A5062309716- Advanced X-ray Imaging Techniques
- Advanced Surface Polishing Techniques
- X-ray Spectroscopy and Fluorescence Analysis
- Advanced Measurement and Metrology Techniques
- Particle Accelerators and Free-Electron Lasers
- Advanced Electron Microscopy Techniques and Applications
- Advancements in Photolithography Techniques
- Optical measurement and interference techniques
- Electron and X-Ray Spectroscopy Techniques
- Surface Roughness and Optical Measurements
- Advanced X-ray and CT Imaging
- Laser-Plasma Interactions and Diagnostics
- Optical Coatings and Gratings
- Crystallography and Radiation Phenomena
- Scientific Measurement and Uncertainty Evaluation
- Diamond and Carbon-based Materials Research
- Laser Material Processing Techniques
- Adaptive optics and wavefront sensing
- Nuclear Physics and Applications
- Particle accelerators and beam dynamics
- Medical Imaging Techniques and Applications
- Integrated Circuits and Semiconductor Failure Analysis
- Laser-Matter Interactions and Applications
- Semiconductor materials and devices
- Photocathodes and Microchannel Plates
Helmholtz-Zentrum Berlin für Materialien und Energie
2015-2024
European X-Ray Free-Electron Laser
2010-2020
Center for Free-Electron Laser Science
2020
Universität Hamburg
2020
Institute of Materials Research of the Slovak Academy of Sciences
2019
Czech Academy of Sciences, Institute of Physics
2019
AXO Dresden (Germany)
2010-2011
Karlsruhe Institute of Technology
2011
European Synchrotron Radiation Facility
2010-2011
Masaryk University
2011
We present recent results on the inspection of a first diffraction-limited hard X-ray Kirkpatrick-Baez (KB) mirror pair for Coherent Imaging (CXI) instrument at Linac Light Source (LCLS). The full KB system - mirrors and holders was under by use high resolution slope measuring deflectometry. tests confirmed that 350mm aperture length characterized an outstanding residual figure error <1 nm rms has been realized. This corresponds to about 0.05µrad rms, unprecedented such long elliptical...
BioMAX is the first macromolecular crystallography beamline at MAX IV Laboratory 3 GeV storage ring, which operational multi-bend achromat ring. Due to low-emittance has a parallel, high-intensity X-ray beam, even when focused down 20 µm × 5 using bendable focusing mirrors. The beam tunable in energy range 5-25 keV in-vacuum undulator and horizontally deflecting double-crystal monochromator. equipped with an MD3 diffractometer, ISARA high-capacity sample changer EIGER 16M hybrid pixel...
The Nanometer Optical Component measuring Machine (NOM) has been developed at BESSY for the purpose of surface figure optical components up to 1.2 m in length used grazing incidence Synchrotron Radiation beamlines. It is possible acquire information about slope and height deviations radius curvature a sample form line‐scans three dimensional display format. With NOM surfaces 600 cm2 have measured with an estimated uncertainty range 0.01 arcsec rms correspondingly high reproducibility. This...
The temporal coherence properties of soft x-ray free electron laser pulses at FLASH are measured 23.9 nm by interfering two timedelayed partial beams directly on a CCD camera.The obtained wave front beam splitting in an autocorrelator operating photon energies from hν = 30 to 200 eV.At zero delay visibility (0.63 ± 0.04) is measured.The one reveals time 6 fs nm.The further displays non-monotonic decay, which can be rationalized the presence multiple pulse structure.
The pulse duration of soft x-ray free-electron laser (FEL) radiation is directly measured by time-resolved observation doubly charged helium ions at 51.8 eV. A wave front splitting autocorrelator produces two correlated FEL pulses with a resolution better than femtosecond. In the interesting intensity range from ${10}^{13}$ to ${10}^{16}\text{ }\text{W}/{\text{cm}}^{2}$ direct and sequential double ionization contribute ion yield which has significant influence on correlation width, being...
FinEstBeAMS (Finnish–Estonian Beamline for Atmospheric and Materials Sciences) is a multidisciplinary beamline constructed at the 1.5 GeV storage ring of MAX IV synchrotron facility in Lund, Sweden. The covers an extremely wide photon energy range, 4.5–1300 eV, by utilizing single elliptically polarizing undulator as radiation source grazing-incidence plane grating monochromator to disperse radiation. At energies below 70 eV operation relies on use optical thin-film filters remove...
