Metas.UncLib is a software library that facilitates the linear propagation of uncertainties through measurement model. It able to handle complex-valued and multivariate quantities supports higher mathematics. therefore deal with advanced metrological problems require, e.g., matrix manipulations. The optimized for short computation times low memory use.

This paper describes a software, METAS VNA Tools II, which is designed to compute uncertainties of coaxial S-parameter measurements. A bottom-up concept used. Thus basic influence quantities are propagated through the calibration vector network analyzer S-parameters device under test. UncLib used for linear propagation uncertainties. The result not only an uncertainty region but list contributions with correlations. can be into eventual post-processing steps. In present has been verified by...

This paper presents a new algorithm for the calibration of nearfield scanning microwave microscopes. By adopting techniques known from vector network analyzer calibration, microscope can be calibrated at specific frequency with three standards. The advantages compared to existing methods are that is valid all possible samples and measurements require less time than other algorithms.

The digitalization of metrology poses a challenge to all members the community. We propose an approach for digital calibration certificates (DCCs) based on PDF/A-3 solution that could be stepping-stone towards metrological services. present multiple applications this by fulfilling discussed minimum requirements and satisfying needs from both customers laboratories.

Scattering parameters are fundamental quantities in radio frequency and microwave metrology. Traceability to SI units for these measurements is established with the help of calculable standards. Progress has been made over recent years characterizing Major steps forward have achieved advanced modelling entire standard, including connector interface use multivariate uncertainty evaluation, taking correlations fully into account. The improvements led more consistent, accurate measurements.

Abstract Material parameter extraction algorithms are studied and simplified both for transmission-reflection transmission-only methods. The relations, which closed-form in some cases, analyzed to establish the uncertainty sensitivity coefficients therefore, clarify main contributions reduce systematic random errors. Simple expressions presented this paper show of extracted permittivity each input such as S 21 (phase amplitude), frequency, material thickness. Results several slabs three...

Measuring the material parameters with a vector network analyzer (VNA) usually requires time-domain gating and complicated free-space calibrations. At terahertz frequencies, classic calibrations become more problematic uncertainty calculation for time is not clearly defined. The here investigated method skips these steps based on normalization to "Thru" connection analyzing error terms multiple-reflection phenomena (ripples). It shown that at specific ripples are very small. Based this,...

This paper shows how the S-parameters in 1.85 mm coaxial line systems can be defined a traceable way. It is found that very fail-proof verification method to compare two different and independent calibration techniques. Here reflect compared an offset short calibration. Measurements of load, which were corrected with both calibrations, showed agreement was better than 0.003 linear up 67 GHz. Key factors for achieving this accuracy are taking into account connector effects setting pin gaps...

Reflection and transmission of microwaves in coaxial devices are usually described by S-parameters. The current definition S-parameters requires that the reference plane is a section ideal wave guide. Due to this, tremendous effort necessary facilitate dissemination standards, for comparison measurement values cascading devices. These processes can be simplified extending planes sections non-ideal guide, e.g. connectors. Extended approximated with conventional simulation programs. Practical...

Many calibration algorithms for vector network analyzers using partially unknown standards can be stated as an eigenvalue problem. The construction of the problem is described and examples line reflect match (LRM) thru (TRL) calibrations are given. Advantages new algorithm that all uncertainties taken into account it fully analytic. A further advantage same approach used different schemes. implemented in METAS VNA Tools II UncLib linear propagation uncertainties.

Waveguide extenders are used for reflection and transmission measurements at frequencies higher than 70 GHz. The produce a lot of heat during operation thus their test-port temperature rises above 23 degrees Celsius. By using an active cooling system with large thermal mass, excellent stability temperatures close to Celsius can be achieved.

Abstract The evaluation of measurement uncertainties in vector network analysis is a demanding task. metrology guide EURAMET cg-12 (formerly EA 10/12) dedicated to this topic and serves as guideline for calibration laboratories national institutes. has been revised, acknowledging the technical progress field. new method agreement with relevant standards on uncertainty evaluation.

We present an SI traceable calibration of a vector network analyzer with 1.0mm connectors. The modeling the offset short standards and used algorithm yield results which are physically plausible have up to 5 times lower uncertainties than existing calibrations for

Reflection and transmission measurements at frequencies higher than 70 GHz require the use of waveguide extenders. The correct connection extenders to vector network analyzer careful construction can improve repeatability drastically.

Equivalent source match is a quantity of 3-port device, which needed for power sensor calibration. The Juroshek method, direct method and an indirect 2-port measuring equivalent are tested with different definitions the calibration standards being used. Using standard that include connector effects 2.4mm splitter yields difference maximally |ΔΓG| <; 0.005 between methods. analysis uncertainties shows large differences E.g. uncertainty U <sub xmlns:mml="http://www.w3.org/1998/Math/MathML"...

Electronic calibration units (ECUs) are becoming increasingly important for the of vector network analyzers (VNAs). Undoubtedly, ECUs simplify VNAs significantly by reducing number required connections. It is however not well understood yet how compete with a mechanical in terms measurement accuracy and stability. This paper summarizes preliminary experimental results that have been carried out to test respect temperature sensitivity, connector repeatability, stability over time.

This paper describes the calibration process of a THz pyroelectric detector, to be traceable standard thermocouple sensor in WR10 waveguide-range (75-110GHz). Setup consists suitable waveguide-to-free-space adaptor (antenna) with relevant positioners analyze and characterize standing-wave ratio. The results are presented together preliminary error analysis uncertainties.

Mechanical deformations have a significant impact on electrical connections in mm-wave measurement systems. This paper presents constructional measures to improve the stability of coaxial system for scattering parameters up 110 GHz.

We report about the data analysis of this first formal scattering parameter comparison coaxial 2.4mm system. Multivariate statistics and a Monte Carlo method are applied to determine reference value (CRV) with 95% confidence region

Classic equations for material parameter extraction are reconsidered and slightly modified to achieve stable results at all frequencies. Meanwhile, closed-form solutions developed simplify the process uncertainty evaluation. The presented independent of material-slab thickness therefore, can reduce relevant systematic errors uncertainties. Some representative reported in frequency range 140-220 GHz together with analysis sensitivity coefficients.

A method is presented to measure materials and extract the complex permittivity without using classic VNA calibrations time-gating. It based on frequency selective normalization, analyzing error-terms multiple-reflection phenomena. Measurement results (in free-space) are in 75-110 GHz 500-750 bands. The new normalization technique reduces uncertainties simplifies process.