A5070328120- Ion-surface interactions and analysis
- Electron and X-Ray Spectroscopy Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Electron Microscopy Techniques and Applications
- Digital Imaging for Blood Diseases
- Surface Chemistry and Catalysis
- Advancements in Battery Materials
- Electrochemical Analysis and Applications
- Diamond and Carbon-based Materials Research
- Porphyrin and Phthalocyanine Chemistry
- Mass Spectrometry Techniques and Applications
- Cell Image Analysis Techniques
- Advanced Battery Materials and Technologies
- Nuclear Physics and Applications
- Advanced Battery Technologies Research
- Solid-state spectroscopy and crystallography
- Molecular Junctions and Nanostructures
- Advanced X-ray Imaging Techniques
- Hydrogen Storage and Materials
- Gas Sensing Nanomaterials and Sensors
- Brain Tumor Detection and Classification
- Medical Image Segmentation Techniques
- Luminescence and Fluorescent Materials
- Analytical chemistry methods development
- Laser-induced spectroscopy and plasma
Luxembourg Institute of Science and Technology
2019-2024
Friedrich-Alexander-Universität Erlangen-Nürnberg
2021
Freie Universität Berlin
2021
Flemish Institute for Technological Research
2021
Fraunhofer Institute for Ceramic Technologies and Systems
2021
Institut de Physique
2016
The helium ion microscope (HIM) has emerged as an instrument of choice for patterning, imaging and, more recently, analytics at the nanoscale. Here, we review secondary electron on HIM and various methodologies hardware components that have been developed to confer analytical capabilities HIM. Secondary electron–based can be performed resolutions down 0.5 nm with high contrast, depth field, directly insulating samples. Analytical methods include hyperspectral (SEHI), scanning transmission...
The focused ion beam (FIB) is a powerful tool for fabrication, modification, and characterization of materials down to the nanoscale. Starting with gallium FIB, which was originally intended photomask repair in semiconductor industry, there are now many different types FIB that commercially available. These instruments use range species applied broadly science, physics, chemistry, biology, medicine, even archaeology. goal this roadmap provide an overview instrumentation, theory, techniques,...
Nanoparticles occur in various environments as a consequence of man-made processes, which raises concerns about their impact on the environment and human health. To allow for proper risk assessment, precise statistically relevant analysis particle characteristics (such size, shape, composition) is required that would greatly benefit from automated image procedures. While deep learning shows impressive results object detection tasks, its applicability limited by amount representative,...
The structural, morphological, and chemical characterization of samples is utmost importance for a large number scientific fields. Furthermore, this very often needs to be performed in three dimensions at length scales down the nanometer. Therefore, there stringent necessity develop appropriate instrumentational solutions fulfill these needs. Here we report on deployment magnetic sector secondary ion mass spectrometry (SIMS) type instrument widely used such nanoscale investigations, namely,...
The straightforward synthesis of directly fused porphyrins (porphyrin tapes) from 5,15-diphenyl porphyrinato nickel(ii) complexes with different substituents on the phenyl rings is achieved while processing gas phase. porphyrin tapes, exhibiting NIR absorption, are readily obtained in thin film form. phase approach cuts need for solubilizing groups allowing first time study their conductivity according to substituent. 2-Point probe and AFM measurements evidence that reducing size meso...
Over the last few decades, nanoparticles have become a key element in number of scientific and technological fields, spanning from materials science to life sciences. The characterization or samples containing nanoparticles, terms morphology, chemical composition, other parameters, typically involves investigations with various analytical tools, requiring complex workflows extending duration such studies several days even weeks. Here, we report on development new unique situ correlative...
Nanometer scale imaging of hydrogen in solid materials remains an important challenge for the characterization advanced materials, such as semiconductors, high-strength metallic alloys, and storage materials. Within this work, we demonstrate high-resolution deuterium within Mg2Ni/Mg2NiH4 thin films using in-house developed secondary ion mass spectrometer (SIMS) system attached to a commercially available dual-beam focused beam - scanning electron microscope (FIB-SEM) instrument. We further...
A detection system based on a microchannel plate with delay line readout structure has been developed to perform scanning transmission ion microscopy (STIM) in the helium microscope (HIM). This is an improvement over other existing approaches since it combines information of beam position sample (scattering angle) and time events. Various imaging modes, such as bright field dark or direct image transmitted signal, can be created by post-processing collected STIM data. Furthermore, detector...
Detection of iron at the subcellular level in order to gain insights into its transport, storage, and therapeutic prospects prevent cytotoxic effects excessive accumulation is still a challenge. Nanoscale magnetic sector secondary ion mass spectrometry (SIMS) an excellent candidate for mapping elements cells since it provides high collection efficiency transmission, coupled with high-lateral-resolution capabilities enabled by nanoscale primary beams. In this study, we developed correlative...
The global transition from fossil fuels to green energy underpins the need for efficient and reliable storage systems. Advanced analysis characterization of battery materials is not only important understand fundamental properties but also crucial their continued development. A deep understanding these systems often difficult obtain through pre- and/or post-mortem analyses, with full complexity a being hidden in its operational state. Thus, we have developed an operando methodology analyze...
Porous and highly conjugated multiply fused porphyrin thin films are prepared from a fast single-step chemical vapor deposition approach. While the solution-based coupling of porphyrins is usually undertaken at room temperature, gas phase reaction nickel(II) 5,15-(diphenyl)porphyrin iron(III) chloride (FeCl
In this study, we present a comprehensive analysis of lithium dendrite formation in half-cells with garnet-type solid-state electrolyte Li7La3Zr2O12 (LLZO) utilizing operando neutron imaging and subsequent ex-situ correlative structural chemical analysis. The experiment involves cycling symmetric half-cell (Li|LLZO|Li) until short-circuit failure, all while being irradiated neutrons, providing invaluable insights into the dynamic processes within half-cell. Post-mortem investigations were...
A dedicated transmission helium ion microscope (THIM) for sub-50 keV has been constructed to investigate scattering processes and contrast mechanisms, aiding the development of new imaging analysis modalities. Unlike a commercial (HIM), in-house built instrument allows full flexibility in experimental configuration. Here, we report projection intensity patterns obtained from powder bulk crystalline samples using stationary broad-beam as well convergent-beam illumination conditions THIM. The...
Journal Article Magnetic Sector SIMS System with Continuous Focal Plane Detector for Advanced Analytical Capabilities on FIB Instruments Get access Tom Wirtz, Wirtz Luxembourg Institute of Science and Technology (LIST), Belvaux, Grevenmacher, Search other works by this author on: Oxford Academic Google Scholar Olivier De Castro, Castro Antje Biesemeier, Biesemeier Hung Quang Hoang, Hoang Jean-Nicolas Audinot Microscopy Microanalysis, Volume 26, Issue S2, 1 August 2020, Pages 1972–1974,...
Journal Article SIMS Performed on Focused Ion Beam Instruments : In-situ Correlative Structural and Chemical Imaging Get access Jean-Nicolas Audinot, Audinot Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science Technology (LIST), Belvaux, Corresponding author: jean-nicolas.audinot@list.lu Search other works by this author on: Oxford Academic Google Scholar Alexander D Ost, Ost LuxembourgUniversity Luxembourg, Esch-sur-Alzette, Charlotte...
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