A5072951101- Advanced X-ray Imaging Techniques
- Advanced Measurement and Metrology Techniques
- Advanced Surface Polishing Techniques
- X-ray Spectroscopy and Fluorescence Analysis
- Optical measurement and interference techniques
- Surface Roughness and Optical Measurements
- Particle Accelerators and Free-Electron Lasers
- Advancements in Photolithography Techniques
- Electron and X-Ray Spectroscopy Techniques
- Scientific Measurement and Uncertainty Evaluation
- Adaptive optics and wavefront sensing
- Advanced X-ray and CT Imaging
- Crystallography and Radiation Phenomena
- Optical Systems and Laser Technology
- Photonic and Optical Devices
- Atomic and Molecular Physics
- Optical Coatings and Gratings
- Advanced Electron Microscopy Techniques and Applications
- Particle accelerators and beam dynamics
- Magneto-Optical Properties and Applications
- Calibration and Measurement Techniques
- Astrophysical Phenomena and Observations
- Force Microscopy Techniques and Applications
- Geodetic Measurements and Engineering Structures
- 3D Surveying and Cultural Heritage
Helmholtz-Zentrum Berlin für Materialien und Energie
2011-2022
Berlin Schalltechnisches Büro
1995-1998
To fully exploit the ultimate source properties of next-generation light sources, such as free-electron lasers (FELs) and diffraction-limited storage rings (DLSRs), quality requirements for gratings reflective synchrotron optics, especially mirrors, have significantly increased. These coherence-preserving optical components high-brightness sources will feature nanoscopic shape accuracies over macroscopic length scales up to 1000 mm. enable high efficiency in terms photon flux, optics be...
For photon energies of 1 -5 keV, blazed gratings with multilayer coating are ideally suited for the suppression stray and higher orders light in grating monochromators.We developed characterized a 2000 lines/mm coated 20 period Cr/C-multilayer.The d-spacing 7.3 nm has been adapted to line distance 500 blaze angle 0.84° order provide highest efficiency energy range between 1.5 keV 3 keV.Efficiency as well reflectance witness which were simultaneously have measured.An 35% was measured at 2...
The optimized design of multilayer-coated blazed gratings (MLBG) for high-flux tender X-ray monochromators was systematically studied by numerical simulations. resulting correlation between the multilayer d-spacing and grating blaze angle significantly deviated from one predicted conventional equations. Three high line density with different angles were fabricated coated same Cr/C multilayer. MLBG an optimal 1.0° showed a record efficiency reaching 60% at 3.1 keV 4.1 keV. measured...
A low-budget surface slope-measuring instrument, the developmental long-trace profiler (DLTP), was recently brought into operation at Advanced Light Source Optical Metrology Laboratory. The instrument is based on a precisely calibrated autocollimator and movable pentaprism. capability of DLTP to achieve submicroradian slope metrology has been verified via cross-comparison measurements other high-performance instruments when measuring same high-quality test optics. Further improvement...
The design for a new XUV-Optics Beamline is presented. collimated plane grating monochromator (PGM-) beamline at bending magnet setup the BESSY-II synchrotron radiation facility within framework of blazed-grating production facility. Coupled to versatile four-circle (ten axes) UHV- reflectometer as permanent end station whole dedicated at-wavelength characterization and calibration in-house produced precision gratings novel nano-optical devices well mirrors, multilayered systems etc. It also...
Blazed gratings are of dedicated interest for the monochromatization synchrotron radiation when a high photon flux is required, such as, example, in resonant inelastic X-ray scattering experiments or use laminar excluded due to too densities and expected damage, example at free-electron laser beamlines. Their availability became bottleneck since decommissioning grating manufacture facility Carl Zeiss Oberkochen. To resolve this situation new technological laboratory was established Helmholtz...
The development of third generation light sources like the Advanced Light Source (ALS) or BESSY II brought to a focus need for high performance synchrotron optics with unprecedented tolerances slope error and micro roughness. Proposed beam lines at Free Electron Lasers (FEL) require optical elements up length one meter, characterized by residual in range 0.1 μrad (rms), rms values nm These must be inspected highly accurate measuring instruments, providing measurement uncertainty lower than...
Replacement of a bulk pentaprism with mirror-based (MBPP) in slope-measuring instruments, such as long trace profilers and autocollimator-based deflectometers, is well-established way to significantly improve the reliability surface slope measurements. This due elimination systematic errors introduced by inhomogeneity optical material fabrication imperfections pentaprisms. Proper use an MBPP requires precision mutual alignment its mirrors. In recent work we have reported on original...
Slope measuring deflectometry is commonly used by the X-ray optics community to measure long-spatial-wavelength surface figure error of optical components dedicated guide and focus X-rays under grazing incidence condition at synchrotron free electron laser beamlines. The best performing instruments this kind are capable absolute accuracy on level 30-50 nrad. However, exact bandwidth measurements, determined higher spatial frequencies instrument’s resolution, or more generally modulation...
The performance of x-ray beamlines at 3<sup>rd</sup> generation synchrotron radiation sources and Free Electron Lasers (FELs) is limited by the quality state art optical elements. Proposed FEL require components which are better than available from manufacturing technology today. As a result joint research project (Nanometer Optik Komponenten - NOK) coordinated BESSY, involving both metrologists manufacturers it possible now to manufacture beyond former limit 0.1 arcsec rms slope error [1,...
The ultimate performance of surface slope metrology instrumentation, such as long trace profilers and auto-collimator based deflectometers, is limited by systematic errors that are increased when the entire angular range used for significantly curved optics. At ALS X-Ray Optics Laboratory, in collaboration with HZB/BESSY-II PTB (Germany) teams, we working on a calibration method concept universal test mirror (UTM) [V. V. Yashchuk et al., Proc. SPIE 6704, 67040A (2007)]. Potentially, UTM...
Within our technology center for production of highly efficient precision gratings a versatile 4-circle UHV-reflectometer synchrotron radiation based at-wavelength characterization has been fabricated. The main feature is the possibility to incorporate real live-sized gratings. samples are adjustable within six degrees freedom by novel UHV-tripod system, and reflectivity can be measured at all incidence angles both s- p-polarization geometry. reflectometer setup in clean room hutch it...