Nikolay A. Artemiev

ORCID: 0000-0002-0251-545X
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About
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Research Areas
  • Advanced X-ray Imaging Techniques
  • X-ray Spectroscopy and Fluorescence Analysis
  • Advanced Measurement and Metrology Techniques
  • Crystallography and Radiation Phenomena
  • Particle Accelerators and Free-Electron Lasers
  • X-ray Diffraction in Crystallography
  • Optical measurement and interference techniques
  • Advanced Surface Polishing Techniques
  • Electron and X-Ray Spectroscopy Techniques
  • Advancements in Photolithography Techniques
  • Laser-Plasma Interactions and Diagnostics
  • Scientific Measurement and Uncertainty Evaluation
  • Surface Roughness and Optical Measurements
  • Optical Coatings and Gratings
  • Advanced Electron Microscopy Techniques and Applications
  • Laser Design and Applications
  • Adaptive optics and wavefront sensing
  • Advanced X-ray and CT Imaging
  • Laser-Matter Interactions and Applications
  • Laser Material Processing Techniques
  • Ocular and Laser Science Research
  • Photocathodes and Microchannel Plates
  • solar cell performance optimization
  • Nanofabrication and Lithography Techniques
  • Solid-state spectroscopy and crystallography

École Polytechnique
2004-2025

École Nationale Supérieure de Techniques Avancées
2004-2025

Centre National de la Recherche Scientifique
2004-2025

Lawrence Berkeley National Laboratory
2011-2017

Kurchatov Institute
1998-2017

KLA (United States)
2015-2016

Heinz Optical Engineering (United States)
2015

Advanced Light Source
2014

Laboratoire d'Optique Appliquée
2004-2008

Czech Academy of Sciences
2000-2003

This Letter aims to demonstrate the ultrafast nature of laser produced betatron radiation and its potential for application experiments. An upper estimate x-ray pulse duration has been obtained by performing a time-resolved diffraction experiment: The nonthermal melting semiconductor crystal (InSb) used trigger beam diffracted from surface. less than 1ps at full width half-maximum (FWHM) measured with best fit 100fs FWHM.

10.1063/1.2754624 article EN Physics of Plasmas 2007-08-01

The advent of fully coherent free-electron laser and diffraction-limited synchrotron radiation storage ring sources x-rays is catalyzing the development new ultrahigh accuracy metrology methods. To exploit these sources, needs to be capable determining figure an optical element with subnanometer height accuracy. major limiting factors current absolute ex situ are drift errors due temporal instabilities lab’s environmental conditions systematic inherent instruments. Here, we discuss in detail...

10.1117/1.oe.54.10.104104 article EN cc-by Optical Engineering 2015-10-12

The X-Ray Optics Laboratory (XROL) at the Advanced Light Source (ALS), a unique optical metrology lab, has been recently moved to new, dedicated clean-room facility that provides improved environmental and instrumental conditions vitally required for high accuracy with state-of-the-art X-ray optics. Besides ALS, XROL serves several DOE labs lack on-site capabilities, including Linac Coherent (LCLS) SLAC LBNL's Center (CXRO). major role of is proactively support development optimal beamline...

10.1117/12.2062042 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2014-09-17

We discuss an application of correlation analysis to surface metrology high quality x-ray optics with the aim elicitation and, when possible, suppression instrumental systematic errors in final results. describe and present mathematical foundation for a novel method consisting randomization error by averaging multiple measurements, specially arranged mutually anti-correlate. also possibility apply entire residual slope distribution order find anti-correlation parameters distribution. In this...

10.1117/12.2024694 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2013-09-27

The autocollimator and moveable pentaprism based DLTP [NIM A 616 (2010) 212-223], a low-budget, NOM-like profiler at the Advanced Light Source (ALS), has been upgraded to provide fast, highly accurate surface slope metrology for long, side-facing, x-ray optics. This instrument arrangement decreases sensitivity environmental conditions removes gravity effect on mirror shape. We design details of an affordable base tool, including clean-room arrangements in new ALS X-ray Optics Laboratory with...

