A5103226752- Surface and Thin Film Phenomena
- Electron and X-Ray Spectroscopy Techniques
- nanoparticles nucleation surface interactions
- Knee injuries and reconstruction techniques
- Advanced Chemical Physics Studies
- Advanced Electron Microscopy Techniques and Applications
- Force Microscopy Techniques and Applications
- Tendon Structure and Treatment
- Advanced Materials Characterization Techniques
- Total Knee Arthroplasty Outcomes
- Ion-surface interactions and analysis
- Osteoarthritis Treatment and Mechanisms
- Quantum and electron transport phenomena
- Optical Coatings and Gratings
- Molecular Junctions and Nanostructures
- Integrated Circuits and Semiconductor Failure Analysis
- Crystallization and Solubility Studies
- Phase-change materials and chalcogenides
- Magnetic properties of thin films
- Graphene research and applications
- Spectroscopy and Quantum Chemical Studies
- Semiconductor materials and interfaces
- Semiconductor materials and devices
- Carbon Nanotubes in Composites
- Semiconductor Quantum Structures and Devices
Saitama Prefectural University
2007-2021
Tokyo Institute of Technology
2000-2014
Japan Science and Technology Agency
2009-2014
St. Marianna University School of Medicine
2001
Aichi Medical University
1989
Kwansei Gakuin University
1987
Ibn Sina Hospital
1985
Fritz Haber Institute of the Max Planck Society
1980-1981
Al-Sabah Hospital
1979
Structural analysis of the surface reconstructions investigated by ultrahigh vacuum (UHV) transmission electron microscopy (TEM) and diffraction (TED) is shown. By TED intensity a new structural model Si(111)-7×7 derived. The basically consists 12 adatoms arranged locally in 2×2 structure, nine dimers on sides triangular subunits 7×7 unit cell stacking fault layer. UHV–HREM Si (111)-7×7 commented.
A spherical aberration-corrected electron microscope has been developed recently, which is equipped with a 300-kV cold field emission gun and an objective lens of small chromatic aberration coefficient. dumbbell image 47 pm spacing, corresponding to pair atomic columns germanium aligned along the [114] direction, resolved in high-angle annular dark (HAADF) scanning transmission microscopy (STEM) 0.4-eV energy spread beam. The observed was compared simulated obtained by dynamical calculation.
Techniques for routine UHV in situ electron microscopy of epitaxial growth processes thin films are described a wide variety deposit-substrate combinations. The column vacuum commercial microscope is improved to 10-5 Pa simply by scrupulous reassembly. top-entry specimen chamber the microscope, into which evaporator system inserted, differentially evacuated 4-7 mu sublimation pump and an orbital ion pump. substrate crystal set on side-entry stage surrounded cryogenic tip can be cooled liquid...
Previously reported evidences for the recent belief that post-nucleation realignment of growing particles by rotational and translational motions is more important than alignment at nucleation stage in epitaxial growth thin films are criticized on basis in-situ electron microscopic observations processes gold indium molybdenite graphite lead selenide (001) magnesium oxide effect annealing 50 to 300 °C 5 30 min distribution orientation 10 Å gold, silver, palladium (111) oxide. Aufgrund...
Background: The poor healing capacity of a completely ruptured anterior cruciate ligament (ACL) has been attributed to an insufficient vascular supply, cellular metabolism, and deficient premature scaffold formation because the unique intra-articular environment. However, previous studies have focused on factors without considering extra-articular factors, including biomechanical aspects ACL-deficient knees. Hypothesis: Changing joint kinematics ACL-ruptured knee will improve biological...
Annular dark-field scanning transmission electron microscope (ADF-STEM) images of an Si (001) crystal were obtained by using aberration-corrected microscope, at 30-mrad convergent probe and cold field-emission gun 300 kV. The intensity ADF-STEM images, that is, the number scattered electrons relative to incident electrons, for specimen thickness from 10 50 nm was compared quantitatively with absorptive multi-slice simulation. column background intensities analyzed column-by-column...
SUMMARY Lattice fringes of Si(111)–7×7 reconstructed surface structure in reflection electron microscopy (REM) are observed for the first time, and their characteristic features presented. Due to a glancing condition REM, with spacing 2.3 nm 7×7 lattice seen region certain defocus range (about 6–8 μm) foreshortened image. The geometry also results complicated dependence fringe directions on imaging conditions (beam alignment, crystal orientation). A shift across atomic steps out phase...
In recent silicon transistors, fluctuation of the gate threshold voltage due to statistical variation in number dopant atoms has been pointed out be a serious problem. For this reason, characterization methods are required which can detect individual within transistor. paper, we present technique for visualizing arsenic (As) doped crystal using our developed spherical aberration corrected scanning transmission electron microscope (STEM) with convergent probe half angle 30 mrad view very thin...