A5101880358- Advanced Measurement and Metrology Techniques
- Surface Roughness and Optical Measurements
- Optical measurement and interference techniques
- Advanced Surface Polishing Techniques
- Advanced X-ray Imaging Techniques
- Calibration and Measurement Techniques
- CCD and CMOS Imaging Sensors
- Optical Systems and Laser Technology
- Infrared Target Detection Methodologies
- Adaptive optics and wavefront sensing
- Advancements in Photolithography Techniques
- Scientific Measurement and Uncertainty Evaluation
- Particle Accelerators and Free-Electron Lasers
- Advanced X-ray and CT Imaging
- Laser Material Processing Techniques
- Laser Design and Applications
- Adhesion, Friction, and Surface Interactions
- Industrial Vision Systems and Defect Detection
- Optical Coatings and Gratings
- Photonic and Optical Devices
- Advanced Measurement and Detection Methods
- Advanced Sensor Technologies Research
- Astronomical Observations and Instrumentation
- Manufacturing Process and Optimization
- Advanced Semiconductor Detectors and Materials
Magyar Agrár- és Élettudományi Egyetem
2020
Brookhaven National Laboratory
2009-2018
National Library of Luxembourg
2001
RIKEN BNL Research Center
1989
United States Department of Energy
1982
The design of a long-trace surface profiler for the non-contact measurement profile, slope error and curvature on cylindrical synchrotron radiation (SR) mirror is pre-sented here. optical system based upon concept pencil-beam interferometer with an inherent large depth-of-field. key feature zero-path-difference beam splitter, which separates laser into two colinear, variable-separation probe beams. A linear array detector used to record interference fringe in image, analysis location as...
A method for deriving optical constants from reflectance vs angle of incidence measurements using a nonlinear least-squares curve-fitting technique based on the χ2 test fit is presented and used to derive several thin-film materials. The incorporates independently measured values film surface roughness, thickness, incident beam polarization. also provides direct estimating probable errors in derived constants. Data are 24 Å 1216 samples C, synthetic diamond, Al, Si, CVD SiC. Auger electron...
Accurate knowledge of the instrument transfer function (ITF) is vital for topography measurements using white‐light interferometry (WLI). To this end, we derive a complete set analytical expressions power spectral density (PSD) discretely-sampled binary pseudo‐random array (BPRA) as theoretical benchmark. We then determine ITF by comparing PSD with measured BPRA. For Zygo ZeGage™ Pro HR 50× objective, determined closely matches nominal modulation (MTF). Accordingly, integrate MTF into...
We describe methods of predicting the degradation performance a simple imaging system in terms statistics shape errors focusing element and, conversely, specifying those requirements on image quality. Results are illustrated for normal-incidence, x-ray mirrors with figure plus conventional and/or fractal finish errors. It is emphasized that properties surface well behaved even though fractal-power spectra diverge at low spatial frequencies.
A new long-trace optical profiling instrument is now in operation at Brookhaven National Laboratory measuring surface figure and macro-roughness on large components, principally long cylindrical mirrors for use synchrotron radiation beam lines. The non-contact measurement technique based upon a pencil-beam interferometer system. head mounted linear air bearing slide has free travel range of nearly one meter. We are able to sample spatial periods between 1 mm (the laser diameter) m. input...
In concentrated salt or ethanolic solutions, the self-complementary copolymer poly(dG-dC).poly(dG-dC) forms a left-handed double-helical structure that has been termed "Z-DNA." The first evidence for this came from changes observed in circular dichroism (CD) spectrum between 230 and 300 nm low- high-salt solutions (Pohl, F. M. & Jovin, T. (1972) J. Mol. Biol. 67, 675-696). 3 M NaCl, CD is approximately inverted compared to B-form low-salt solution. We measured vacuum ultraviolet of down...
This paper discusses basic issues involved in the estimation of surface spectra from laboratory measurements, development physically-based spectral models, and finish parameters their associated errors.