10.1117/12.2061969 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2014-09-17

During the last ten years, deflectometric profilometers have become indispensable tools for precision form measurement of optical surfaces. They proven to be especially suitable characterizing beam-shaping surfaces x-ray beamline applications at synchrotrons and free electron lasers. Deflectometric use surface slope (angle) assess topography utilize commercial autocollimators contactless measurement. To this purpose, autocollimator beam is deflected by a movable square (or pentaprism)...

10.1063/1.4950734 article EN Review of Scientific Instruments 2016-05-01

Systematic error and instrumental drift are the major limiting factors of sub-microradian slope metrology with state-of-the-art x-ray optics. Significant suppression errors can be achieved by using an optimal measurement strategy suggested in [Rev. Sci. Instrum. 80, 115101 (2009)]. Here, we report on development automated, kinematic, rotational system that provides fully controlled flipping, tilting, shifting a surface under test. The is to integrated into Advanced Light Source long trace...

10.1117/12.894061 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2011-09-08

We demonstrate a comprehensive and broadly applicable methodology for the optimal in situ configuration of bendable soft x-ray Kirkpatrick-Baez mirrors. The mirrors used this application are preset at Advanced Light Source Optical Metrology Laboratory prior to beamline installation. consists new technique simultaneously setting height pitch angle each mirror. benders both were then optimally tuned order minimize ray aberrations level below diffraction-limited beam waist size 200 nm...

10.1117/1.oe.52.3.033603 article EN cc-by Optical Engineering 2013-03-14

Solid-based surface high-harmonic generation from a tape is experimentally studied. By operating at mildly relativistic normalized laser strengths a0≲0.2, harmonics up to the 17th order are efficiently produced in coherent wake emission (CWE) regime. CWE pulse properties, such as divergence, energy, conversion efficiency, and spectrum, investigated for various materials drive conditions. A clear correlation between roughness harmonic beam divergence found. At measured properties 15th...

10.1063/1.4816574 article EN Journal of Applied Physics 2013-07-25

The ultimate performance of surface slope metrology instrumentation, such as long trace profilers and auto-collimator based deflectometers, is limited by systematic errors that are increased when the entire angular range used for significantly curved optics. At ALS X-Ray Optics Laboratory, in collaboration with HZB/BESSY-II PTB (Germany) teams, we working on a calibration method concept universal test mirror (UTM) [V. V. Yashchuk et al., Proc. SPIE 6704, 67040A (2007)]. Potentially, UTM...

10.1063/1.4950729 article EN Review of Scientific Instruments 2016-05-01

Fabrication of diffraction grating for x-rays is a very challenging problem due to the exacting requirements surface quality, groove position, and profile. Traditional fabrication techniques have significant limitations do not cover all necessary requirements. For example, classical holographic recording limited in type patterns that can be produced. This particularly important design wide aperture high resolution spectrometers, where aberration correction using complex necessary. We are...

10.1117/12.2024489 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2013-09-27

Convenience and cost often lead to synchrotron beamlines where the final bendable Kirkpatrick-Baez focusing pair must relay image different samples at distances e.g., [Proc. FEL2009, 246-249 (2009)] either for experimental chambers, or diagnostics. We present an initial analytical approach, starting from, extending work of Howells et al. [OE 39(10), 2748-62 (2000)] analyze trade-offs between choice mirror, bending couples given, shaped sagittal width optic. Both experimentally in simulation,...

10.1117/12.894175 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2011-09-08

We present a modulation transfer function (MTF) calibration method based on binary pseudo-random (BPR) one-dimensional sequences and two-dimensional arrays as an effective for spectral characterization in the spatial frequency domain of broad variety metrology instrumentation, including interferometric microscopes, scatterometers, phase shifting Fizeau interferometers, scanning transmission electron at this time, x-ray microscopes. The inherent power density BPR gratings arrays, which has...

10.1063/1.4936752 article EN Review of Scientific Instruments 2015-12-01

We report on a cross-comparison of low-spatial-frequency surface slope and height metrology with super-polished flat X-ray mirror Si substrate fabricated for the Stanford Linear Accelerator Center Linac Coherent Light Source hard system HOMS-3. The overall dimensions 450 × 30 50 mm<sup>3</sup> was specified to have radius curvature between 150 km 195 residual (after subtraction best-fit cylinder) variation level 0.1 &mu;rad rms, when measured in tangential direction over clear aperture 380 5...