A systematic study is presented in which multilayers of different composition (W/Si, Mo/Si, Pd/B(4)C), periodicity (from 2.5 to 5.5 nm) and number layers have been characterized. In particular, the intrinsic quality (roughness reflectivity) as well performance (homogeneity coherence outgoing beam) a monochromator for synchrotron radiation hard X-ray micro-imaging are investigated. The results indicate that material dominating factor performance. By helping scientists engineers specify design...
To fully exploit the ultimate source properties of next-generation light sources, such as free-electron lasers (FELs) and diffraction-limited storage rings (DLSRs), quality requirements for gratings reflective synchrotron optics, especially mirrors, have significantly increased. These coherence-preserving optical components high-brightness sources will feature nanoscopic shape accuracies over macroscopic length scales up to 1000 mm. enable high efficiency in terms photon flux, optics be...
For time-resolved extreme ultraviolet (XUV) pump–XUV probe experiments at the Free electron LASer in Hamburg (FLASH), a split-and-delay unit (SDU) has been built. It is implemented beamline BL2 which provides focal spot size of about 20 μm diameter experiment. The beam divided geometrically into two paths can be delayed from −3 to +15 ps with respect each other. transmission up 200 eV photon energy above 35% one path and 74% latter transmits XUV again 305 570 (>1% transmission). Thus almost...
A technology center for the production of high-precision reflection gratings has been established. Within this project a new optics beamline and versatile reflectometer at-wavelength characterization UV- XUV-reflection other (nano-) optical elements set up at BESSY-II. The Plane Grating Monochromator operated in collimated light (c-PGM) is equipped with an SX700 monochromator, which blazed (600 1200 lines mm(-1)) have recently exchanged ones improved performance produced in-house. Over...
The non-monochromatic beamline BL1 at the FLASH free-electron laser facility DESY was upgraded with new transport and focusing optics, a permanent end-station, CAMP, installed. This multi-purpose instrument is optimized for electron- ion-spectroscopy, imaging pump–probe experiments lasers. It can be equipped various ion-spectrometers, along large-area single-photon-counting pnCCD X-ray detectors, thus enabling wide range of from atomic, molecular, cluster physics to material energy science,...
A new Optics Beamline coupled to a versatile UHV reflectometer is successfully operating at BESSY-II. It used carry out at-wavelength characterization and calibration of in-house produced gratings novel nano-optical devices as well mirrors multilayer systems in the UV XUV spectral region. This paper presents most recent commissioning data beamline shows their correlation with initial design calculations. Special attention paid key parameters which determine quality measurements such...
For photon energies of 1 -5 keV, blazed gratings with multilayer coating are ideally suited for the suppression stray and higher orders light in grating monochromators.We developed characterized a 2000 lines/mm coated 20 period Cr/C-multilayer.The d-spacing 7.3 nm has been adapted to line distance 500 blaze angle 0.84° order provide highest efficiency energy range between 1.5 keV 3 keV.Efficiency as well reflectance witness which were simultaneously have measured.An 35% was measured at 2...
Analytical and numerical simulations were carried out for both, surface profiles measured on a real ultra precise mirror by use of the BESSY-NOM slope measuring profiler as well model local distortions. The effect imperfections could be properly handled in frame wave optics approach. In spite large distances, hard X-rays one still needs to carry full-scale calculations surpassing far field approximation. It is shown that errors corresponding medium spatial frequency components are special...
GISAXS measurements with scattering contrast matching at the silicon K-edge were performed to obtain depth-resolved information on structural changes in as-spun and annealed PS-b-P2VP thin films substrate. Depth-sensitive of film revealed a vertically oriented fingerprint-like lamellar structure microphase separation distance 59 nm throughout entire film. The showed significantly reduced ordering surface depth about 30 nm, while order is preserved toward substrate interface. At same time, no...
The optimized design of multilayer-coated blazed gratings (MLBG) for high-flux tender X-ray monochromators was systematically studied by numerical simulations. resulting correlation between the multilayer d-spacing and grating blaze angle significantly deviated from one predicted conventional equations. Three high line density with different angles were fabricated coated same Cr/C multilayer. MLBG an optimal 1.0° showed a record efficiency reaching 60% at 3.1 keV 4.1 keV. measured...