A5028797718- Advanced X-ray Imaging Techniques
- X-ray Spectroscopy and Fluorescence Analysis
- Advanced Electron Microscopy Techniques and Applications
- Crystallography and Radiation Phenomena
- Laser-Plasma Interactions and Diagnostics
- Electron and X-Ray Spectroscopy Techniques
- Nuclear Physics and Applications
- Advanced X-ray and CT Imaging
- Particle Accelerators and Free-Electron Lasers
- Medical Imaging Techniques and Applications
- Catalytic Processes in Materials Science
- X-ray Diffraction in Crystallography
- High-pressure geophysics and materials
- Catalysis and Oxidation Reactions
- Advanced Materials Characterization Techniques
- Chalcogenide Semiconductor Thin Films
- Pediatric Urology and Nephrology Studies
- Astrophysical Phenomena and Observations
- Advancements in Photolithography Techniques
- Digital Holography and Microscopy
- Optical Coatings and Gratings
- Advanced Surface Polishing Techniques
- Diamond and Carbon-based Materials Research
- Hydrocarbon exploration and reservoir analysis
- Particle Detector Development and Performance
Deutsches Elektronen-Synchrotron DESY
2015-2024
Universität Hamburg
2015-2024
TU Dresden
2007-2023
Hamburg Institut (Germany)
2023
TU Dortmund University
2016-2018
Lintec Corporation (Japan)
2017
Tongji University
2017
European Synchrotron Radiation Facility
2004-2017
Argonne National Laboratory
2017
Bellingham Technical College
2017
Based on nanofocusing refractive x-ray lenses a hard scanning microscope is currently being developed and implemented at beamline ID13 of the European Synchrotron Radiation Facility (Grenoble, France). It can be operated in transmission, fluorescence, diffraction mode. Tomographic allows one to determine inner structure specimen. In this device, monochromatic (E=21keV) nanobeam with lateral extension 47×55nm2 was generated. Further reduction beam size below 20 nm targeted.
The following topics are dealt with: TTF/FLASH in the XFEL context, general layout of facility, accelerator, undulators for SAES and spontaneous emission, photon beamlines scientific instruments, infrastructure auxiliary systems, commissioning operation, project management organization, cost time schedule. (HSI)
Intense femtosecond x-ray pulses from free-electron laser sources allow the imaging of individual particles in a single shot. Early experiments at Linac Coherent Light Source (LCLS) have led to rapid progress field and, so far, coherent diffractive images been recorded biological specimens, aerosols, and quantum systems with few-tens-of-nanometers resolution. In March 2014, LCLS held workshop discuss scientific technical challenges for reaching ultimate goal atomic resolution single-shot...
The manufacture and properties of compound refractive lenses (CRLs) for hard X-rays with parabolic profile are described. These novel can be used up to ∼60 keV. A typical focal length is 1 m. They have a geometrical aperture mm best adapted undulator beams at synchrotron radiation sources. transmission ranges from few % in aluminium CRLs about 30% expected beryllium CRLs. gain (ratio the intensity spot relative behind pinhole equal size) larger than 100 1000 Due their they free spherical...
We describe refractive x-ray lenses with a parabolic profile that are genuine imaging devices, similar to glass for visible light. They open considerable possibilities in microscopy, tomography, microanalysis, and coherent scattering. Based on these microscope hard x rays is described, can operate the range from 2 50 keV, allowing magnifications up 50. At present, it possible image an area of about 300 μm diameter resolving power 0.3 be increased 0.1 μm. This especially suited opaque...
We address the question of what is smallest spot size that hard x rays can be focused to using refractive optics. A thick x-ray lens considered, whose aperture gradually (adiabatically) adapted beam as it converges focus. These adiabatically focusing lenses are shown have a relatively large numerical aperture, down lateral 2 nm (FWHM), well below theoretical limit for with waveguides [C. Bergemann, Phys. Rev. Lett.912003204801].
We have carried out a ptychographic scanning coherent diffraction imaging experiment on test object in order to characterize the hard x-ray nanobeam microscope. In addition high resolution image of object, detailed quantitative picture complex wave field nanofocus is obtained with spatial and dynamic range. Both are result statistics due large number patterns. The method yields complete description focus, robust against inaccuracies sample positioning, requires no particular shape or prior...
Coherent x-ray diffraction imaging is an microscopy technique with the potential of reaching spatial resolutions well beyond limits microscopes based on optics. However, available coherent dose at modern sources limited, setting practical bounds resolution technique. By focusing flux onto sample, can be improved for radiation-hard specimens. A small gold particle (size <100 nm) was illuminated a hard nanobeam (E=15.25 keV, beam dimensions approximately 100 x nm2) and reconstructed from its...
We present the upgrade and status of ultrasmall-angle x-ray scattering (USAXS) beamline BW4 at Hamburg Synchrotronstrahlungslabor. In order to extend accessible vector range, new small-angle setups have been established, making use high flux small divergence BW4. standard transmission geometry using a beam size B=400×400μm2 (horizontal×vertical), typical resolution ranges from dmax=90to650nm, depending on sample-to-detector distance. Additionally microfocus option has established. This...
