernization, which also provides some...
In this paper, we report electromigration (EM) reliability optimizations using highly efficient uniform design (UD). Considering the large error that results from a single lifetime index, and different EM failure modes, introduce new proportion index incorporating early failures to compensate for shortage of traditional intrinsic in our Design Experiments (DOE). Applying supersaturated UD DOE, greatly reduce ( > 70% savings) number wafers used experiments, comparing classical RSM design....
The limitation of the trend test in SPC is reviewed. current Nelson's run for six or seven consecutive increasing decreasing points cannot detect non-monotonic that frequently encountered industries. This paper proposes reverse arrangement (RAT) to replace rule order both and monotonic trends. theory RAT reviewed we point out errors tables from a well-known most referenced on RAT. corrected accumulated probabilities each total N = 3 12 are presented. false alarm rate verified with excellent...
Photo resist shrinkage during CD-SEM measurements has been a well known phenomenon. It presents great difficulties and challenges in metrology, for example, the tool matching. The "check board" method currently popular matching avoids measuring same location twice resorts to statistical averaging out CD difference each paired measurements. This paper new cross sampling which inherently eliminates measurement. pro con of these two methods are studied with resort model. A conceptual equation...
A method is proposed in this paper to determine whether a product, component, or system reliability life testing has longer lifetime than the other. We propose two indices compare reliability. The comparison also distribution-free; i.e., it does not require assumption on distributions. comparability index that derived by integrating weighted difference between functions of groups under named "Better Worse" (BOW) index. second calculating overlapping area distributions "Reliability...
Time Dependent Dielectric Breakdown (TDDB) is one of the major indices to evaluate Gate Oxide Integrity (GOI) reliability Integrated Circuit (IC) devices. Permutation and combination theory helps derive many combinations temperature voltage stress levels determine TDDB parameters (i.e., γ Ea) with a pre-specified sample size. In this work, statistical tool (JMP10) optimal experimental design platform for accelerated life test (ALT) employed select stressing conditions, optimize ALT plan...
Fibre Reinforced Polymers (FRPs) have become increasingly popular for strengthening concrete structures due to their structural benefits. However, a major concern with FRP-strengthened members is poor fire resistance. This study introduces genetic evolutionary deep learning (DL) approach that utilises the LightGBM algorithm, enhanced Genetic Algorithm hyperparameter optimisation, alongside Programming (GP) assess resistance performance of strengthened reinforced (RC) beams. A substantial...
In this paper, we studied the improvement of EM lifetime distribution including both intrinsic extension and reduction earlier failure percentage by applying a uniform design experiments (UDE) to organic under layer (OUL) step. UDE is an experimental approach that capable distributing evenly within space, especially when large number levels are required. our case, were carried out with six variable table OUL step’s important parameters pressure, power, gas flow rate over-etch percentage....
The failure rate has been an important index in product reliability. Practitioners microelectronics reliability have using JEDEC standards to determine whether a will pass the requirement of prespecified rate. limitation current <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">X</sub> <sup xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> method used by JESD74 and its revision JESD74A determining upper confidence limit for is pointed out...
As semiconductor industry moves towards advanced technology node, requirement for tighter Critical Dimension (CD) control constantly raises the bar CD metrology. Yet despite various intrinsic bias origins, CD-SEM is still serving as workhorse and 'go to' metrology mean inline in modern IC fabrication day out. Such confidence comes from extensive studies around underlying physics of SEM major types are all marked 'accountable' some even 'predictable' nowadays. Still there times when...