This paper discusses methods of predicting the BRDF smooth surfaces from profile measurements their surface finish. The conversion optical data to at same wavelength is essentially independent scattering models, while mechanical measurements, and scaling in general, are model dependent. Procedures illustrated for several surfaces, including two recent HeNe round robin, results compared with measured data. Reasonable agreement found except which involve significant isolated defects poorly sampled
Modifications of the long trace profiler at Advanced Photon Source Argonne National Laboratory have significantly improved its accuracy and repeatability for measuring figure large flat long-radius mirrors. Use a Dove prism in reference beam path corrects phasing problems between mechanical errors thermally induced system errors. A single correction now completely removes both these error signals from measured surface profile. The addition precision air conditioner keeps temperature...
The long trace profiler (Takacs et al.) has found significant applications in measuring the surfaces of synchrotron optics. However, requirements small slope errors at all spatial wavelengths optics mandate more accurate measurements. A straightness reference for greatly increases accuracy instrument. Methods using by interpreting sequential interference patterns are discussed and results measurements presented.
An open-source database containing metrology data for X-ray mirrors is presented. It makes available (mirror heights and slopes profiles) that can be used with simulation tools calculating the effects of optical surface errors in performances an instrument, such as a synchrotron beamline. A typical case degradation intensity profile at focal position beamline due to mirror errors. This (DABAM) aims provide users real mirrors. The included are described this paper, details how parameters...
LSST parameters are discussed and requirements on the camera presented. Characterization methods results a number of new devices produced specifically to address LSST's performance goals, including flatness, QE, full well capacity, linearity, dark current, read noise, CTE, image persistence The indicate that commercially produced, thick n-channel over-depleted CCDs can achieve excellent red response, high low current satisfy with no evidence persistent artifacts. We will also report ongoing...
The Large Synoptic Survey Telescope (LSST) camera will be made as a mosaic assembled of 189 large format Charge Coupled Devices (CCD). They are n-channel, 100 micron thick devices operated in the over depleted regime. There 16 segments, 1 million pixels each, that read out through separate amplifiers. image quality and readout speed expected from LSST translates into strict acceptance requirements for individual sensors. Prototype sensors preproduction CCDs were delivered by vendors they...
The derivation of surface-finish statistics from profile measurements are reviewed with emphasis on the corrections and limitations imposed by measurement process itself. These issues important for comparison results different types measurements, connecting functional surface properties, evaluating finishing techniques.
The task of designing high performance X-ray optical systems requires the development sophisticated scattering calculations based on rigorous information about optics. One most insightful approaches to these is power spectral density (PSD) distribution surface height. major problem measurement a PSD with an interferometric and/or atomic force microscope arises due unknown Modulation Transfer Function (MTF) instruments. MTF characterizes perturbation at higher spatial frequencies. Here, we...
The LSST Camera science sensor array will incorporate 189 large format Charge Coupled Device (CCD) image sensors. Each CCD include over 16 million pixels and be divided into equally sized segments each segment read through a separate output amplifier. goals of the project require sensors with state art performance in many aspects. broad survey wavelength coverage requires fully depleted, 100 micrometer thick, high resistivity, bulk silicon as imager substrate. Image quality requirements...
The high-spatial--fregiency behavior of rrethanical-profiling instrunents is determin principal ly by the non-linear geaitrica1 interaction beten styl us tip and surface irreularities. 'there cons iderable interest in nature this its effects practical applications. This paper explores these issues analytically pesents a riety results with enphasis on freuency-danain description. Smooth surfaces are treat1 perturbation theory found to be rot4iened tip-s ize , tiile rough snoothed. In lieu...
Future wide field astronomical surveys, like Large Synoptic Survey Telescope (LSST), require photometric precision on the percent level. The accuracy of sensor calibration procedures should match these requirements. Pixel size variations found in CCDs from different manufacturers are source systematic errors flat procedure. To achieve required to meet most demanding science goals this effect be taken into account. study pixel area was performed for fully depleted, thick produced a technology...