Abstract Due to their short wavelength, X-rays can in principle be focused down a few nanometres and below. At the same time, it is this wavelength that puts stringent requirements on X-ray optics metrology. Both are limited by today’s technology. In work, we present accurate at measurements of residual aberrations refractive lens using ptychography manufacture corrective phase plate. Together with fitted plate shows diffraction-limited performance, generating nearly Gaussian beam profile...
The emergence of hard X-ray free electron lasers (XFELs) enables new insights into many fields science. These sources provide short, highly intense and coherent pulses. In a variety scientific applications these pulses need to be strongly focused. this article, we demonstrate focusing FEL 125 nm using refractive x-ray optics. For quantitative analysis most experiments, the wave field or at least intensity distribution illuminating sample is needed. We report on full characterization...
We demonstrate x-ray scanning coherent diffraction microscopy (ptychography) with 10 nm spatial resolution, clearly exceeding the resolution limits of conventional hard microscopy. The in a ptychogram is shown to depend on shape (structure factor) feature and can vary for different features object. In addition, contrast are increase increasing fluence. For an optimal ptychographic microscope, this implies source highest possible brilliance optic large numerical aperture generate probe beam.
The PETRA IV project aims at upgrading the present synchrotron radiation source III DESY into an ultralow-emittance source. Being diffraction limited up to X-rays of about 10 keV, will be ideal for three-dimensional X-ray microscopy biological, chemical and physical processes under realistic conditions length scales from atomic dimensions millimetres time down sub-nanosecond regime. In this way, it enable groundbreaking studies in many fields science industry, such as health, energy, earth...
Most studies of structural color in nature concern periodic arrays, which through the interference light create color. The "color" white however relies on multiple scattering within a randomly structured medium, randomizes direction and phase incident light. Opaque materials therefore must be much thicker than structures. It is known that flying insects "white" extremely thin layers. This raises question, whether evolution has optimized wing scale morphology for reflection at minimum...
Abstract The advent of hard x-ray free-electron lasers (XFELs) has opened up a variety scientific opportunities in areas as diverse atomic physics, plasma nonlinear optics the range and protein crystallography. In this article, we access new field science by measuring quantitatively local bulk properties dynamics matter under extreme conditions, case using short XFEL pulse to image an elastic compression wave diamond. was initiated intense optical laser imaged at different delay times after...
Parabolic refractive x-ray lenses with short focal distance can generate intensive hard microbeams lateral extensions in the 100 nm range even at a from synchrotron radiation source. We have fabricated planar parabolic made of silicon that few millimeters energies. In crossed geometry, two were used to microbeam size 380 by 210 25 keV 42 m Using diamond as lens material, down 20 and below are conceivable energy 10 keV.
Tremendous changes of the structure Rh particles occurred during partial methane oxidation to hydrogen and carbon monoxide over a 2.5 wt % Rh/Al(2)O(3) catalyst upon ignition catalytic reaction. Furthermore, near temperature variation in Rh-valence state along bed was observed. By combining hard X-ray absorption spectroscopy (X-ray edge structure, XANES) with charged coupled device (CCD) camera using suitable spectroscopic cell gas supply on-line mass spectrometry, we demonstrate that...
Parabolic refractive x-ray lenses are novel optical components for the hard range from about 5 keV to 120 keV. They compact, robust, and easy align operate. can be used like glass visible light, main difference being that numerical aperture is much smaller than 1 (of order of 10−4–10−3). have been developed at Aachen University made beryllium, boron, aluminium silicon. Their applications in micro- nanofocusing, imaging by absorption phase contrast. In combination with tomography they allow...
Small-angle x-ray scattering is combined with scanning microtomography to reconstruct the small-angle diffraction pattern in direction of tomographic rotation axis at each location on a virtual section through specimen. These data yield information about local nanoscale structure sample. With rotational symmetry present patterns, e.g., for isotropic or fiber-textured scatterers, full reciprocal space regime can be reconstructed inside The method illustrated investigating polymer rod made by...
The interaction of an object with a coherent probe often encodes its properties in complex-valued function, which is then detected intensity-only measurement. Phase retrieval methods commonly infer this function from the intensity. However, decoding involves some ambiguity phase, e.g., when phase shift exceeds <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"> <mml:mn>2</mml:mn> <mml:mi>π</mml:mi> </mml:math> . Here, we present framework to directly recover amplitude...
Understanding morphological changes of nanoparticles in solution is essential to tailor the functionality devices used energy generation and storage. However, we lack experimental methods that can visualize these processes solution, or electrolyte, provide three-dimensional information. Here, show how X-ray ptychography enables situ nano-imaging formation hollowing at 155 °C. We simultaneously image growth about 100 nanocubes with a spatial resolution 66 nm. The quantitative phase images...
X-ray fluorescence microtomography allows one to map element distributions inside a sample with high sensitivity and resolutions in the micrometer range. Quantitative reconstruction of concentrations from data requires correction for attenuation sample. However, radiation is not directly accessible by experiment. The method described self-consistently estimates this reconstruct relative concentrations. This demonstrated on numerical as well experimental data. A measure quality given.