10.1117/12.945915 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2012-10-15

We extend analytical and numerical methods recently developed at the Advanced Light Source (ALS) optical metrology laboratory (OML) for optimal tuning calibration of bendable x-ray optics based on ex situ measurements with surface slope profilers [Opt. Eng. 48(8), 083601 (2009); Proc. SPIE 8141, 8141-19 (2011)]. minimize rms variation residual deviations from ideal figure. Previously, our adjustment assumed were weighted equally across optic. In this work, we analyze case when mirror length...

10.1117/12.930156 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2012-10-15

We report on hands-on experimental methods developed at the Advanced Light Source (ALS) for optimal tuning of mechanically bendable x-ray mirrors diffraction-limited soft nano-focusing. For ex situ benders beam-line performance, we use a revised version method characteristic functions recently ALS optical metrology laboratory. At-wavelength optics consists series wavefront-sensing tests with increasing accuracy and sensitivity, including modified scanning-slit Hartmann tests. The have been...

10.1088/1742-6596/425/15/152003 article EN Journal of Physics Conference Series 2013-03-22

The sagittal deviation of a Laue-diffracted X-ray beam caused by the inclination an exit crystal surface with respect to entrance has been studied both theoretically and experimentally. use this effect for focusing synchrotron radiation diffracted Laue is suggested. based on refraction due parabolic profile or/and surface. not bent. In order achieve reasonable distance, should be cut asymmetrically. experiment was performed at beamline BM5 ESRF.

10.1107/s0909049503003479 article EN Journal of Synchrotron Radiation 2003-04-25

10.1016/j.nima.2005.01.249 article EN Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment 2005-02-17

We describe a systematic procedure developed for surface characterization of super polished x-ray optical components with an interferometric microscope. In this case, obtaining trustworthy metrology data requires thorough accounting the instrument's aberrations, its spatial resolution, and random noise. analyze cross compare two general experimental approaches to eliminate aberration contribution. The reference approach relies on evaluation successive measurements high quality mirror. so...

10.1117/12.2024416 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2013-09-23

When it comes to building short-wavelength optical systems control light at the nano-scale, metrology is foundation, and accuracy bedrock. An inescapable truth in our field that most highly specified elements are wildly aberrated when just slightly misaligned, whether misalignment from surface-figure or mirror-placement errors, imperfect bending, thermal drift, vibration, other various anomalies.

10.1080/08940886.2013.832583 article EN Synchrotron Radiation News 2013-09-01

10.1016/j.nima.2012.10.109 article EN Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment 2012-11-10

MAESTRO, the Microscopic and Electronic STRucture Observatory, currently under construction at Advanced Light Source (ALS), will be a world premier facility for study of electronic structural properties in situ grown crystals. The new comprised several end-stations, including angle-resolved photoemission spectroscopy, μARPES nARPES electron microscope combined with lowenergy (PEEM/LEEM). Redirection x-ray beam between PEEM/LEEM which are longitudinally separated by 2.5 meters, uses system...

10.1117/12.2024675 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2013-09-27

First experimental results are presented for a coherent phenomenon in reflection of radiation by mirror with concave round surface. It consists interference fringes which arise owing to the interaction rays undergoing different numbers reflections on mirror. An analytical theory is given frame geometrical optics approach small angle approximation. The experimentally measured visual light Ne–He laser reflected part qualitative coincidence accurate computer calculations performed approach.

10.1088/0031-8949/57/2/013 article EN Physica Scripta 1998-02-01

Parabolic planar compound refractive lenses (CRLs) made from glassy carbon by means of laser ablation are presented. They have radii curvatures 5 and 200μm geometric apertures 40 900μm, respectively. The numbers biconcave elements in the CRLs were 4, 7, 200. allow formation a linear focus length comparable with depths their profiles. Usage two crossed geometry provides two-dimensional focus. tested at European Synchrotron Radiation Facility bending magnet beam line BM-5. minimum experimental...

10.1063/1.2198791 article EN Review of Scientific Instruments 2006-06-01
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